| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Anomalous drain voltage dependence in bias temperature instability measurements on high-κ field effect transistors
|
Mee, J.K.
|
|
2011
|
51 |
6 |
p. 1113-1117
5 p.
|
artikel
|
| 2 |
Back-end soft and hard defect monitoring using a single test chip
|
Rigaud, Fabrice
|
|
2011
|
51 |
6 |
p. 1136-1141
6 p.
|
artikel
|
| 3 |
Basic thermo-mechanical property estimation of a 3D-crosslinked epoxy/SiO2 interface using molecular modelling
|
Hölck, O.
|
|
2011
|
51 |
6 |
p. 1027-1034
8 p.
|
artikel
|
| 4 |
Comparison of TID response in core, input/output and high voltage transistors for flash memory
|
Liu, Zhangli
|
|
2011
|
51 |
6 |
p. 1148-1151
4 p.
|
artikel
|
| 5 |
Design and implementation of flexible and stretchable systems
|
Gonzalez, Mario
|
|
2011
|
51 |
6 |
p. 1069-1076
8 p.
|
artikel
|
| 6 |
2010 EuroSimE international conference on thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems
|
Wymysłowski, Artur
|
|
2011
|
51 |
6 |
p. 1025-1026
2 p.
|
artikel
|
| 7 |
Extraction of elastic–plastic material properties of thin films through nanoindentaion technique with support of numerical methods
|
Dowhań, Łukasz
|
|
2011
|
51 |
6 |
p. 1046-1053
8 p.
|
artikel
|
| 8 |
Inside front cover - Editorial board
|
|
|
2011
|
51 |
6 |
p. IFC-
1 p.
|
artikel
|
| 9 |
Investigation on hot-carrier-induced degradation of SOI NLIGBT
|
Zhang, Shifeng
|
|
2011
|
51 |
6 |
p. 1097-1104
8 p.
|
artikel
|
| 10 |
Local stress analysis on semiconductor devices by combined experimental–numerical procedure
|
Kregting, Rene
|
|
2011
|
51 |
6 |
p. 1092-1096
5 p.
|
artikel
|
| 11 |
Low-complexity Concurrent Error Detection for convolution with Fast Fourier Transforms
|
Bleakley, C.J.
|
|
2011
|
51 |
6 |
p. 1152-1156
5 p.
|
artikel
|
| 12 |
Measuring time-dependent deformations in metallic MEMS
|
Bergers, L.I.J.C.
|
|
2011
|
51 |
6 |
p. 1054-1059
6 p.
|
artikel
|
| 13 |
Mechanisms of deformation in high-ductility Ce-containing Sn–Ag–Cu solder alloys
|
Xie, H.X.
|
|
2011
|
51 |
6 |
p. 1142-1147
6 p.
|
artikel
|
| 14 |
Modeling mechanical properties of an epoxy using particle dynamics, as parameterized through molecular modeling
|
Iwamoto, Nancy
|
|
2011
|
51 |
6 |
p. 1035-1045
11 p.
|
artikel
|
| 15 |
Optimization for simulation of WL-CSP subjected to drop-test with plasticity behavior
|
Le Coq, Cédric
|
|
2011
|
51 |
6 |
p. 1060-1068
9 p.
|
artikel
|
| 16 |
Performance analysis of long Ge channel double gate (DG) p MOSFETs with high-k gate dielectrics based on carrier concentration formulation
|
Bhattacherjee, Swagata
|
|
2011
|
51 |
6 |
p. 1105-1112
8 p.
|
artikel
|
| 17 |
Reliability of thin ZrO2 gate dielectric layers
|
O’Connor, Robert
|
|
2011
|
51 |
6 |
p. 1118-1122
5 p.
|
artikel
|
| 18 |
Spin polarization in a two-dimensional electron gas modulated by ferromagnetic and Schottky metal stripes
|
Lu, J.D.
|
|
2011
|
51 |
6 |
p. 1123-1126
4 p.
|
artikel
|
| 19 |
Study for the non-contact characterization of metallization ageing of power electronic semiconductor devices using the eddy current technique
|
Nguyen, T.A.
|
|
2011
|
51 |
6 |
p. 1127-1135
9 p.
|
artikel
|
| 20 |
Toward comprehensive reliability assessment of electronics by a combined loading approach
|
Mattila, T.T.
|
|
2011
|
51 |
6 |
p. 1077-1091
15 p.
|
artikel
|
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