| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
An algorithm for determining the most reliable path of a network
|
Jain, V.K.
|
|
1986
|
26 |
5 |
p. 883-884
2 p.
|
article
|
| 2 |
4567432 Apparatus for testing integrated circuits
|
Buol, DouglasA
|
|
1986
|
26 |
5 |
p. 999-
1 p.
|
article
|
| 3 |
A simple method for calculating the structural importance of a component
|
Lu, Pei-En
|
|
1986
|
26 |
5 |
p. 857-858
2 p.
|
article
|
| 4 |
A single server multi-component two-unit cold standby system with inspection and imperfect switching device
|
Gupta, Rakesh
|
|
1986
|
26 |
5 |
p. 873-877
5 p.
|
article
|
| 5 |
4567433 Complex probe card for testing a semiconductor wafer
|
Ohkubo, Masao
|
|
1986
|
26 |
5 |
p. 999-
1 p.
|
article
|
| 6 |
Cost analysis of a 2-unit standby redundant electronic system with critical human errors
|
Gupta, P.P.
|
|
1986
|
26 |
5 |
p. 841-846
6 p.
|
article
|
| 7 |
Cost-benefit analysis of a multi-component standby system with inspection and slow switch
|
Gupta, Rakesh
|
|
1986
|
26 |
5 |
p. 879-882
4 p.
|
article
|
| 8 |
Cost-benefit analysis of a two-unit deteriorating standby system with detector
|
Goel, L.R.
|
|
1986
|
26 |
5 |
p. 863-866
4 p.
|
article
|
| 9 |
Cost function analysis of a standby redundant non-repairable system subjected to different types of failures
|
Gupta, P.P.
|
|
1986
|
26 |
5 |
p. 835-839
5 p.
|
article
|
| 10 |
4567428 Detection of catastrophic failure of dielectric improper connection, and temperature of a printed circuit assembly via one wire
|
Zbinden, TerryB
|
|
1986
|
26 |
5 |
p. 999-
1 p.
|
article
|
| 11 |
Eigenvalue-eigenvector solutions for two general markov models in reliability
|
Johnson, L.Ensign
|
|
1986
|
26 |
5 |
p. 917-933
17 p.
|
article
|
| 12 |
Evaluation of reliability and M.T.T.F. of a power plant with the aid of Boolean function expansion algorithm
|
Gupta, P.P.
|
|
1986
|
26 |
5 |
p. 821-824
4 p.
|
article
|
| 13 |
4570231 Fault finder
|
Bunch, RichardH
|
|
1986
|
26 |
5 |
p. 1000-
1 p.
|
article
|
| 14 |
First failure time of dependent parallel systems with safety periods
|
Shanthikumar, J.George
|
|
1986
|
26 |
5 |
p. 955-972
18 p.
|
article
|
| 15 |
8505733 High density IC module assembly
|
Drye, JamesE
|
|
1986
|
26 |
5 |
p. 1001-
1 p.
|
article
|
| 16 |
4558346 Highly reliable hermetically sealed package for a semiconductor device
|
Kida, Susumu
|
|
1986
|
26 |
5 |
p. 997-
1 p.
|
article
|
| 17 |
Human Reliability with Human Factors
|
G.W.A.D.,
|
|
1986
|
26 |
5 |
p. 994-995
2 p.
|
article
|
| 18 |
Longterm performance studies of electronic components at rated electrical stress
|
Bora, J.S.
|
|
1986
|
26 |
5 |
p. 989-991
3 p.
|
article
|
| 19 |
4566940 Manufacturing process for semiconductor integrated circuits
|
Itsumi, Manabu
|
|
1986
|
26 |
5 |
p. 998-
1 p.
|
article
|
| 20 |
Map differentiation of switching functions
|
Rushdi, Ali M.
|
|
1986
|
26 |
5 |
p. 891-907
17 p.
|
article
|
| 21 |
Materials quality assurance for VLSI manufacturing
|
Kohoutek, Henry J.
|
|
1986
|
26 |
5 |
p. 943-953
11 p.
|
article
|
| 22 |
4571707 Memory circuit with improved redundant structure
|
Watanabe, Takayuki
|
|
1986
|
26 |
5 |
p. 1000-
1 p.
|
article
|
| 23 |
4567592 Method and apparatus for the stepwise static testing of the respective connections and integrated subsystems of a microprocessor-based system for use by the general public
|
Minicilli, Jean
|
|
1986
|
26 |
5 |
p. 1000-
1 p.
