nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An algorithm for determining the most reliable path of a network
|
Jain, V.K. |
|
1986 |
26 |
5 |
p. 883-884 2 p. |
artikel |
2 |
4567432 Apparatus for testing integrated circuits
|
Buol, DouglasA |
|
1986 |
26 |
5 |
p. 999- 1 p. |
artikel |
3 |
A simple method for calculating the structural importance of a component
|
Lu, Pei-En |
|
1986 |
26 |
5 |
p. 857-858 2 p. |
artikel |
4 |
A single server multi-component two-unit cold standby system with inspection and imperfect switching device
|
Gupta, Rakesh |
|
1986 |
26 |
5 |
p. 873-877 5 p. |
artikel |
5 |
4567433 Complex probe card for testing a semiconductor wafer
|
Ohkubo, Masao |
|
1986 |
26 |
5 |
p. 999- 1 p. |
artikel |
6 |
Cost analysis of a 2-unit standby redundant electronic system with critical human errors
|
Gupta, P.P. |
|
1986 |
26 |
5 |
p. 841-846 6 p. |
artikel |
7 |
Cost-benefit analysis of a multi-component standby system with inspection and slow switch
|
Gupta, Rakesh |
|
1986 |
26 |
5 |
p. 879-882 4 p. |
artikel |
8 |
Cost-benefit analysis of a two-unit deteriorating standby system with detector
|
Goel, L.R. |
|
1986 |
26 |
5 |
p. 863-866 4 p. |
artikel |
9 |
Cost function analysis of a standby redundant non-repairable system subjected to different types of failures
|
Gupta, P.P. |
|
1986 |
26 |
5 |
p. 835-839 5 p. |
artikel |
10 |
4567428 Detection of catastrophic failure of dielectric improper connection, and temperature of a printed circuit assembly via one wire
|
Zbinden, TerryB |
|
1986 |
26 |
5 |
p. 999- 1 p. |
artikel |
11 |
Eigenvalue-eigenvector solutions for two general markov models in reliability
|
Johnson, L.Ensign |
|
1986 |
26 |
5 |
p. 917-933 17 p. |
artikel |
12 |
Evaluation of reliability and M.T.T.F. of a power plant with the aid of Boolean function expansion algorithm
|
Gupta, P.P. |
|
1986 |
26 |
5 |
p. 821-824 4 p. |
artikel |
13 |
4570231 Fault finder
|
Bunch, RichardH |
|
1986 |
26 |
5 |
p. 1000- 1 p. |
artikel |
14 |
First failure time of dependent parallel systems with safety periods
|
Shanthikumar, J.George |
|
1986 |
26 |
5 |
p. 955-972 18 p. |
artikel |
15 |
8505733 High density IC module assembly
|
Drye, JamesE |
|
1986 |
26 |
5 |
p. 1001- 1 p. |
artikel |
16 |
4558346 Highly reliable hermetically sealed package for a semiconductor device
|
Kida, Susumu |
|
1986 |
26 |
5 |
p. 997- 1 p. |
artikel |
17 |
Human Reliability with Human Factors
|
G.W.A.D., |
|
1986 |
26 |
5 |
p. 994-995 2 p. |
artikel |
18 |
Longterm performance studies of electronic components at rated electrical stress
|
Bora, J.S. |
|
1986 |
26 |
5 |
p. 989-991 3 p. |
artikel |
19 |
4566940 Manufacturing process for semiconductor integrated circuits
|
Itsumi, Manabu |
|
1986 |
26 |
5 |
p. 998- 1 p. |
artikel |
20 |
Map differentiation of switching functions
|
Rushdi, Ali M. |
|
1986 |
26 |
5 |
p. 891-907 17 p. |
artikel |
21 |
Materials quality assurance for VLSI manufacturing
|
Kohoutek, Henry J. |
|
1986 |
26 |
5 |
p. 943-953 11 p. |
artikel |
22 |
4571707 Memory circuit with improved redundant structure
|
Watanabe, Takayuki |
|
1986 |
26 |
5 |
p. 1000- 1 p. |
artikel |
23 |
4567592 Method and apparatus for the stepwise static testing of the respective connections and integrated subsystems of a microprocessor-based system for use by the general public
|
Minicilli, Jean |
|
1986 |
26 |
5 |
p. 1000- 1 p. |
