| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accelerated ageing effects on the EMC performance of LDO regulators under multi-stresses: Experimental study and prediction approach
|
Liu, Hao
|
|
|
147 |
C |
p.
|
artikel
|
| 2 |
A configurable control flow error detection method based on basic block repartition
|
Yan, Zujia
|
|
|
147 |
C |
p.
|
artikel
|
| 3 |
A high-speed quadruple-node-upset-tolerant latch in 22 nm CMOS technology
|
Huang, Zhengfeng
|
|
|
147 |
C |
p.
|
artikel
|
| 4 |
Analysis of resistive defects on a foundry 8T SRAM-based IMC architecture
|
Ammoura, L.
|
|
|
147 |
C |
p.
|
artikel
|
| 5 |
Analysis of temperature dependent current-voltage and frequency dependent capacitance-voltage characteristics of Au/CoO/p-Si/Al MIS diode
|
Deniz, Ali Rıza
|
|
|
147 |
C |
p.
|
artikel
|
| 6 |
A simple sensor device for power cycle degradation sensing
|
Tsukamoto, Tatsuta
|
|
|
147 |
C |
p.
|
artikel
|
| 7 |
Characterization and modeling of threshold voltage for organic and amorphous thin-film transistors
|
Nirosha, R.
|
|
|
147 |
C |
p.
|
artikel
|
| 8 |
Cost-effective memory protection and reliability evaluation based on machine error-tolerance: A case study on no-accuracy-loss YOLOv4 object detection model
|
Hsieh, Tong-Yu
|
|
|
147 |
C |
p.
|
artikel
|
| 9 |
Design of transient enhanced output-capacitor-less flipped voltage follower based LDO regulator with a fast control loop for wide range of capacitive loads
|
Panigrahi, Antaryami
|
|
|
147 |
C |
p.
|
artikel
|
| 10 |
`Design-technology-co-hardening for voltage reference and linear voltage regulator based on bipolar technology
|
Yao, Ruxue
|
|
|
147 |
C |
p.
|
artikel
|
| 11 |
DNN-based error level prediction for reducing read latency in 3D NAND flash memory
|
He, Jing
|
|
|
147 |
C |
p.
|
artikel
|
| 12 |
Editorial Board
|
|
|
|
147 |
C |
p.
|
artikel
|
| 13 |
Effect of Al and Bi addition on the corrosion behaviour, hardness, and melting temperature of lead-free solder alloys
|
El Hamid, Sh.E. Abd
|
|
|
147 |
C |
p.
|
artikel
|
| 14 |
Effects of Ag content on microstructure evolution, intermetallic compound (IMC) and mechanical behaviour of SAC solder joints
|
Sabbar, Ehsan H.
|
|
|
147 |
C |
p.
|
artikel
|
| 15 |
Enhanced EBAC localization of gate oxide defects after high voltage electron beam irradiation
|
Ng, P.T.
|
|
|
147 |
C |
p.
|
artikel
|
| 16 |
Enhancement of turn-off gate voltage waveform change by digital gate control for bond wire lift-off detection in IGBT module
|
Mamee, Thatree
|
|
|
147 |
C |
p.
|
artikel
|
| 17 |
Finite element simulation-based prediction of CMOS-compatible pyroelectric material in MEMS IR detectors
|
Ranu,
|
|
|
147 |
C |
p.
|
artikel
|
| 18 |
Highly efficient and accurate algorithm for multiscale equivalent modeling and mechanical performance simulation of printed circuit boards
|
Wan, Guoshun
|
|
|
147 |
C |
p.
|
artikel
|
| 19 |
IGBT reliability analysis of photovoltaic inverter with reactive power output capability
|
Zhang, Bo
|
|
|
147 |
C |
p.
|
artikel
|
| 20 |
Improved breakdown voltage mechanism in AlGaN/GaN HEMT for RF/Microwave applications: Design and physical insights of dual field plate
|
Khan, Abdul Naim
|
|
|
147 |
C |
p.
|
artikel
|
| 21 |
LADA methodologies to localize embedded memory failure
|
Yeoh, B.L.
|
|
|
147 |
C |
p.
|
artikel
|
| 22 |
Monitor Units Assisted LDPC Decoding Algorithm based on Page BER Variation of 3D NAND Flash Memory
|
Zhang, Bo
|
|
|
147 |
C |
p.
|
artikel
|
| 23 |
New model of crack propagation of aluminium wire bonds in IGBT power modules under low temperature variations
|
Halouani, A.
|
|
|
147 |
C |
p.
|
artikel
|
| 24 |
Numerical modeling of FS-trench IGBTs by TCAD and its parameter extraction method
|
Ma, Xiao
|
|
|
147 |
C |
p.
|
artikel
|
| 25 |
Performance analysis of avionics devices based on electro-thermal-stress multi-physics coupling under immersion cooling
|
Qi, Wenliang
|
|
|
147 |
C |
p.
|
artikel
|
| 26 |
Performance prediction of current-voltage characteristics of Schottky diodes at low temperatures using artificial intelligence
|
Güzel, Tamer
|
|
|
147 |
C |
p.
|
artikel
|
| 27 |
Power losses in PV arrays of field-aged modules
|
Chekal Affari, Belhadj
|
|
|
147 |
C |
p.
|
artikel
|
| 28 |
Reliability estimation of thin film platinum resistance MEMS thermal mass flowmeter by step-stress accelerated life testing
|
Kang, Qiaoqiao
|
|
|
147 |
C |
p.
|
artikel
|
| 29 |
SRP-YOLOX: An improved deep convolutional neural network for automated via detection
|
Yang, Yi
|
|
|
147 |
C |
p.
|
artikel
|
| 30 |
State-of-the-art of the bond wire failure mechanism and power cycling lifetime in power electronics
|
Xie, Luhong
|
|
|
147 |
C |
p.
|
artikel
|
| 31 |
Statistical study of electromigration in gold interconnects
|
Ceric, H.
|
|
|
147 |
C |
p.
|
artikel
|
| 32 |
Temperature-dependent analysis and correction in a neutron fluence real-time measuring circuit
|
Li, Ruibin
|
|
|
147 |
C |
p.
|
artikel
|
| 33 |
Testing and reliability enhancement of security primitives: Methodology and experimental validation
|
Anik, Md Toufiq Hasan
|
|
|
147 |
C |
p.
|
artikel
|
| 34 |
The effects of stress on interfacial properties and flatband voltage instability of 4H-SiC MOS structures
|
Lu, Wenhao
|
|
|
147 |
C |
p.
|
artikel
|
| 35 |
Thermal management in high-frequency, high-power density, solar PV integrated GaN converter system
|
Venkatesan, Chandrasekar
|
|
|
147 |
C |
p.
|
artikel
|
| 36 |
Thermal reliability of Cu sintering joints for high-temperature die attach
|
Son, Junhyuk
|
|
|
147 |
C |
p.
|
artikel
|
| 37 |
Threshold voltage shift model for p-GaN gate enhancement mode HEMT
|
Zhang, Cong
|
|
|
147 |
C |
p.
|
artikel
|
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