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Details for article 1 of 20 found articles
| Title: |
Anomalous drain voltage dependence in bias temperature instability measurements on high-κ field effect transistors |
| Author: |
Mee, J.K. Devine, R.A.B. Trombetta, L. Kaplar, R.J. Gouker, P. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 6 pages 5 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 20 found articles
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