artikel |
24 |
4564416 Method for producing a semiconductor device
|
Homma, Kazumoto |
|
1986 |
26 |
5 |
p. 997- 1 p. |
artikel |
25 |
4564807 Method of judging carrier lifetime in semiconductor devices
|
Ikezi, Hiroyuk |
|
1986 |
26 |
5 |
p. 997-998 2 p. |
artikel |
26 |
4571093 Method of testing plastic-packaged semiconductor devices
|
Eugene Gottlieb, G |
|
1986 |
26 |
5 |
p. 1000- 1 p. |
artikel |
27 |
Operational behaviour of a three state standby redundant electronic equipment under critical human errors
|
Gupta, P.P. |
|
1986 |
26 |
5 |
p. 809-814 6 p. |
artikel |
28 |
Optimal inspection policy with two types of imperfect inspection probabilities
|
Kaio, Naoto |
|
1986 |
26 |
5 |
p. 935-942 8 p. |
artikel |
29 |
Optimum burn-in time: Model and application
|
Sultan, Torky I. |
|
1986 |
26 |
5 |
p. 909-916 8 p. |
artikel |
30 |
4564922 Postage meter with power-failure resistant memory
|
Muller, Arno |
|
1986 |
26 |
5 |
p. 998- 1 p. |
artikel |
31 |
4564394 Preventing lateral oxide growth by first forming nitride layer followed by a composite masking layer
|
Bussmann, Egon |
|
1986 |
26 |
5 |
p. 997- 1 p. |
artikel |
32 |
4566184 Process for making a probe for high speed integrated circuits
|
Aiden Higgins, J |
|
1986 |
26 |
5 |
p. 998- 1 p. |
artikel |
33 |
Publications, notices, calls for papers, etc.
|
|
|
1986 |
26 |
5 |
p. 803-807 5 p. |
artikel |
34 |
4567580 Redundancy roll call technique
|
Varshney, RameshC |
|
1986 |
26 |
5 |
p. 999- 1 p. |
artikel |
35 |
Reliability analysis of a series-parallel system under different repair disciplines
|
Nikolov, Angel Vasilev |
|
1986 |
26 |
5 |
p. 851-856 6 p. |
artikel |
36 |
Reliability analysis of a two-unit cold standby redundant system with administrative delay and no priority in repair
|
Gupta, S.M. |
|
1986 |
26 |
5 |
p. 847-850 4 p. |
artikel |
37 |
Reliability analysis of a two-unit redundant system with critical human error
|
Kumar, Ashok |
|
1986 |
26 |
5 |
p. 867-871 5 p. |
artikel |
38 |
Reliability and M.T.T.F. analysis of a power plant, connected with one hundred per cent reliable cables by B.F. technique
|
Gupta, P.P. |
|
1986 |
26 |
5 |
p. 825-834 10 p. |
artikel |
39 |
Reliability behaviour of a power plant by boolean function technique under arbitrary failure time distribution
|
Gupta, P.P. |
|
1986 |
26 |
5 |
p. 815-819 5 p. |
artikel |
40 |
Repairable Systems Reliability Modeling, Inference, Misconceptions and Their Causes
|
G.W.A.D., |
|
1986 |
26 |
5 |
p. 993- 1 p. |
artikel |
41 |
4572853 Resin encapsulation type semiconductor device
|
Ikeya, Hirotoshi |
|
1986 |
26 |
5 |
p. 1000- 1 p. |
artikel |
42 |
Stochastic analysis of a two unit standby system with two switching devices
|
Goel, L.R. |
|
1986 |
26 |
5 |
p. 859-861 3 p. |
artikel |
43 |
Stochastic behaviour of a two-unit cold standby redundant system with administrative delay and two types of repairs
|
Pandey, D.K. |
|
1986 |
26 |
5 |
p. 885-889 5 p. |
artikel |
44 |
4573146 Testing and evaluation of a semiconductor memory containing redundant memory elements
|
Graham, AndrewC |
|
1986 |
26 |
5 |
p. 1001- 1 p. |
artikel |
45 |
4566104 Testing digital electronic circuits
|
Bradshaw, GeorgeM |
|
1986 |
26 |
5 |
p. 998- 1 p. |
artikel |
46 |
Utilization of symmetric switching functions in the computation of k-out-of-n system reliability
|
Rushdi, Ali M. |
|
1986 |
26 |
5 |
p. 973-987 15 p. |
artikel |