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                             21 results found
no title author magazine year volume issue page(s) type
1 Adhesion work analysis through molecular modeling and wetting angle measurement Król, Dawid Jan
2015
55 5 p. 758-764
7 p.
article
2 Assessment of long term reliability of photovoltaic glass–glass modules vs. glass-back sheet modules subjected to temperature cycles by FE-analysis Kraemer, F.
2015
55 5 p. 716-721
6 p.
article
3 Computationally efficient and stable order reduction methods for a large-scale model of MEMS piezoelectric energy harvester Kudryavtsev, M.
2015
55 5 p. 747-757
11 p.
article
4 Degradation of silicone in white LEDs during device operation: a finite element approach to product reliability prediction Watzke, S.
2015
55 5 p. 733-737
5 p.
article
5 Diamond layout style impact on SOI MOSFET in high temperature environment Gimenez, Salvador Pinillos
2015
55 5 p. 783-788
6 p.
article
6 Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics Moon, Pyung
2015
55 5 p. 795-798
4 p.
article
7 Electromechanical properties of printed copper ink film using a white flash light annealing process for flexible electronics Eun, Kyoungtae
2015
55 5 p. 838-845
8 p.
article
8 Failure analysis on reflector blackening between lead frame electrodes in LEDs under WHTOL test Zhang, Lei
2015
55 5 p. 799-806
8 p.
article
9 Guest Editorial: 2014 EuroSimE International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems Wymysłowski, Artur
2015
55 5 p. 713-715
3 p.
article
10 Inside front cover - Editorial board 2015
55 5 p. IFC-
1 p.
article
11 Life test of an X-band MMIC multi-function chip for active phased array radar applications Jeong, Jin-Cheol
2015
55 5 p. 815-821
7 p.
article
12 Low-power MicroVrms noise neural spike detector for implantable interface microsystem device Li, Hongge
2015
55 5 p. 807-814
8 p.
article
13 Mechanical stress field assisted charge de-trapping in carbon doped oxides Alam, M.T.
2015
55 5 p. 846-851
6 p.
article
14 Microstructure simulation of grain growth in Cu through silicon vias using phase-field modeling Nabiollahi, Nabi
2015
55 5 p. 765-770
6 p.
article
15 Multiphysics modeling approach for micro electro–thermo–mechanical actuator: Failure mechanisms coupled analysis Wang, Jinling
2015
55 5 p. 771-782
12 p.
article
16 [No title] Gan, Chong Leong
2015
55 5 p. 852-
1 p.
article
17 Potentiality of trap charge effects and SiON induced interface defects in a-Si3N4/SiON based MIS structure for resistive NVM device Dinara, Syed Mukulika
2015
55 5 p. 789-794
6 p.
article
18 Rapid method for testing efficacy of nano-engineered coatings for mitigating tin whisker growth Doudrick, Kyle
2015
55 5 p. 832-837
6 p.
article
19 Thermal resistance of side by side multi-chip package: Thermal mode analysis Chen, Dao-Long
2015
55 5 p. 822-831
10 p.
article
20 Thermo-mechanical characterization of passive stress sensors in Si interposer Vianne, Benjamin
2015
55 5 p. 738-746
9 p.
article
21 The shear strength of nano-Ag sintered joints and the use of Ag interconnects in the design and manufacture of SiGe-based thermo-electric modules Edwards, Michael
2015
55 5 p. 722-732
11 p.
article
                             21 results found
 
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