nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Comparative Study of Reactive Wetting of Lead and Lead-Free Solders on Cu and (Cu6Sn5/Cu3Sn)/Cu Substrates
|
Wang, Hongqin |
|
2008 |
37 |
10 |
p. 1640-1647 |
artikel |
2 |
Air-Gaps for High-Performance On-Chip Interconnect Part II: Modeling, Fabrication, and Characterization
|
Park, Seongho |
|
2008 |
37 |
10 |
p. 1534-1546 |
artikel |
3 |
Air-Gaps for High-Performance On-Chip Interconnect Part I: Improvement in Thermally Decomposable Template
|
Park, SeongHo |
|
2008 |
37 |
10 |
p. 1524-1533 |
artikel |
4 |
Analysis and Experimental Verification of the Volume Effect in the Reaction Between Zn-Doped Solders and Cu
|
Yang, S.C. |
|
2008 |
37 |
10 |
p. 1591-1597 |
artikel |
5 |
Comparison of Impact Toughness and Fracture Morphologies Between Pb-Containing and Pb-Free Solder Joints Subject to the Charpy Impact Test
|
Zhang, Ning |
|
2008 |
37 |
10 |
p. 1631-1639 |
artikel |
6 |
Compliant Substrates for Heteroepitaxial Semiconductor Devices: Theory, Experiment, and Current Directions
|
Ayers, J.E. |
|
2008 |
37 |
10 |
p. 1511-1523 |
artikel |
7 |
Effect of Ar+ Radiofrequency Plasma Treatment Conditions on the Interfacial Adhesion Energy Between Atomic-Layer-Deposited Al2O3 and Cu Thin Films in Embedded Capacitors
|
Park, Sung-Cheol |
|
2008 |
37 |
10 |
p. 1565-1573 |
artikel |
8 |
Electromigration-Induced Void Formation at the Cu5Zn8/Solder Interface in a Cu/Sn-9Zn/Cu Sandwich
|
Kuo, Shih-Ming |
|
2008 |
37 |
10 |
p. 1611-1617 |
artikel |
9 |
Electromigration Reliability and Morphologies of Cu Pillar Flip-Chip Solder Joints with Cu Substrate Pad Metallization
|
Lai, Yi-Shao |
|
2008 |
37 |
10 |
p. 1624-1630 |
artikel |
10 |
Fabrication of Nickel/Gold Multilayered Shells on Polystyrene Bead Cores by Sequential Electroless Deposition Processes
|
Lee, Jun-Ho |
|
2008 |
37 |
10 |
p. 1648-1652 |
artikel |
11 |
Growth and Characterizations of GaN-Based LEDs Grown on Wet-Etched Stripe-Patterned Sapphire Substrates
|
Ng, Kar Wei |
|
2008 |
37 |
10 |
p. 1560-1564 |
artikel |
12 |
Growth and Characterizations of GaN-Based LEDs Grown on Wet-Etched Stripe-Patterned Sapphire Substrates
|
Ng, Kar Wei |
|
|
37 |
10 |
p. 1560-1564 |
artikel |
13 |
Interface Engineering and Direct Bonding of Lithium Tantalate Crystals
|
Torchinsky, Ilya |
|
2008 |
37 |
10 |
p. 1547-1551 |
artikel |
14 |
Interfacial Intermetallic Growth and Strength of Composite Lead-Free Solder Alloy Through Isothermal Aging
|
Sivasubramaniam, V. |
|
2008 |
37 |
10 |
p. 1598-1604 |
artikel |
15 |
Large-Scale Correlations in the Orientation of Grains in Lead-Free Solder Joints
|
Sylvestre, Julien |
|
2008 |
37 |
10 |
p. 1618-1623 |
artikel |
16 |
Low-Temperature, Strong SiO2-SiO2 Covalent Wafer Bonding for III–V Compound Semiconductors-to-Silicon Photonic Integrated Circuits
|
Liang, Di |
|
2008 |
37 |
10 |
p. 1552-1559 |
artikel |
17 |
Morphological Evolution of the Reaction Product at the Sn-9wt.%Zn/Thin-Film Cu Interface
|
Chen, Chih-Ming |
|
2008 |
37 |
10 |
p. 1605-1610 |
artikel |
18 |
Tensile Behaviors and Ratcheting Effects of Partially Sintered Chip-Attachment Films of a Nanoscale Silver Paste
|
Chen, Xu |
|
2008 |
37 |
10 |
p. 1574-1579 |
artikel |
19 |
Theoretical Prediction and Experimental Measurement of the Degree of Cure of Anisotropic Conductive Films (ACFs) for Chip-On-Flex (COF) Applications
|
Chung, Chang-Kyu |
|
2008 |
37 |
10 |
p. 1580-1590 |
artikel |