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                             16 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A reliability assessment approach for a Hodgkin-Huxley neuron circuit Sun, Bo

121 C p.
artikel
2 A remaining useful life prediction method of IGBT based on online status data Zhang, Jinli

121 C p.
artikel
3 Automated abstraction of nonlinear analog circuits to reliable set-valued models with reduced overapproximation Rechmal-Lesse, Malgorzata

121 C p.
artikel
4 Crack identification and evaluation in BEoL stacks of two different samples utilizing acoustic emission testing and nano X-ray computed tomography Silomon, Jendrik

121 C p.
artikel
5 Editorial Board
121 C p.
artikel
6 Evaluating the moisture resistance of Y3Al5O12: Ce3+ phosphor used in high power white LED packaging Yuan, Weiyi

121 C p.
artikel
7 Experimental analysis of the electromagnetic instruction skip fault model and consequences for software countermeasures Dutertre, Jean-Max

121 C p.
artikel
8 Finite element analysis of moisture induced thermo-mechanical delamination of semiconductor packages considering in-situ moisture desorption during reflow process Hwang, Yeon-Taek

121 C p.
artikel
9 Monitoring the optical degradation of green light-emitting diodes on the basis of measured electrical characteristics Herzog, Alexander

121 C p.
artikel
10 Passivation-layer thickness and field-plate optimization to obtain high breakdown voltage in AlGaN/GaN HEMTs with short gate-to-drain distance Iwamoto, Takuma

121 C p.
artikel
11 Research on the damage mechanism of the PIN limiter diode SMP1330 under EMP Xu, Ke

121 C p.
artikel
12 Simulation studies on the transient dose rate effect of analog delay locked loops Li, Yang

121 C p.
artikel
13 Theoretical and experimental Raman study for mechanical stress in die-attach process Uchida, Tomoyuki

121 C p.
artikel
14 Thermal performance of heat sink using nano-enhanced phase change material (NePCM) for cooling of electronic components Kumar, Anuj

121 C p.
artikel
15 Top-down, multi-scale numerical simulation of MEMS microphones under guided free fall tests Faraci, David

121 C p.
artikel
16 Total ionizing dose effects on nanosheet and nanowire field effect transistors Han, Jin-Woo

121 C p.
artikel
                             16 gevonden resultaten
 
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