| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A new algorithm for transforming exponential current ramp breakdown distributions into constant current TDDB space, and the implications for gate oxide Q BD measurement methods
|
Dumin, N.A
|
|
1999
|
39 |
3 |
p. 373-381
9 p.
|
artikel
|
| 2 |
Book review
|
|
|
1999
|
39 |
3 |
p. 425-
1 p.
|
artikel
|
| 3 |
Book review
|
|
|
1999
|
39 |
3 |
p. 427-
1 p.
|
artikel
|
| 4 |
Book review
|
|
|
1999
|
39 |
3 |
p. 429-
1 p.
|
artikel
|
| 5 |
Degradation of InGaAs/InP single heterojunction bipolar transistors under high energy electron irradiation
|
Bandyopadhyay, A.
|
|
1999
|
39 |
3 |
p. 333-339
7 p.
|
artikel
|
| 6 |
Dislocation dynamics in heterojunction bipolar transistor under current induced thermal stress
|
Tsai, C.T.
|
|
1999
|
39 |
3 |
p. 383-389
7 p.
|
artikel
|
| 7 |
Evaluation of reliability of μBGA solder joints through twisting and bending 1 1 An earlier version of this paper was published in Proceedings of the International Symposium of Microelectronics, Philadelphia, 14–16 October, 1997[1].
|
Perera, U.Daya
|
|
1999
|
39 |
3 |
p. 391-399
9 p.
|
artikel
|
| 8 |
Frequency dependence of the lifetime of a surface micromachined microengine driving a load
|
Tanner, Danelle M
|
|
1999
|
39 |
3 |
p. 401-414
14 p.
|
artikel
|
| 9 |
Gate oxide reliability concerns in gate-metal sputtering deposition process: an effect of low-energy large-mass ion bombardment
|
Ushiki, Takeo
|
|
1999
|
39 |
3 |
p. 327-332
6 p.
|
artikel
|
| 10 |
Improvement of gate dielectric reliability for p+poly MOS devices using remote PECVD top nitride deposition on ultra-thin (2.4–6 nm) gate oxides
|
Wu, Y
|
|
1999
|
39 |
3 |
p. 365-372
8 p.
|
artikel
|
| 11 |
New layout design for submicron CMOS output transistors to improve driving capability and ESD robustness
|
Ker, M.-D.
|
|
1999
|
39 |
3 |
p. 415-424
10 p.
|
artikel
|
| 12 |
Oxide thickness dependence of plasma charging damage
|
Lin, H.-C
|
|
1999
|
39 |
3 |
p. 357-364
8 p.
|
artikel
|
| 13 |
Random telegraph signal noise instabilities in lattice-mismatched InGaAs/InP photodiodes
|
Pogany, D.
|
|
1999
|
39 |
3 |
p. 341-345
5 p.
|
artikel
|
| 14 |
Texture and electromigration lifetime improvements in layered Al-alloy metallization with underlying Ti by controlling water adsorption on SiO2 substrates
|
Yoshida, Tomoyuki
|
|
1999
|
39 |
3 |
p. 347-356
10 p.
|
artikel
|
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