| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Activity-aware prediction of Critical Paths Aging in FDSOI technologies
|
Kannan, Kalpana Senthamarai
|
|
|
124 |
C |
p.
|
artikel
|
| 2 |
A method to prevent hardware Trojans limiting access to layout resources
|
Supon, Tareq Muhammad
|
|
|
124 |
C |
p.
|
artikel
|
| 3 |
Analyzing and increasing soft error resilience of Deep Neural Networks on ARM processors
|
Liu, Zhi
|
|
|
124 |
C |
p.
|
artikel
|
| 4 |
An investigation on IGBT junction temperature estimation using online regression method
|
Liu, Li
|
|
|
124 |
C |
p.
|
artikel
|
| 5 |
A novel optimal accelerated degradation test design method considering multiple decision variables
|
Wang, Zhihua
|
|
|
124 |
C |
p.
|
artikel
|
| 6 |
A programmable checker for automated 2.5D/3D IC latch-up verification and hot junctions detection
|
Medhat, Dina
|
|
|
124 |
C |
p.
|
artikel
|
| 7 |
A soft-error-tolerant, 1.25 GHz to 3.125 GHz, 3.18 ps RMS-jitter CPPLL in 40 nm CMOS process
|
Guo, Qiancheng
|
|
|
124 |
C |
p.
|
artikel
|
| 8 |
Configurable gate driver for a stress test bench of newly developed discrete silicon power devices
|
Patmanidis, Konstantinos
|
|
|
124 |
C |
p.
|
artikel
|
| 9 |
Crosstalk aware transient error correction coding technique for NoC links
|
Vinodhini, M.
|
|
|
124 |
C |
p.
|
artikel
|
| 10 |
Editorial Board
|
|
|
|
124 |
C |
p.
|
artikel
|
| 11 |
Effect of electrification and chlorination on the microstructure and electrical properties of fine Al wires
|
Wu, Bo-Ding
|
|
|
124 |
C |
p.
|
artikel
|
| 12 |
Extensive fault emulation on RFID tags for fault tolerance and security evaluation
|
Mezzah, Ibrahim
|
|
|
124 |
C |
p.
|
artikel
|
| 13 |
Improving avalanche robustness of SiC MOSFETs by optimizing three-region P-well doping profile
|
Bai, Zhiqiang
|
|
|
124 |
C |
p.
|
artikel
|
| 14 |
Novel lockstep-based fault mitigation approach for SoCs with roll-back and roll-forward recovery
|
Kasap, Server
|
|
|
124 |
C |
p.
|
artikel
|
| 15 |
Optically induced static power in combinational logic: Vulnerabilities and countermeasures
|
Bělohoubek, Jan
|
|
|
124 |
C |
p.
|
artikel
|
| 16 |
Power cycling failure analysis of double side cooled IGBT modules for automotive applications
|
Ma, Yaqing
|
|
|
124 |
C |
p.
|
artikel
|
| 17 |
Prediction of IGBT junction temperature using improved cuckoo search-based extreme learning machine
|
Liu, Boying
|
|
|
124 |
C |
p.
|
artikel
|
| 18 |
Reliability based design optimization applied to the high electron mobility transistor (HEMT)
|
Amar, Abdelhamid
|
|
|
124 |
C |
p.
|
artikel
|
| 19 |
Special issue on reliability of new technologies for power electronics (Si and wide band gap devices, interconnections, passives, analysis and applications)
|
Cova, Paolo
|
|
|
124 |
C |
p.
|
artikel
|
| 20 |
Study on proton-induced single event effect of SiC diode and MOSFET
|
Zhang, Hong
|
|
|
124 |
C |
p.
|
artikel
|
| 21 |
Support region of μ-law logarithmic quantizers for Laplacian source applied in neural networks
|
Dinčić, Milan R.
|
|
|
124 |
C |
p.
|
artikel
|
| 22 |
Thickness and metallization layer effect on interfacial and vertical cracking of sintered silver layer: A numerical investigation
|
Qin, Fei
|
|
|
124 |
C |
p.
|
artikel
|
| 23 |
Threading dislocations in GaN high-voltage switches
|
Setera, Brett
|
|
|
124 |
C |
p.
|
artikel
|
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