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Raman investigation of lattice defects and stress induced in InP and GaN films by swift heavy ion irradiation |
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Titel: |
Raman investigation of lattice defects and stress induced in InP and GaN films by swift heavy ion irradiation |
Auteur: |
Hu, P.P. Liu, J. Zhang, S.X. Maaz, K. Zeng, J. Guo, H. Zhai, P.F. Duan, J.L. Sun, Y.M. Hou, M.D. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paginering: |
Jaargang 372 (2016) nr. C pagina's 9 p. |
Jaar: |
2016 |
Inhoud: |
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Uitgever: |
Published by Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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