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Journal description
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Details for article 44 of 50 found articles
| Title: |
Surface and in-depth characterization of TiC/C and Ti(C,N) layers by means of AES and Factor Analysis |
| Author: |
John, A. |
| Appeared in: |
Fresenius' journal of analytical chemistry |
| Paging: | Volume 353 (1995) nr. 3-4 pages 468-472 |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Springer-Verlag, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 44 of 50 found articles
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