| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A fault-tolerant cache architecture based on binary set partitioning
|
Zarandi, Hamid R.
|
|
2006
|
46 |
1 |
p. 86-99
14 p.
|
artikel
|
| 2 |
Algorithm for automatic alignment in 2D space by object transformation
|
Kim, Hyong Tae
|
|
2006
|
46 |
1 |
p. 100-108
9 p.
|
artikel
|
| 3 |
A study in flip-chip UBM/bump reliability with effects of SnPb solder composition
|
Wu, J.D.
|
|
2006
|
46 |
1 |
p. 41-52
12 p.
|
artikel
|
| 4 |
Damped transient power clamps for improved ESD protection of CMOS
|
Hunter, Bradford L.
|
|
2006
|
46 |
1 |
p. 77-85
9 p.
|
artikel
|
| 5 |
EBSD measurements of elastic strain fields in a GaN/sapphire structure
|
Luo, J.F.
|
|
2006
|
46 |
1 |
p. 178-182
5 p.
|
artikel
|
| 6 |
Effect of reverse substrate bias on ultra-thin gate oxide n-MOSFET degradation under different stress modes
|
Zhao, Yao
|
|
2006
|
46 |
1 |
p. 164-168
5 p.
|
artikel
|
| 7 |
Effects of package and process variation on 2.4GHz analog integrated circuits
|
Szymañski, Andrzej
|
|
2006
|
46 |
1 |
p. 189-193
5 p.
|
artikel
|
| 8 |
Effects of underfill materials on the reliability of low-K flip-chip packaging
|
Chen, K.M.
|
|
2006
|
46 |
1 |
p. 155-163
9 p.
|
artikel
|
| 9 |
Electrical reliability aspects of HfO2 high-k gate dielectrics with TaN metal gate electrodes under constant voltage stress
|
Chatterjee, S.
|
|
2006
|
46 |
1 |
p. 69-76
8 p.
|
artikel
|
| 10 |
Electronic device encapsulation using red phosphorus flame retardants
|
Pecht, Michael
|
|
2006
|
46 |
1 |
p. 53-62
10 p.
|
artikel
|
| 11 |
Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs
|
Chou, Y.C.
|
|
2006
|
46 |
1 |
p. 24-40
17 p.
|
artikel
|
| 12 |
High-temperature reliability of Flip Chip assemblies
|
Braun, T.
|
|
2006
|
46 |
1 |
p. 144-154
11 p.
|
artikel
|
| 13 |
Material properties and RF applications of high k and ferrite LTCC ceramics
|
Matters-Kammerer, M.
|
|
2006
|
46 |
1 |
p. 134-143
10 p.
|
artikel
|
| 14 |
Measurements and simulations of transient characteristics of heat pipes
|
Legierski, Jarosław
|
|
2006
|
46 |
1 |
p. 109-115
7 p.
|
artikel
|
| 15 |
NBTI degradation: From physical mechanisms to modelling
|
Huard, V.
|
|
2006
|
46 |
1 |
p. 1-23
23 p.
|
artikel
|
| 16 |
[No title]
|
Stojcev, Mile
|
|
2006
|
46 |
1 |
p. 196-197
2 p.
|
artikel
|
| 17 |
[No title]
|
Stojcev, Mile K.
|
|
2006
|
46 |
1 |
p. 194-195
2 p.
|
artikel
|
| 18 |
[No title]
|
Stojcev, M.
|
|
2006
|
46 |
1 |
p. 198-199
2 p.
|
artikel
|
| 19 |
PMOS NBTI-induced circuit mismatch in advanced technologies
|
Agostinelli, M.
|
|
2006
|
46 |
1 |
p. 63-68
6 p.
|
artikel
|
| 20 |
Reliability of Pb(Mg,Nb)O3–Pb(Zr,Ti)O3 multilayer ceramic piezoelectric actuators by Weibull method
|
Koh, Jung-Hyuk
|
|
2006
|
46 |
1 |
p. 183-188
6 p.
|
artikel
|
| 21 |
Temperature effects on DC and small signal RF performance of AlGaAs/GaAs HEMTs
|
Caddemi, A.
|
|
2006
|
46 |
1 |
p. 169-173
5 p.
|
artikel
|
| 22 |
Thermal impedance plots of micro-scaled devices
|
Vermeersch, B.
|
|
2006
|
46 |
1 |
p. 174-177
4 p.
|
artikel
|
| 23 |
Transient detection in COTS processors using software approach
|
Rajabzadeh, Amir
|
|
2006
|
46 |
1 |
p. 124-133
10 p.
|
artikel
|
| 24 |
Transient IR imaging of light and flexible microelectronic devices
|
Radivojevic, Z.
|
|
2006
|
46 |
1 |
p. 116-123
8 p.
|
artikel
|
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