| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Angle-resolved photoelectron spectroscopy on gate insulators
|
Hattori, T.
|
|
2007
|
47 |
1 |
p. 20-26
7 p.
|
artikel
|
| 2 |
A review of the use of electro-thermal simulations for the analysis of heterostructure FETs
|
Sozzi, Giovanna
|
|
2007
|
47 |
1 |
p. 65-73
9 p.
|
artikel
|
| 3 |
A voltage calibration technique of electro-optic probing for characterization internal to IC’s chip
|
Liu, Hongfei
|
|
2007
|
47 |
1 |
p. 82-87
6 p.
|
artikel
|
| 4 |
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation
|
Fu, Y.
|
|
2007
|
47 |
1 |
p. 46-50
5 p.
|
artikel
|
| 5 |
Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests
|
Belaïd, M.A.
|
|
2007
|
47 |
1 |
p. 59-64
6 p.
|
artikel
|
| 6 |
Computational modelling for reliable flip-chip packaging at sub-100μm pitch using isotropic conductive adhesives
|
Stoyanov, S.
|
|
2007
|
47 |
1 |
p. 132-141
10 p.
|
artikel
|
| 7 |
Cyclic bending reliability of wafer-level chip-scale packages
|
Lai, Yi-Shao
|
|
2007
|
47 |
1 |
p. 111-117
7 p.
|
artikel
|
| 8 |
Effects of TMF heating rates on damage accumulation and resultant mechanical behavior of Sn–Ag based solder joints
|
Lee, J.G.
|
|
2007
|
47 |
1 |
p. 118-131
14 p.
|
artikel
|
| 9 |
Modeling current transport in ultra-scaled field-effect transistors
|
Sverdlov, V.
|
|
2007
|
47 |
1 |
p. 11-19
9 p.
|
artikel
|
| 10 |
N-MOSFET oxide trap characterization induced by nitridation process using RTS noise analysis
|
Leyris, C.
|
|
2007
|
47 |
1 |
p. 41-45
5 p.
|
artikel
|
| 11 |
[No title]
|
Stojcev, Mile
|
|
2007
|
47 |
1 |
p. 157-158
2 p.
|
artikel
|
| 12 |
[No title]
|
Tosic, Milorad
|
|
2007
|
47 |
1 |
p. 155-156
2 p.
|
artikel
|
| 13 |
Optimal design towards enhancement of board-level thermomechanical reliability of wafer-level chip-scale packages
|
Lai, Yi-Shao
|
|
2007
|
47 |
1 |
p. 104-110
7 p.
|
artikel
|
| 14 |
Overview on ESD protection design for mixed-voltage I/O interfaces with high-voltage-tolerant power-rail ESD clamp circuits in low-voltage thin-oxide CMOS technology
|
Ker, Ming-Dou
|
|
2007
|
47 |
1 |
p. 27-35
9 p.
|
artikel
|
| 15 |
Reconfigurable digital controller for a buck converter based on FPGA
|
Milanovic, Miro
|
|
2007
|
47 |
1 |
p. 150-154
5 p.
|
artikel
|
| 16 |
Sample tilting technique for preventing electrostatic discharge during high-current FIB gas-assisted etching with XeF2
|
Komoda, Hirotaka
|
|
2007
|
47 |
1 |
p. 74-81
8 p.
|
artikel
|
| 17 |
Silicon integrated photonics begins to revolutionize
|
Wong, Hei
|
|
2007
|
47 |
1 |
p. 1-10
10 p.
|
artikel
|
| 18 |
Single band electronic conduction in hafnium oxide prepared by atomic layer deposition
|
Shaimeev, Sergey
|
|
2007
|
47 |
1 |
p. 36-40
5 p.
|
artikel
|
| 19 |
Study of the electrical cycling stressed large area Schottky diodes using I–V and noise measurements
|
Jevtić, Milan M.
|
|
2007
|
47 |
1 |
p. 51-58
8 p.
|
artikel
|
| 20 |
Test methodology for durability estimation of surface mount interconnects under drop testing conditions
|
Varghese, J.
|
|
2007
|
47 |
1 |
p. 93-103
11 p.
|
artikel
|
| 21 |
The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth
|
Fukuda, Yuki
|
|
2007
|
47 |
1 |
p. 88-92
5 p.
|
artikel
|
| 22 |
Using neural networks as a fault detection mechanism in MEMS devices
|
Asgary, Reza
|
|
2007
|
47 |
1 |
p. 142-149
8 p.
|
artikel
|
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