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                             28 results found
no title author magazine year volume issue page(s) type
1 An investigation into the crystallization and electric flame-off characteristics of 20μm copper wires Hung, Fei-Yi
2011
51 1 p. 21-24
4 p.
article
2 Anomalous microstructure formed at the interface between copper ribbon and tin-deposited copper plate by ultrasonic bonding Maeda, Masakatsu
2011
51 1 p. 130-136
7 p.
article
3 A study on the tensile fracture mechanism of 15μm copper wire after EFO process Huang, I-Ting
2011
51 1 p. 25-29
5 p.
article
4 Bond reliability under humid environment for coated copper wire and bare copper wire Uno, Tomohiro
2011
51 1 p. 148-156
9 p.
article
5 Characteristic of copper wire and transient analysis on wirebonding process Hsu, Hsiang-Chen
2011
51 1 p. 179-186
8 p.
article
6 Copper Wire Bonding Mayer, Michael
2011
51 1 p. 1-2
2 p.
article
7 Cu wire bond microstructure analysis and failure mechanism Yu, Cheng-Fu
2011
51 1 p. 119-124
6 p.
article
8 Cu wire bond parameter optimization on various bond pad metallization and barrier layer material schemes England, Luke
2011
51 1 p. 81-87
7 p.
article
9 Effect of bonding duration and substrate temperature in copper ball bonding on aluminium pads: A TEM study of interfacial evolution Xu, H.
2011
51 1 p. 113-118
6 p.
article
10 Effect of gas type and flow rate on Cu free air ball formation in thermosonic wire bonding Pequegnat, A.
2011
51 1 p. 43-52
10 p.
article
11 Enhancing bondability with coated copper bonding wire Uno, Tomohiro
2011
51 1 p. 88-96
9 p.
article
12 Factors affecting the long-term stability of Cu/Al ball bonds subjected to standard and extended high temperature storage Vath III, Charles J.
2011
51 1 p. 137-147
11 p.
article
13 Fine pitch copper wire bonding in high volume production Appelt, Bernd K.
2011
51 1 p. 13-20
8 p.
article
14 Influence of bonding process parameters on chip cratering and phase formation of Cu ball bonds on AlSiCu during storage at 200°C Schmitz, S.
2011
51 1 p. 107-112
6 p.
article
15 Influence of gold pick up on the hardness of copper free air ball Lee, J.
2011
51 1 p. 30-37
8 p.
article
16 Inside front cover - Editorial board 2011
51 1 p. IFC-
1 p.
article
17 Investigation of growth behavior of Al–Cu intermetallic compounds in Cu wire bonding Chen, Jiunn
2011
51 1 p. 125-129
5 p.
article
18 Investigation on copper diffusion depth in copper wire bonding Chen, Catherine H.
2011
51 1 p. 166-170
5 p.
article
19 Modeling of copper wire bonding process on high power LEDs Chen, Zhaohui
2011
51 1 p. 171-178
8 p.
article
20 Nickel–palladium bond pads for copper wire bonding Clauberg, Horst
2011
51 1 p. 75-80
6 p.
article
21 Optimization of the Cu wire bonding process for IC assembly using Taguchi methods Su, Chao-Ton
2011
51 1 p. 53-59
7 p.
article
22 Overview of wire bonding using copper wire or insulated wire Zhong, Z.W.
2011
51 1 p. 4-12
9 p.
article
23 Preface Harman NIST Fellow, George G.
2011
51 1 p. 3-
1 p.
article
24 Reduction of ultrasonic pad stress and aluminum splash in copper ball bonding Shah, A.
2011
51 1 p. 67-74
8 p.
article
25 Reliability and failure analysis of fine copper wire bonds encapsulated with commercial epoxy molding compound Tian, Y.H.
2011
51 1 p. 157-165
9 p.
article
26 Role of process parameters on bondability and pad damage indicators in copper ball bonding Qin, I.
2011
51 1 p. 60-66
7 p.
article
27 Room temperature wedge–wedge ultrasonic bonding using aluminum coated copper wire Dohle, Rainer
2011
51 1 p. 97-106
10 p.
article
28 Silver pick up during tail formation in thermosonic wire bonding process Lee, J.
2011
51 1 p. 38-42
5 p.
article
                             28 results found
 
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