| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Charge collection efficiency degradation induced by MeV ions in semiconductor devices: Model and experiment
|
Vittone, E.
|
|
2016
|
372 |
C |
p. 128-142
15 p.
|
article
|
| 2 |
Comparative study by IBIC of Si and SiC diodes irradiated with high energy protons
|
Garcia Lopez, J.
|
|
2016
|
372 |
C |
p. 143-150
8 p.
|
article
|
| 3 |
Editorial board
|
|
|
2016
|
372 |
C |
p. IFC-
1 p.
|
article
|
| 4 |
Effects of swift heavy ion irradiation on dielectric relaxation and conduction mechanism in Ba0.90Sr0.10TiO3
|
Mohan, C.R.K.
|
|
2016
|
372 |
C |
p. 50-57
8 p.
|
article
|
| 5 |
Effects of thermal annealing on photoluminescence of Si+/C+ implanted SiO2 films
|
Chen, Yin-Yu
|
|
2016
|
372 |
C |
p. 114-118
5 p.
|
article
|
| 6 |
Elastic photonuclear cross sections for bremsstrahlung from relativistic ions
|
Mikkelsen, Rune E.
|
|
2016
|
372 |
C |
p. 58-66
9 p.
|
article
|
| 7 |
Geant4.10 simulation of geometric model for metaphase chromosome
|
Rafat-Motavalli, L.
|
|
2016
|
372 |
C |
p. 7-13
7 p.
|
article
|
| 8 |
Inelastic cross-sections and energy loss properties by non-relativistic heavy ions in zirconium dioxide
|
Schofield, Jennifer
|
|
2016
|
372 |
C |
p. 119-126
8 p.
|
article
|
| 9 |
In situ X-ray diffraction study of irradiation-induced lattice expansion in Al foils by MeV-energy heavy ions
|
Minagawa, Hideaki
|
|
2016
|
372 |
C |
p. 38-43
6 p.
|
article
|
| 10 |
Investigation of electrically-active deep levels in single-crystalline diamond by particle-induced charge transient spectroscopy
|
Kada, W.
|
|
2016
|
372 |
C |
p. 151-155
5 p.
|
article
|
| 11 |
K-, L- and M-shell X-ray productions induced by argon ions in the 0.8–1.6MeV/amu range
|
Gluchshenko, N.
|
|
2016
|
372 |
C |
p. 1-6
6 p.
|
article
|
| 12 |
Lattice structure transformation and change in surface hardness of Ni3Nb and Ni3Ta intermetallic compounds induced by energetic ion beam irradiation
|
Kojima, H.
|
|
2016
|
372 |
C |
p. 72-77
6 p.
|
article
|
| 13 |
Measurements of proton induced γ-ray emission cross-sections on Mg from 1.0 to 3.0MeV
|
Sharifzadeh, N.
|
|
2016
|
372 |
C |
p. 109-113
5 p.
|
article
|
| 14 |
Multiple-electron losses in uranium ion beams in heavy ion synchrotrons
|
Bozyk, L.
|
|
2016
|
372 |
C |
p. 102-108
7 p.
|
article
|
| 15 |
Papers arising from IAEA Coordinated Research Project “Utilization of ion accelerators for studying and modelling of radiation induced defects in semiconductors and insulators” (F11016)
|
Vittone, Ettore
|
|
2016
|
372 |
C |
p. 127-
1 p.
|
article
|
| 16 |
Raman investigation of lattice defects and stress induced in InP and GaN films by swift heavy ion irradiation
|
Hu, P.P.
|
|
2016
|
372 |
C |
p. 29-37
9 p.
|
article
|
| 17 |
Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications
|
Mu, Yifei
|
|
2016
|
372 |
C |
p. 14-28
15 p.
|
article
|
| 18 |
Simulation of Auger electron emission from nanometer-size gold targets using the Geant4 Monte Carlo simulation toolkit
|
Incerti, S.
|
|
2016
|
372 |
C |
p. 91-101
11 p.
|
article
|
| 19 |
Simulation of photofission experiments at the ELI-NP facility
|
Constantin, P.
|
|
2016
|
372 |
C |
p. 78-85
8 p.
|
article
|
| 20 |
The effect of electron beam irradiation on silver–sodium ion exchange in silicate glasses
|
Sidorov, Alexander I.
|
|
2016
|
372 |
C |
p. 44-49
6 p.
|
article
|
| 21 |
The evaluation of radiation damage parameter for CVD diamond
|
Grilj, V.
|
|
2016
|
372 |
C |
p. 161-164
4 p.
|
article
|
| 22 |
The influence of the mean charge state on the Coulomb heating of fast diclusters through the Si〈111〉 direction
|
Nascimento, C.D.
|
|
2016
|
372 |
C |
p. 86-90
5 p.
|
article
|
| 23 |
Two-dimensional dopant profiling of gallium nitride p–n junctions by scanning capacitance microscopy
|
Lamhamdi, M.
|
|
2016
|
372 |
C |
p. 67-71
5 p.
|
article
|
| 24 |
Vacancy-related defects in n-type Si implanted with a rarefied microbeam of accelerated heavy ions in the MeV range
|
Capan, I.
|
|
2016
|
372 |
C |
p. 156-160
5 p.
|
article
|
Journal description