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                             20 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Carrier Trapping and Scattering in Ge-Doped SiO2 D. I. Brinkevich
2002
31 4 p. 254-256
3 p.
artikel
2 Carrier Trapping and Scattering in Ge-Doped SiO2 Brinkevich, D. I.
2002
31 4 p. 254-256
artikel
3 DeleCut: Producing High-Quality SOI Structures by Hydrogen Ion Implantation V. P. Popov
2002
31 4 p. 232-237
6 p.
artikel
4 DeleCut: Producing High-Quality SOI Structures by Hydrogen Ion Implantation Popov, V. P.
2002
31 4 p. 232-237
artikel
5 Effect of Gamma Irradiation on the Surface Morphology of SOS Films A. N. Kiselev
2002
31 4 p. 265-269
5 p.
artikel
6 Effect of Gamma Irradiation on the Surface Morphology of SOS Films Kiselev, A. N.
2002
31 4 p. 265-269
artikel
7 Lateral Injection Utilized for Improving the Performance of Microwave Bipolar Transistors Yu. P. Snitovskii
2002
31 4 p. 248-253
6 p.
artikel
8 Lateral Injection Utilized for Improving the Performance of Microwave Bipolar Transistors Snitovskii, Yu. P.
2002
31 4 p. 248-253
artikel
9 Linear Standard for SEMAFM Microelectronics Dimensional Metrology in the Range 0.01100 μm Ch. P. Volk
2002
31 4 p. 207-223
17 p.
artikel
10 Linear Standard for SEM–AFM Microelectronics Dimensional Metrology in the Range 0.01–100 μm Volk, Ch. P.
2002
31 4 p. 207-223
artikel
11 Open Microwave Resonator Used for the Characterization of a Helicon-Source Plasma Yu. P. Baryshev
2002
31 4 p. 243-247
5 p.
artikel
12 Open Microwave Resonator Used for the Characterization of a Helicon-Source Plasma Baryshev, Yu. P.
2002
31 4 p. 243-247
artikel
13 Photoresists Used as Mask Materials in Ion Implantation for the CMOS Technology: Optimizing Mask Thickness S. V. Gran'ko
2002
31 4 p. 238-242
5 p.
artikel
14 Photoresists Used as Mask Materials in Ion Implantation for the CMOS Technology: Optimizing Mask Thickness Gran'ko, S. V.
2002
31 4 p. 238-242
artikel
15 Polarity-Dependent Electrical Mass Transfer in Silicon: The Location and Shape of the Metal-like Bridge B. A. Panfilov
2002
31 4 p. 257-259
3 p.
artikel
16 Polarity-Dependent Electrical Mass Transfer in Silicon: The Location and Shape of the Metal-like Bridge Panfilov, B. A.
2002
31 4 p. 257-259
artikel
17 Structural and Behavioral Irreproducibility of Solid Materials: A New Insight into the Problem N. V. Bodyagin
2002
31 4 p. 260-264
5 p.
artikel
18 Structural and Behavioral Irreproducibility of Solid Materials: A New Insight into the Problem Bodyagin, N. V.
2002
31 4 p. 260-264
artikel
19 ULSI Gap Filling with a Thin CVD SiO2-Based Insulator: A Review V. Y. Vassiliev
2002
31 4 p. 224-231
8 p.
artikel
20 ULSI Gap Filling with a Thin CVD SiO2-Based Insulator: A Review Vassiliev, V. Y.
2002
31 4 p. 224-231
artikel
                             20 gevonden resultaten
 
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