Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 7 of 12 found articles
 
 
  Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique
 
 
Title: Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique
Author: Arvaniti, Efi
Tsiatouhas, Yiorgos
Appeared in: Journal of electronic testing
Paging: Volume 30 (2014) nr. 3 pages 329-341
Year: 2014
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 12 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands