| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Chaotic Negative-Resistance Oscillators with a Multibranch Piecewise-Linear CurrentVoltage Characteristic
|
V. G. Prokopenko
|
|
2004
|
33 |
6 |
p. 381-389
9 p.
|
artikel
|
| 2 |
Chaotic Negative-Resistance Oscillators with a Multibranch Piecewise-Linear Current—Voltage Characteristic
|
Prokopenko, V. G.
|
|
2004
|
33 |
6 |
p. 381-389
|
artikel
|
| 3 |
Delta-Doping of Monocrystalline Semiconductors by Al and Sb Implantation Using FIB Resistless Lithography
|
V. A. Zhukov
|
|
2004
|
33 |
6 |
p. 362-372
11 p.
|
artikel
|
| 4 |
Delta-Doping of Monocrystalline Semiconductors by Al and Sb Implantation Using FIB Resistless Lithography
|
Zhukov, V. A.
|
|
2004
|
33 |
6 |
p. 362-372
|
artikel
|
| 5 |
1D GaAs Detector Arrays for Digital X-ray Imaging
|
V. F. Dvoryankin
|
|
2004
|
33 |
6 |
p. 373-376
4 p.
|
artikel
|
| 6 |
1D GaAs Detector Arrays for Digital X-ray Imaging
|
Dvoryankin, V. F.
|
|
2004
|
33 |
6 |
p. 373-376
|
artikel
|
| 7 |
Methods of Multiplex Spectroscopy in the Characterization of Nanoscale Multilayers
|
V. A. Kotenev
|
|
2004
|
33 |
6 |
p. 353-361
9 p.
|
artikel
|
| 8 |
Methods of Multiplex Spectroscopy in the Characterization of Nanoscale Multilayers
|
Kotenev, V. A.
|
|
2004
|
33 |
6 |
p. 353-361
|
artikel
|
| 9 |
Noncontact Temperature Measurement on Dielectrics and Semiconductors, Part 1
|
V. K. Bitukov
|
|
2004
|
33 |
6 |
p. 329-341
13 p.
|
artikel
|
| 10 |
Noncontact Temperature Measurement on Dielectrics and Semiconductors, Part 1
|
Bitukov, V. K.
|
|
2004
|
33 |
6 |
p. 329-341
|
artikel
|
| 11 |
SEM Linear Measurement in a Wide Magnification Range
|
Ch. P. Volk
|
|
2004
|
33 |
6 |
p. 342-349
8 p.
|
artikel
|
| 12 |
SEM Linear Measurement in a Wide Magnification Range
|
Volk, Ch. P.
|
|
2004
|
33 |
6 |
p. 342-349
|
artikel
|
| 13 |
Silicon-Ingot Inspection by Active IR Imaging
|
V. A. Yuryev
|
|
2004
|
33 |
6 |
p. 350-352
3 p.
|
artikel
|
| 14 |
Silicon-Ingot Inspection by Active IR Imaging
|
Yuryev, V. A.
|
|
2004
|
33 |
6 |
p. 350-352
|
artikel
|
| 15 |
The Bulk-Recombination Mechanism of Negative Relative Sensitivity Observed in Bipolar Magnetotransistors
|
R. D. Tikhonov
|
|
2004
|
33 |
6 |
p. 377-380
4 p.
|
artikel
|
| 16 |
The Bulk-Recombination Mechanism of Negative Relative Sensitivity Observed in Bipolar Magnetotransistors
|
Tikhonov, R. D.
|
|
2004
|
33 |
6 |
p. 377-380
|
artikel
|
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