|
article
|
| 24 |
4564416 Method for producing a semiconductor device
|
Homma, Kazumoto
|
|
1986
|
26 |
5 |
p. 997-
1 p.
|
article
|
| 25 |
4564807 Method of judging carrier lifetime in semiconductor devices
|
Ikezi, Hiroyuk
|
|
1986
|
26 |
5 |
p. 997-998
2 p.
|
article
|
| 26 |
4571093 Method of testing plastic-packaged semiconductor devices
|
Eugene Gottlieb, G
|
|
1986
|
26 |
5 |
p. 1000-
1 p.
|
article
|
| 27 |
Operational behaviour of a three state standby redundant electronic equipment under critical human errors
|
Gupta, P.P.
|
|
1986
|
26 |
5 |
p. 809-814
6 p.
|
article
|
| 28 |
Optimal inspection policy with two types of imperfect inspection probabilities
|
Kaio, Naoto
|
|
1986
|
26 |
5 |
p. 935-942
8 p.
|
article
|
| 29 |
Optimum burn-in time: Model and application
|
Sultan, Torky I.
|
|
1986
|
26 |
5 |
p. 909-916
8 p.
|
article
|
| 30 |
4564922 Postage meter with power-failure resistant memory
|
Muller, Arno
|
|
1986
|
26 |
5 |
p. 998-
1 p.
|
article
|
| 31 |
4564394 Preventing lateral oxide growth by first forming nitride layer followed by a composite masking layer
|
Bussmann, Egon
|
|
1986
|
26 |
5 |
p. 997-
1 p.
|
article
|
| 32 |
4566184 Process for making a probe for high speed integrated circuits
|
Aiden Higgins, J
|
|
1986
|
26 |
5 |
p. 998-
1 p.
|
article
|
| 33 |
Publications, notices, calls for papers, etc.
|
|
|
1986
|
26 |
5 |
p. 803-807
5 p.
|
article
|
| 34 |
4567580 Redundancy roll call technique
|
Varshney, RameshC
|
|
1986
|
26 |
5 |
p. 999-
1 p.
|
article
|
| 35 |
Reliability analysis of a series-parallel system under different repair disciplines
|
Nikolov, Angel Vasilev
|
|
1986
|
26 |
5 |
p. 851-856
6 p.
|
article
|
| 36 |
Reliability analysis of a two-unit cold standby redundant system with administrative delay and no priority in repair
|
Gupta, S.M.
|
|
1986
|
26 |
5 |
p. 847-850
4 p.
|
article
|
| 37 |
Reliability analysis of a two-unit redundant system with critical human error
|
Kumar, Ashok
|
|
1986
|
26 |
5 |
p. 867-871
5 p.
|
article
|
| 38 |
Reliability and M.T.T.F. analysis of a power plant, connected with one hundred per cent reliable cables by B.F. technique
|
Gupta, P.P.
|
|
1986
|
26 |
5 |
p. 825-834
10 p.
|
article
|
| 39 |
Reliability behaviour of a power plant by boolean function technique under arbitrary failure time distribution
|
Gupta, P.P.
|
|
1986
|
26 |
5 |
p. 815-819
5 p.
|
article
|
| 40 |
Repairable Systems Reliability Modeling, Inference, Misconceptions and Their Causes
|
G.W.A.D.,
|
|
1986
|
26 |
5 |
p. 993-
1 p.
|
article
|
| 41 |
4572853 Resin encapsulation type semiconductor device
|
Ikeya, Hirotoshi
|
|
1986
|
26 |
5 |
p. 1000-
1 p.
|
article
|
| 42 |
Stochastic analysis of a two unit standby system with two switching devices
|
Goel, L.R.
|
|
1986
|
26 |
5 |
p. 859-861
3 p.
|
article
|
| 43 |
Stochastic behaviour of a two-unit cold standby redundant system with administrative delay and two types of repairs
|
Pandey, D.K.
|
|
1986
|
26 |
5 |
p. 885-889
5 p.
|
article
|
| 44 |
4573146 Testing and evaluation of a semiconductor memory containing redundant memory elements
|
Graham, AndrewC
|
|
1986
|
26 |
5 |
p. 1001-
1 p.
|
article
|
| 45 |
4566104 Testing digital electronic circuits
|
Bradshaw, GeorgeM
|
|
1986
|
26 |
5 |
p. 998-
1 p.
|
article
|
| 46 |
Utilization of symmetric switching functions in the computation of k-out-of-n system reliability
|
Rushdi, Ali M.
|
|
1986
|
26 |
5 |
p. 973-987
15 p.
|
article
|
Journal description