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Journal description
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Details for article 14 of 22 found articles
| Title: |
Overview on ESD protection design for mixed-voltage I/O interfaces with high-voltage-tolerant power-rail ESD clamp circuits in low-voltage thin-oxide CMOS technology |
| Author: |
Ker, Ming-Dou Chang, Wei-Jen |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 1 pages 9 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 22 found articles
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