| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A silicon microstrip tracker in space: Experience with the AMS silicon tracker on STS-91
|
Alcaraz, J.
|
|
1999
|
112 |
11 |
p. 1325-1343
|
artikel
|
| 2 |
A silicon microstrip tracker in space: Experience with the AMS silicon tracker on STS-91
|
Alcaraz, J.
|
|
1999
|
112 |
11 |
p. 1325-1343
|
artikel
|
| 3 |
Characterization ofp-in-n ATLAS silicon microstrip detectors fabricated by Hamamatsu Photonics and irradiated with 24 GeV/c protons to 3 × 1014 pcm-2
|
Morgan, D.
|
|
1999
|
112 |
11 |
p. 1245-1251
|
artikel
|
| 4 |
Characterization ofp-in-n ATLAS silicon microstrip detectors fabricated by Hamamatsu Photonics and irradiated with 24 GeV/c protons to 3 × 1014 pcm-2
|
Morgan, D.
|
|
1999
|
112 |
11 |
p. 1245-1251
|
artikel
|
| 5 |
Comparative study of (111) and (100) crystals and capacitance measurements on Si strip detectors in CMS
|
Albergo, S.
|
|
1999
|
112 |
11 |
p. 1261-1269
|
artikel
|
| 6 |
Comparative study of (111) and (100) crystals and capacitance measurements on Si strip detectors in CMS
|
Albergo, S.
|
|
1999
|
112 |
11 |
p. 1261-1269
|
artikel
|
| 7 |
Comparison between ATLAS forward microstrip detectors made on 6″ (100) and 4″ (111) crystal oriented silicon wafers
|
Casse, G.
|
|
1999
|
112 |
11 |
p. 1253-1259
|
artikel
|
| 8 |
Comparison between ATLAS forward microstrip detectors made on 6″ (100) and 4″ (111) crystal oriented silicon wafers
|
Casse, G.
|
|
1999
|
112 |
11 |
p. 1253-1259
|
artikel
|
| 9 |
Early stage of reverse annealing and projections for LHC experiments
|
Mikuz, M.
|
|
1999
|
112 |
11 |
p. 1391-1399
|
artikel
|
| 10 |
Early stage of reverse annealing and projections for LHC experiments
|
Mikuz, M.
|
|
1999
|
112 |
11 |
p. 1391-1399
|
artikel
|
| 11 |
High-voltage breakdown studies on Si microstrip detectors
|
Albergo, S.
|
|
1999
|
112 |
11 |
p. 1271-1283
|
artikel
|
| 12 |
High-voltage breakdown studies on Si microstrip detectors
|
Albergo, S.
|
|
1999
|
112 |
11 |
p. 1271-1283
|
artikel
|
| 13 |
Influence of surface damage on highly segmented silicon detectors
|
Gössling, C.
|
|
1999
|
112 |
11 |
p. 1369-1376
|
artikel
|
| 14 |
Influence of surface damage on highly segmented silicon detectors
|
Gössling, C.
|
|
1999
|
112 |
11 |
p. 1369-1376
|
artikel
|
| 15 |
MOS transient: A powerful analysis technique for in-process monitoring of nuclear detectors
|
Evrard, O.
|
|
1999
|
112 |
11 |
p. 1293-1306
|
artikel
|
| 16 |
MOS transient: A powerful analysis technique for in-process monitoring of nuclear detectors
|
Evrard, O.
|
|
1999
|
112 |
11 |
p. 1293-1306
|
artikel
|
| 17 |
Radiation damage of oxygenated silicon diodes by 27 MeV protons
|
Bisello, D.
|
|
1999
|
112 |
11 |
p. 1377-1382
|
artikel
|
| 18 |
Radiation damage of oxygenated silicon diodes by 27 MeV protons
|
Bisello, D.
|
|
1999
|
112 |
11 |
p. 1377-1382
|
artikel
|
| 19 |
Radiation hardness of the HERA-B silicon microstrip detectors
|
Pugatch, V.
|
|
1999
|
112 |
11 |
p. 1383-1389
|
artikel
|
| 20 |
Radiation hardness of the HERA-B silicon microstrip detectors
|
Pugatch, V.
|
|
1999
|
112 |
11 |
p. 1383-1389
|
artikel
|
| 21 |
Shallow- and deep-levels analysis in irradiated medium-resistivity silicon detectors
|
Borchi, E.
|
|
1999
|
112 |
11 |
p. 1359-1367
|
artikel
|
| 22 |
Shallow- and deep-levels analysis in irradiated medium-resistivity silicon detectors
|
Borchi, E.
|
|
1999
|
112 |
11 |
p. 1359-1367
|
artikel
|
| 23 |
Test results on heavily irradiated silicon detectors
|
Borrello, L.
|
|
1999
|
112 |
11 |
p. 1285-1291
|
artikel
|
| 24 |
Test results on heavily irradiated silicon detectors
|
Borrello, L.
|
|
1999
|
112 |
11 |
p. 1285-1291
|
artikel
|
| 25 |
The CDF intermediate silicon layers detector
|
Affolder, A.
|
|
1999
|
112 |
11 |
p. 1351-1357
|
artikel
|
| 26 |
The CDF intermediate silicon layers detector
|
Affolder, A.
|
|
1999
|
112 |
11 |
p. 1351-1357
|
artikel
|
| 27 |
The CDF Silicon Vertex Tracker: Online precision tracking of the CDF Silicon Vertex Detector
|
Ashmanskas, W.
|
|
1999
|
112 |
11 |
p. 1239-1243
|
artikel
|
| 28 |
The CDF Silicon Vertex Tracker: Online precision tracking of the CDF Silicon Vertex Detector
|
Ashmanskas, W.
|
|
1999
|
112 |
11 |
p. 1239-1243
|
artikel
|
| 29 |
The intermediate silicon layers space frame
|
Basti, A.
|
|
1999
|
112 |
11 |
p. 1345-1350
|
artikel
|
| 30 |
The intermediate silicon layers space frame
|
Basti, A.
|
|
1999
|
112 |
11 |
p. 1345-1350
|
artikel
|
| 31 |
The microstrip silicon tracker of the PAMELA experiment
|
Adriani, O.
|
|
1999
|
112 |
11 |
p. 1317-1323
|
artikel
|
| 32 |
The microstrip silicon tracker of the PAMELA experiment
|
Adriani, O.
|
|
1999
|
112 |
11 |
p. 1317-1323
|
artikel
|
| 33 |
The silicon microstrip tracker for CMS
|
Albergo, S.
|
|
1999
|
112 |
11 |
p. 1307-1316
|
artikel
|
| 34 |
The silicon microstrip tracker for CMS
|
Albergo, S.
|
|
1999
|
112 |
11 |
p. 1307-1316
|
artikel
|
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