| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A comparative study of EVA with and without thermal history for different lamination process parameters
|
Drabczyk, Kazimierz
|
|
2012
|
177 |
15 |
p. 1378-1383
6 p.
|
artikel
|
| 2 |
Analysis of polymer foil heaters as infrared radiation sources
|
Witek, Krzysztof
|
|
2012
|
177 |
15 |
p. 1373-1377
5 p.
|
artikel
|
| 3 |
Analysis of the thermal behavior of AlGaN/GaN HEMTs
|
Russo, Salvatore
|
|
2012
|
177 |
15 |
p. 1343-1351
9 p.
|
artikel
|
| 4 |
Application of lock-in thermography for failure analysis in integrated circuits using quantitative phase shift analysis
|
Schmidt, Ch.
|
|
2012
|
177 |
15 |
p. 1261-1267
7 p.
|
artikel
|
| 5 |
A promising solution using CVD diamond for efficient cooling of power devices
|
Zhang, Zhongda
|
|
2012
|
177 |
15 |
p. 1358-1361
4 p.
|
artikel
|
| 6 |
Author index
|
|
|
2012
|
177 |
15 |
p. 1385-1390
6 p.
|
artikel
|
| 7 |
Comparison of ZnO:Al, ITO and carbon nanotube transparent conductive layers in flexible solar cells applications
|
Sibiński, Maciej
|
|
2012
|
177 |
15 |
p. 1292-1298
7 p.
|
artikel
|
| 8 |
Cyclic voltammetry response of an undoped CVD diamond electrodes
|
Fabisiak, K.
|
|
2012
|
177 |
15 |
p. 1243-1247
5 p.
|
artikel
|
| 9 |
Defect detection in wire welded joints using thermography investigations
|
Świątczak, T.
|
|
2012
|
177 |
15 |
p. 1239-1242
4 p.
|
artikel
|
| 10 |
Editorial Board
|
|
|
2012
|
177 |
15 |
p. CO2-
1 p.
|
artikel
|
| 11 |
Effect of the post-deposition annealing on electrical characteristics of MIS structures with HfO2/SiO2 gate dielectric stacks
|
Taube, Andrzej
|
|
2012
|
177 |
15 |
p. 1281-1285
5 p.
|
artikel
|
| 12 |
Electrothermal model of choking-coils for the analysis of dc–dc converters
|
Górecki, Krzysztof
|
|
2012
|
177 |
15 |
p. 1248-1253
6 p.
|
artikel
|
| 13 |
Impact of scaling on the DC/RF thermal behavior of SiGe HBTs for high-frequency applications
|
Sasso, Grazia
|
|
2012
|
177 |
15 |
p. 1233-1238
6 p.
|
artikel
|
| 14 |
Influence of laminate type on tin whisker growth in tin-rich lead-free solder alloys
|
Skwarek, Agata
|
|
2012
|
177 |
15 |
p. 1286-1291
6 p.
|
artikel
|
| 15 |
Influence of series resistance and cooling conditions on I–V characteristics of SiC merged PiN Schottky diodes
|
Hapka, Aneta
|
|
2012
|
177 |
15 |
p. 1310-1313
4 p.
|
artikel
|
| 16 |
International Conference Microtechnology and Thermal Problems in Electronics June 25th - June 28th 2013, Lodz, Poland
|
|
|
2012
|
177 |
15 |
p. 1384-
1 p.
|
artikel
|
| 17 |
Investigation of gate edge effect on interface trap density in 3C–SiC MOS capacitors
|
Gutt, T.
|
|
2012
|
177 |
15 |
p. 1327-1330
4 p.
|
artikel
|
| 18 |
Investigation of microstructure and chemical composition of Ni contacts to n-type 4H–SiC
|
Rogowski, Jacek
|
|
2012
|
177 |
15 |
p. 1318-1322
5 p.
|
artikel
|
| 19 |
New packages for disc type power diodes
|
Raj, Ewa
|
|
2012
|
177 |
15 |
p. 1304-1309
6 p.
|
artikel
|
| 20 |
OM4 bend insensitive multi-mode fibers’ usefulness for MCM integration
|
Guzowski, Bartłomiej
|
|
2012
|
177 |
15 |
p. 1367-1372
6 p.
|
artikel
|
| 21 |
Power MOSFET quality and robustness enhancement with a new Q BD characterization performed at probe–die–wafer level
|
Pomès, Emilie
|
|
2012
|
177 |
15 |
p. 1362-1366
5 p.
|
artikel
|
| 22 |
Quartz crystal unit modeling at cryogenic temperatures
|
Balik, F.
|
|
2012
|
177 |
15 |
p. 1254-1260
7 p.
|
artikel
|
| 23 |
Relaxation of stresses in polystyrene–carbon microcomposite resistive layers
|
Łukasik, Andrzej
|
|
2012
|
177 |
15 |
p. 1331-1335
5 p.
|
artikel
|
| 24 |
Subject index
|
|
|
2012
|
177 |
15 |
p. 1391-1413
23 p.
|
artikel
|
| 25 |
Technology of ZnO nanofibers based devices
|
Stafiniak, A.
|
|
2012
|
177 |
15 |
p. 1299-1303
5 p.
|
artikel
|
| 26 |
The favorable and unfavorable effects of oxide and intermetallic phases in conductive materials using laser micro technologies
|
Pawlak, R.
|
|
2012
|
177 |
15 |
p. 1273-1280
8 p.
|
artikel
|
| 27 |
The influence of oxygen ambient annealing conditions on the quality of Al/SiO2/n-type 4H-SiC MOS structure
|
Król, Krystian
|
|
2012
|
177 |
15 |
p. 1314-1317
4 p.
|
artikel
|
| 28 |
The influence of working gas on CVD diamond quality
|
Fabisiak, K.
|
|
2012
|
177 |
15 |
p. 1352-1357
6 p.
|
artikel
|
| 29 |
Thermal characterization of screen printed conductive pastes for RFID antennas
|
Janeczek, Kamil
|
|
2012
|
177 |
15 |
p. 1336-1342
7 p.
|
artikel
|
| 30 |
Thermal properties of high-power diode lasers investigated by means of high resolution thermography
|
Kozłowska, Anna
|
|
2012
|
177 |
15 |
p. 1268-1272
5 p.
|
artikel
|
| 31 |
The role of deep level traps in barrier height of 4H–SiC Schottky diode
|
Zaremba, G.
|
|
2012
|
177 |
15 |
p. 1323-1326
4 p.
|
artikel
|
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