| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Novel Approach for Analog Circuit Fault Prognostics Based on Improved RVM
|
Zhang, Chaolong
|
|
2014
|
30 |
3 |
p. 343-356
|
artikel
|
| 2 |
Benefits of Partitioning in a Projection-based and Realizable Model-order Reduction Flow
|
Miettinen, Pekka
|
|
2014
|
30 |
3 |
p. 271-285
|
artikel
|
| 3 |
Editorial
|
Agrawal, Vishwani D.
|
|
2014
|
30 |
3 |
p. 251-252
|
artikel
|
| 4 |
GPUs Neutron Sensitivity Dependence on Data Type
|
Rech, P.
|
|
2014
|
30 |
3 |
p. 307-316
|
artikel
|
| 5 |
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test
|
Carvalho, M. de
|
|
2014
|
30 |
3 |
p. 317-328
|
artikel
|
| 6 |
Learning-oriented Property Decomposition for Automated Generation of Directed Tests
|
Chen, Mingsong
|
|
2014
|
30 |
3 |
p. 287-306
|
artikel
|
| 7 |
Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique
|
Arvaniti, Efi
|
|
2014
|
30 |
3 |
p. 329-341
|
artikel
|
| 8 |
Modeling of Physical Defects in PN Junction Based Graphene Devices
|
Miryala, Sandeep
|
|
2014
|
30 |
3 |
p. 357-370
|
artikel
|
| 9 |
Research on the Efficiency Improvement of Design for Testability Using Test Point Allocation
|
Wang, Guohua
|
|
2014
|
30 |
3 |
p. 371-376
|
artikel
|
| 10 |
Test Technology Newsletter
|
|
|
2014
|
30 |
3 |
p. 253-254
|
artikel
|
| 11 |
The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits
|
Ren, Yi
|
|
2014
|
30 |
3 |
p. 377-382
|
artikel
|
| 12 |
Verilog HDL Simulator Technology: A Survey
|
Tan, Tze Sin
|
|
2014
|
30 |
3 |
p. 255-269
|
artikel
|
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