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                                       Details for article 4 of 20 found articles
 
 
  Comparison of TID response in core, input/output and high voltage transistors for flash memory
 
 
Title: Comparison of TID response in core, input/output and high voltage transistors for flash memory
Author: Liu, Zhangli
Hu, Zhiyuan
Zhang, Zhengxuan
Shao, Hua
Chen, Ming
Bi, Dawei
Ning, Bingxu
Zou, Shichang
Appeared in: Microelectronics reliability
Paging: Volume 51 (2011) nr. 6 pages 4 p.
Year: 2011
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 20 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands