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                             50 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Adsorption of self-assembled monolayers of mercaptan on gold de Weldige, K.
 1995
 353 3-4 p. 329-332
 artikel
2 A fast and simple method for background removal in Auger electron spectroscopy Bauer, H. E.
 1995
 353 3-4 p. 450-455
 artikel
3 AFM and XRD investigation of crystalline vapor-deposited C60 films Atamny, F.
 1995
 353 3-4 p. 433-438
 artikel
4 Analysis of solids with a secondary-neutral microprobe based on electron-gas post-ionization Bieck, W.
 1995
 353 3-4 p. 324-328
 artikel
5 Applications of SNMS in archaeometry Paulus, H.
 1995
 353 3-4 p. 369-371
 artikel
6 8. Arbeitstagung Oberflächenanalytik (AOFA 8) Oechsner, Hans
 1995
 353 3-4 p. 225-226
 artikel
7 Atomic force microscopy of coated glasses Rädlein, E.
 1995
 353 3-4 p. 413-418
 artikel
8 Characterization of Cu-Sn/Pb diffusion zones of microelectronic contacts by means of electron probe microanalysis and ion beam sputtering Däbritz, Siegfried
 1995
 353 3-4 p. 271-277
 artikel
9 Characterization of oxide coatings on glass Bange, Klaus
 1995
 353 3-4 p. 240-245
 artikel
10 Characterization of the chemical bonding in inner layers of composite materials Schneider, R.
 1995
 353 3-4 p. 263-266
 artikel
11 Characterization of ultra smooth interfaces in Mo/Si-multilayers Dietsch, R.
 1995
 353 3-4 p. 383-388
 artikel
12 Combined NRA, channeling-RBS and FTIR ellipsometry analyses for the determination of the interface and bonding state of thin SiOx and SiNxOy layers Michelmann, R. W.
 1995
 353 3-4 p. 403-407
 artikel
13 Comparative investigation on copper oxides by depth profiling using XPS, RBS and GDOES Bubert, H.
 1995
 353 3-4 p. 456-463
 artikel
14 Competitive segregation of Si and P on Fe96.5Si3.5 (100) and (110) Biedermann, A.
 1995
 353 3-4 p. 259-262
 artikel
15 Data management in multi-method surface analysis Brandl, K. W.
 1995
 353 3-4 p. 443-446
 artikel
16 Deconvolution of STM images using entropy as a regularization functional Böhmig, S. D.
 1995
 353 3-4 p. 439-442
 artikel
17 Depth profiling by ARXPS in surface analysis Fischer, H.
 1995
 353 3-4 p. 473-477
 artikel
18 Determination of lattice and grain boundary diffusion coefficients in protective alumina scales on high temperature alloys using SEM, TEM and SIMS Clemens, D.
 1995
 353 3-4 p. 267-270
 artikel
19 Development and characterization of a wettable surface modified aromatic polyethersulphone using glow discharge induced HEMA-graft polymerisation Thelen, H.
 1995
 353 3-4 p. 290-296
 artikel
20 Electroreduction of oxygen on octadecylmercaptan self-assembled monolayers Vago, E. R.
 1995
 353 3-4 p. 316-319
 artikel
21 EPMA of interfaces applied to the solid oxide fuel cell Grübmeier, H.
 1995
 353 3-4 p. 393-398
 artikel
22 Examples for the improvements in AES depth profiling of multilayer thin film systems by application of factor analysis data evaluation Scheithauer, U.
 1995
 353 3-4 p. 464-467
 artikel
23 External proton beam analysis of layered objects Wagner, W.
 1995
 353 3-4 p. 297-302
 artikel
24 High resolution depth profile analysis by elastic recoil detection with heavy ions Dollinger, G.
 1995
 353 3-4 p. 311-315
 artikel
25 High-resolution, low-voltage SEM for true surface imaging and analysis Jaksch, H.
 1995
 353 3-4 p. 378-382
 artikel
26 HREELS to identify electronic structures of organic thin films Oeter, D.
 1995
 353 3-4 p. 360-363
 artikel
27 In situ investigation of laser ablation Lenk, A.
 1995
 353 3-4 p. 333-336
 artikel
28 Interpretation of sputter depth profiles by mixing simulations Kupris, G.
 1995
 353 3-4 p. 307-310
 artikel
29 Investigation of the delamination of polymer films from galvanized steel with the Scanning Kelvinprobe Fürbeth, W.
 1995
 353 3-4 p. 337-341
 artikel
30 Investigation of the surface topography for the characterization of microstructures of amorphous SiNx-coatings Zahn, W.
 1995
 353 3-4 p. 364-368
 artikel
31 Investigation of the thermal stability of Ni/C multilayers by X-ray methods Krawietz, R.
 1995
 353 3-4 p. 246-250
 artikel
32 Low energy ion implantation in polybithiophene: microstructuring and microanalysis Jung, K. G.
 1995
 353 3-4 p. 282-289
 artikel
33 Performance and limitations of electron probe microanalysis applied to the characterization of coatings and layered structures Willich, P.
 1995
 353 3-4 p. 389-392
 artikel
34 Position sensitive atom probe study of segregation in molybdenum alloys Leisch, M.
 1995
 353 3-4 p. 251-253
 artikel
35 Prepolymer film growth by adsorption out of solution on silicon and aluminium Gesang, T.
 1995
 353 3-4 p. 419-426
 artikel
36 Quantitative aspects of the desorption of copper from the silicon (100) surface Göbel, U.
 1995
 353 3-4 p. 320-323
 artikel
37 Quantitative Auger electron spectrometric depth profile analysis of binary alloy reference materials Garten, R. P. H.
 1995
 353 3-4 p. 351-353
 artikel
38 Quantitative determination of element distributions in silicon based thin film solar cells using SNMS Gastel, M.
 1995
 353 3-4 p. 478-482
 artikel
39 Quantitative surface analysis by total electron yield Ebel, Horst
 1995
 353 3-4 p. 348-350
 artikel
40 Relative elemental sensitivity factors in non-resonant laser-SNMS Wahl, M.
 1995
 353 3-4 p. 354-359
 artikel
41 Scanning Kelvin Microscope: a new method for surface investigations Ren, J.
 1995
 353 3-4 p. 303-306
 artikel
42 Simulation of sputter-induced roughness for depth profiling of thin film structures Wöhner, T.
 1995
 353 3-4 p. 447-449
 artikel
43 Surface analysis in microelectronics Pignataro, S.
 1995
 353 3-4 p. 227-233
 artikel
44 Surface and in-depth characterization of TiC/C and Ti(C,N) layers by means of AES and Factor Analysis John, A.
 1995
 353 3-4 p. 468-472
 artikel
45 Surface cosegregation on Fe-3%V-C, Fe-3%V-C,N and Fe-15%Cr-N (110) single crystals Uebing, C.
 1995
 353 3-4 p. 254-258
 artikel
46 Surface structure and roughness of Nickel-Titanium wires Fries, Th.
 1995
 353 3-4 p. 427-432
 artikel
47 Temperature-induced changes in the composition of floatglass surfaces Laube, M.
 1995
 353 3-4 p. 408-412
 artikel
48 The kinetic of the oxidation of InSn48 Preuß, A.
 1995
 353 3-4 p. 399-402
 artikel
49 Titanium distributions in zone melted materials measured by SIMS Oswald, S.
 1995
 353 3-4 p. 342-347
 artikel
50 XPS studies of thin polycyanurate films on silicon wafers Dieckhoff, S.
 1995
 353 3-4 p. 278-281
 artikel
                             50 gevonden resultaten
 
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