nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers
|
Streli, C. |
|
2003 |
58 |
12 |
p. 2105-2112 8 p. |
artikel |
2 |
Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II
|
Streli, C. |
|
2003 |
58 |
12 |
p. 2113-2121 9 p. |
artikel |
3 |
Analysis of mineral water from Brazil using total reflection X-ray fluorescence by synchrotron radiation
|
Costa, A.C.M |
|
2003 |
58 |
12 |
p. 2199-2204 6 p. |
artikel |
4 |
Analysis of organic contaminants on Si wafers with TXRF-NEXAFS
|
Pepponi, G. |
|
2003 |
58 |
12 |
p. 2245-2253 9 p. |
artikel |
5 |
Application of large-area avalanche photodiodes to X-ray spectrometry of muonic atoms
|
Fernandes, L.M.P. |
|
2003 |
58 |
12 |
p. 2255-2260 6 p. |
artikel |
6 |
AUTHOR INDEX, VOLUME 58B
|
|
|
2003 |
58 |
12 |
p. V-X nvt p. |
artikel |
7 |
A wavelength-dispersive arrangement for wafer analysis with total reflection X-ray fluorescence spectrometry using synchrotron radiation
|
Schwenke, Heinrich |
|
2003 |
58 |
12 |
p. 2039-2048 10 p. |
artikel |
8 |
Biomonitoring of trace elements in muscle and liver tissue of freshwater fish
|
Wagner, Annemarie |
|
2003 |
58 |
12 |
p. 2215-2226 12 p. |
artikel |
9 |
Cold plasma ashing improves the trace element detection of single Daphnia specimens by total reflection X-ray fluorescence spectrometry
|
Woelfl, Stefan |
|
2003 |
58 |
12 |
p. 2157-2168 12 p. |
artikel |
10 |
Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples
|
Falkenberg, G. |
|
2003 |
58 |
12 |
p. 2239-2244 6 p. |
artikel |
11 |
Comparison of synchrotron radiation total reflection X-ray fluorescence excitation–detection geometries for samples with differing matrices
|
Pepponi, G. |
|
2003 |
58 |
12 |
p. 2139-2144 6 p. |
artikel |
12 |
Construction of a windowless Si-anode X-ray tube for a more efficient excitation of low Z elements on Si-wafer surfaces in total reflection fluorescence analysis
|
Meinschad, Th |
|
2003 |
58 |
12 |
p. 2069-2077 9 p. |
artikel |
13 |
CONTENTS, VOLUME 58B
|
|
|
2003 |
58 |
12 |
p. XI-XXIX nvt p. |
artikel |
14 |
Depth profiles of shallow implanted layers by soft ion sputtering and total-reflection X-ray fluorescence
|
Krzyżanowska, H. |
|
2003 |
58 |
12 |
p. 2059-2067 9 p. |
artikel |
15 |
Determination of calcium, potassium, manganese, iron, copper and zinc levels in representative samples of two onion cultivars using total reflection X-ray fluorescence and ultrasound extraction procedure
|
Alvarez, J |
|
2003 |
58 |
12 |
p. 2183-2189 7 p. |
artikel |
16 |
Determination of metallic contaminants on Ge wafers using direct- and droplet sandwich etch-total reflection X-ray fluorescence spectrometry
|
Hellin, D |
|
2003 |
58 |
12 |
p. 2093-2104 12 p. |
artikel |
17 |
Development of vapor phase decomposition-total-reflection X-ray fluorescence spectrometer
|
Yamagami, Motoyuki |
|
2003 |
58 |
12 |
p. 2079-2084 6 p. |
artikel |
18 |
Direct analysis of blood serum by total reflection X-ray fluorescence spectrometry and application of an artificial neural network approach for cancer diagnosis
|
Hernández-Caraballo, Edwin A |
|
2003 |
58 |
12 |
p. 2205-2213 9 p. |
artikel |
19 |
Editorial Board
|
|
|
2003 |
58 |
12 |
p. IFC- 1 p. |
artikel |
20 |
Feasibility study of three-dimensional XRF spectrometry using μ-X-ray beams under grazing-exit conditions
|
Tsuji, Kouichi |
|
2003 |
58 |
12 |
p. 2233-2238 6 p. |
artikel |
21 |
Investigation of lead and nickel contaminated natural biofilms
|
Kröpfl, K. |
|
2003 |
58 |
12 |
p. 2177-2181 5 p. |
artikel |
22 |
Macromolecules by total reflection X-ray fluorescence: marking techniques
|
Boeykens, S |
|
2003 |
58 |
12 |
p. 2169-2175 7 p. |
artikel |
23 |
Preface
|
de Carvalho, Maria Luisa |
|
2003 |
58 |
12 |
p. 2023-2024 2 p. |
artikel |
24 |
Quo Vadis total reflection X-ray fluorescence?
|
Pahlke, Siegfried |
|
2003 |
58 |
12 |
p. 2025-2038 14 p. |
artikel |
25 |
Si drift detector in comparison to Si(Li) detector for total reflection X-ray fluorescence analysis applications
|
Osmic, F |
|
2003 |
58 |
12 |
p. 2123-2128 6 p. |
artikel |
26 |
Simultaneous acquisition of X-ray spectra using a multi-wire, position-sensitive gas flow detector
|
Beaven, Peter A. |
|
2003 |
58 |
12 |
p. 2049-2057 9 p. |
artikel |
27 |
The use of a portable total reflection X-ray fluorescence spectrometer for field investigation
|
Mages, Margarete |
|
2003 |
58 |
12 |
p. 2129-2138 10 p. |
artikel |
28 |
The use of Si carriers for aerosol particle collection and subsequent elemental analysis by total-reflection X-ray fluorescence spectrometry
|
Esaka, F |
|
2003 |
58 |
12 |
p. 2145-2155 11 p. |
artikel |
29 |
Total-reflection X-ray fluorescence analysis for semiconductor process characterization
|
Mori, Yoshihiro |
|
2003 |
58 |
12 |
p. 2085-2092 8 p. |
artikel |
30 |
Total reflection X-ray fluorescence and energy-dispersive X-ray fluorescence analysis of runoff water and vegetation from abandoned mining of Pb–Zn ores
|
Marques, A.F. |
|
2003 |
58 |
12 |
p. 2191-2198 8 p. |
artikel |
31 |
Trace elements determination in red and white wines using total-reflection X-ray fluorescence
|
Anjos, M.J |
|
2003 |
58 |
12 |
p. 2227-2232 6 p. |
artikel |