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20 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	Carrier Trapping and Scattering in Ge-Doped SiO2	D. I. Brinkevich		2002	31	4	p. 254-256 3 p.	article
2	Carrier Trapping and Scattering in Ge-Doped SiO2	Brinkevich, D. I.		2002	31	4	p. 254-256	article
3	DeleCut: Producing High-Quality SOI Structures by Hydrogen Ion Implantation	V. P. Popov		2002	31	4	p. 232-237 6 p.	article
4	DeleCut: Producing High-Quality SOI Structures by Hydrogen Ion Implantation	Popov, V. P.		2002	31	4	p. 232-237	article
5	Effect of Gamma Irradiation on the Surface Morphology of SOS Films	A. N. Kiselev		2002	31	4	p. 265-269 5 p.	article
6	Effect of Gamma Irradiation on the Surface Morphology of SOS Films	Kiselev, A. N.		2002	31	4	p. 265-269	article
7	Lateral Injection Utilized for Improving the Performance of Microwave Bipolar Transistors	Yu. P. Snitovskii		2002	31	4	p. 248-253 6 p.	article
8	Lateral Injection Utilized for Improving the Performance of Microwave Bipolar Transistors	Snitovskii, Yu. P.		2002	31	4	p. 248-253	article
9	Linear Standard for SEMAFM Microelectronics Dimensional Metrology in the Range 0.01100 μm	Ch. P. Volk		2002	31	4	p. 207-223 17 p.	article
10	Linear Standard for SEM–AFM Microelectronics Dimensional Metrology in the Range 0.01–100 μm	Volk, Ch. P.		2002	31	4	p. 207-223	article
11	Open Microwave Resonator Used for the Characterization of a Helicon-Source Plasma	Yu. P. Baryshev		2002	31	4	p. 243-247 5 p.	article
12	Open Microwave Resonator Used for the Characterization of a Helicon-Source Plasma	Baryshev, Yu. P.		2002	31	4	p. 243-247	article
13	Photoresists Used as Mask Materials in Ion Implantation for the CMOS Technology: Optimizing Mask Thickness	S. V. Gran'ko		2002	31	4	p. 238-242 5 p.	article
14	Photoresists Used as Mask Materials in Ion Implantation for the CMOS Technology: Optimizing Mask Thickness	Gran'ko, S. V.		2002	31	4	p. 238-242	article
15	Polarity-Dependent Electrical Mass Transfer in Silicon: The Location and Shape of the Metal-like Bridge	B. A. Panfilov		2002	31	4	p. 257-259 3 p.	article
16	Polarity-Dependent Electrical Mass Transfer in Silicon: The Location and Shape of the Metal-like Bridge	Panfilov, B. A.		2002	31	4	p. 257-259	article
17	Structural and Behavioral Irreproducibility of Solid Materials: A New Insight into the Problem	N. V. Bodyagin		2002	31	4	p. 260-264 5 p.	article
18	Structural and Behavioral Irreproducibility of Solid Materials: A New Insight into the Problem	Bodyagin, N. V.		2002	31	4	p. 260-264	article
19	ULSI Gap Filling with a Thin CVD SiO2-Based Insulator: A Review	V. Y. Vassiliev		2002	31	4	p. 224-231 8 p.	article
20	ULSI Gap Filling with a Thin CVD SiO2-Based Insulator: A Review	Vassiliev, V. Y.		2002	31	4	p. 224-231	article

20 results found

Koninklijke Bibliotheek - National Library of the Netherlands