nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Assessment of Factors Influencing Thermomechanical Fatigue Behavior of Sn-Based Solder Joints under Severe Service Environments
|
Subramanian, K. N. |
|
2006 |
18 |
1-3 |
p. 237-246 |
artikel |
2 |
Composite lead-free electronic solders
|
Guo, Fu |
|
2006 |
18 |
1-3 |
p. 129-145 |
artikel |
3 |
Compression stress–strain and creep properties of the 52In–48Sn and 97In–3Ag low-temperature Pb-free solders
|
Vianco, Paul T. |
|
2006 |
18 |
1-3 |
p. 93-119 |
artikel |
4 |
Deformation behavior of tin and some tin alloys
|
Yang, Fuqian |
|
2006 |
18 |
1-3 |
p. 191-210 |
artikel |
5 |
Development of Sn–Ag–Cu and Sn–Ag–Cu–X alloys for Pb-free electronic solder applications
|
Anderson, Iver E. |
|
2006 |
18 |
1-3 |
p. 55-76 |
artikel |
6 |
Electromigration issues in lead-free solder joints
|
Chen, Chih |
|
2006 |
18 |
1-3 |
p. 259-268 |
artikel |
7 |
Electromigration statistics and damage evolution for Pb-free solder joints with Cu and Ni UBM in plastic flip-chip packages
|
Chae, Seung-Hyun |
|
2006 |
18 |
1-3 |
p. 247-258 |
artikel |
8 |
Impact of the ROHS Directive on high-performance electronic systems
|
Puttlitz, Karl J. |
|
2006 |
18 |
1-3 |
p. 347-365 |
artikel |
9 |
Impact of the ROHS directive on high-performance electronic systems
|
Puttlitz, Karl J. |
|
2006 |
18 |
1-3 |
p. 331-346 |
artikel |
10 |
Interfacial reaction issues for lead-free electronic solders
|
Ho, C. E. |
|
2006 |
18 |
1-3 |
p. 155-174 |
artikel |
11 |
Issues related to the implementation of Pb-free electronic solders in consumer electronics
|
Frear, D. R. |
|
2006 |
18 |
1-3 |
p. 319-330 |
artikel |
12 |
Life expectancies of Pb-free SAC solder interconnects in electronic hardware
|
Osterman, Michael |
|
2006 |
18 |
1-3 |
p. 229-236 |
artikel |
13 |
Mechanical fatigue of Sn-rich Pb-free solder alloys
|
Shang, J. K. |
|
2006 |
18 |
1-3 |
p. 211-227 |
artikel |
14 |
Microstructure-based modeling of deformation in Sn-rich (Pb-free) solder alloys
|
Chawla, N. |
|
2006 |
18 |
1-3 |
p. 175-189 |
artikel |
15 |
Phase Diagrams of Pb-Free Solders and their Related Materials Systems
|
Chen, Sinn-Wen |
|
2006 |
18 |
1-3 |
p. 19-37 |
artikel |
16 |
Preface
|
Subramanian, K. N. |
|
2006 |
18 |
1-3 |
p. 1-2 |
artikel |
17 |
Processing and material issues related to lead-free soldering
|
Turbini, Laura J. |
|
2006 |
18 |
1-3 |
p. 147-154 |
artikel |
18 |
Rare-earth additions to lead-free electronic solders
|
Wu, C. M. L. |
|
2006 |
18 |
1-3 |
p. 77-91 |
artikel |
19 |
Sn-whiskers: truths and myths
|
Osenbach, J. W. |
|
2006 |
18 |
1-3 |
p. 283-305 |
artikel |
20 |
Sn–Zn low temperature solder
|
Suganuma, Katsuaki |
|
2006 |
18 |
1-3 |
p. 121-127 |
artikel |
21 |
Stress analysis of spontaneous Sn whisker growth
|
Tu, K. N. |
|
2006 |
18 |
1-3 |
p. 269-281 |
artikel |
22 |
The effects of suppressed beta tin nucleation on the microstructural evolution of lead-free solder joints
|
Swenson, D. |
|
2006 |
18 |
1-3 |
p. 39-54 |
artikel |
23 |
Thermodynamics and phase diagrams of lead-free solder materials
|
Ipser, H. |
|
2006 |
18 |
1-3 |
p. 3-17 |
artikel |
24 |
Tin pest issues in lead-free electronic solders
|
Plumbridge, W. J. |
|
2006 |
18 |
1-3 |
p. 307-318 |
artikel |