no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
A comprehensive solution for modeling moisture induced delamination in electronic packaging during solder reflow
|
Wang, Jing |
|
|
112 |
C |
p. |
article |
2 |
An ion beam layer removal method of determining the residual stress in the as-fabricated TSV-Cu/TiW/SiO2/Si interface on a nanoscale
|
Chen, S. |
|
|
112 |
C |
p. |
article |
3 |
Editorial Board
|
|
|
|
112 |
C |
p. |
article |
4 |
Effect of TID electronradiation on SiGe BiCMOS LNAs at V-band
|
Sagouo Minko, Flavien |
|
|
112 |
C |
p. |
article |
5 |
Efficiency droop in green InGaN/GaN light emitting diodes: Degradation mechanisms and initial characteristics
|
Herzog, Alexander |
|
|
112 |
C |
p. |
article |
6 |
Electrical characterization of SiC MOS capacitors: A critical review
|
Pande, Peyush |
|
|
112 |
C |
p. |
article |
7 |
Impact of back-end-of-line architecture on chip-package-interaction in advanced interconnects
|
Vanstreels, Kris |
|
|
112 |
C |
p. |
article |
8 |
Mechanical reliability of Cu cored solder ball in flip chip package under thermal shock test
|
Jeong, Haksan |
|
|
112 |
C |
p. |
article |
9 |
MEMS capacitive microphone with various materials in acoustic plate under shock loading
|
Lu, Chun-Lin |
|
|
112 |
C |
p. |
article |
10 |
On-line self-test mechanism for Dual-Core Lockstep System-on-Chips
|
Floridia, Andrea |
|
|
112 |
C |
p. |
article |
11 |
Reliability analysis of multilayer polymer aluminum electrolytic capacitors
|
Romero, Jose |
|
|
112 |
C |
p. |
article |
12 |
Thermal optimized discontinuous modulation strategy for three phase impedance source inverter
|
Liu, Ping |
|
|
112 |
C |
p. |
article |