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                             31 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers Streli, C.
2003
58 12 p. 2105-2112
8 p.
artikel
2 Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II Streli, C.
2003
58 12 p. 2113-2121
9 p.
artikel
3 Analysis of mineral water from Brazil using total reflection X-ray fluorescence by synchrotron radiation Costa, A.C.M
2003
58 12 p. 2199-2204
6 p.
artikel
4 Analysis of organic contaminants on Si wafers with TXRF-NEXAFS Pepponi, G.
2003
58 12 p. 2245-2253
9 p.
artikel
5 Application of large-area avalanche photodiodes to X-ray spectrometry of muonic atoms Fernandes, L.M.P.
2003
58 12 p. 2255-2260
6 p.
artikel
6 AUTHOR INDEX, VOLUME 58B 2003
58 12 p. V-X
nvt p.
artikel
7 A wavelength-dispersive arrangement for wafer analysis with total reflection X-ray fluorescence spectrometry using synchrotron radiation Schwenke, Heinrich
2003
58 12 p. 2039-2048
10 p.
artikel
8 Biomonitoring of trace elements in muscle and liver tissue of freshwater fish Wagner, Annemarie
2003
58 12 p. 2215-2226
12 p.
artikel
9 Cold plasma ashing improves the trace element detection of single Daphnia specimens by total reflection X-ray fluorescence spectrometry Woelfl, Stefan
2003
58 12 p. 2157-2168
12 p.
artikel
10 Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples Falkenberg, G.
2003
58 12 p. 2239-2244
6 p.
artikel
11 Comparison of synchrotron radiation total reflection X-ray fluorescence excitation–detection geometries for samples with differing matrices Pepponi, G.
2003
58 12 p. 2139-2144
6 p.
artikel
12 Construction of a windowless Si-anode X-ray tube for a more efficient excitation of low Z elements on Si-wafer surfaces in total reflection fluorescence analysis Meinschad, Th
2003
58 12 p. 2069-2077
9 p.
artikel
13 CONTENTS, VOLUME 58B 2003
58 12 p. XI-XXIX
nvt p.
artikel
14 Depth profiles of shallow implanted layers by soft ion sputtering and total-reflection X-ray fluorescence Krzyżanowska, H.
2003
58 12 p. 2059-2067
9 p.
artikel
15 Determination of calcium, potassium, manganese, iron, copper and zinc levels in representative samples of two onion cultivars using total reflection X-ray fluorescence and ultrasound extraction procedure Alvarez, J
2003
58 12 p. 2183-2189
7 p.
artikel
16 Determination of metallic contaminants on Ge wafers using direct- and droplet sandwich etch-total reflection X-ray fluorescence spectrometry Hellin, D
2003
58 12 p. 2093-2104
12 p.
artikel
17 Development of vapor phase decomposition-total-reflection X-ray fluorescence spectrometer Yamagami, Motoyuki
2003
58 12 p. 2079-2084
6 p.
artikel
18 Direct analysis of blood serum by total reflection X-ray fluorescence spectrometry and application of an artificial neural network approach for cancer diagnosis Hernández-Caraballo, Edwin A
2003
58 12 p. 2205-2213
9 p.
artikel
19 Editorial Board 2003
58 12 p. IFC-
1 p.
artikel
20 Feasibility study of three-dimensional XRF spectrometry using μ-X-ray beams under grazing-exit conditions Tsuji, Kouichi
2003
58 12 p. 2233-2238
6 p.
artikel
21 Investigation of lead and nickel contaminated natural biofilms Kröpfl, K.
2003
58 12 p. 2177-2181
5 p.
artikel
22 Macromolecules by total reflection X-ray fluorescence: marking techniques Boeykens, S
2003
58 12 p. 2169-2175
7 p.
artikel
23 Preface de Carvalho, Maria Luisa
2003
58 12 p. 2023-2024
2 p.
artikel
24 Quo Vadis total reflection X-ray fluorescence? Pahlke, Siegfried
2003
58 12 p. 2025-2038
14 p.
artikel
25 Si drift detector in comparison to Si(Li) detector for total reflection X-ray fluorescence analysis applications Osmic, F
2003
58 12 p. 2123-2128
6 p.
artikel
26 Simultaneous acquisition of X-ray spectra using a multi-wire, position-sensitive gas flow detector Beaven, Peter A.
2003
58 12 p. 2049-2057
9 p.
artikel
27 The use of a portable total reflection X-ray fluorescence spectrometer for field investigation Mages, Margarete
2003
58 12 p. 2129-2138
10 p.
artikel
28 The use of Si carriers for aerosol particle collection and subsequent elemental analysis by total-reflection X-ray fluorescence spectrometry Esaka, F
2003
58 12 p. 2145-2155
11 p.
artikel
29 Total-reflection X-ray fluorescence analysis for semiconductor process characterization Mori, Yoshihiro
2003
58 12 p. 2085-2092
8 p.
artikel
30 Total reflection X-ray fluorescence and energy-dispersive X-ray fluorescence analysis of runoff water and vegetation from abandoned mining of Pb–Zn ores Marques, A.F.
2003
58 12 p. 2191-2198
8 p.
artikel
31 Trace elements determination in red and white wines using total-reflection X-ray fluorescence Anjos, M.J
2003
58 12 p. 2227-2232
6 p.
artikel
                             31 gevonden resultaten
 
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