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Journal description
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Details for article 4 of 20 found articles
| Title: |
Comparison of TID response in core, input/output and high voltage transistors for flash memory |
| Author: |
Liu, Zhangli Hu, Zhiyuan Zhang, Zhengxuan Shao, Hua Chen, Ming Bi, Dawei Ning, Bingxu Zou, Shichang |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 6 pages 4 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 20 found articles
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