no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
A high performance pMOSFET with two-step recessed SiGe-S/D structure for 32nm node and beyond
|
Yasutake, Nobuaki |
|
2007 |
51 |
11-12 |
p. 1437-1443 7 p. |
article |
2 |
An EKV-based high voltage MOSFET model with improved mobility and drift model
|
Chauhan, Yogesh Singh |
|
2007 |
51 |
11-12 |
p. 1581-1588 8 p. |
article |
3 |
An industrial view on compact modeling
|
Woltjer, Reinout |
|
2007 |
51 |
11-12 |
p. 1572-1580 9 p. |
article |
4 |
A novel channel-program–erase technique with substrate transient hot carrier injection for SONOS NAND flash application
|
Hsu, Tzu-Hsuan |
|
2007 |
51 |
11-12 |
p. 1523-1528 6 p. |
article |
5 |
A systematic investigation of work function in advanced metal gate–HfO2–SiO2 structures with bevel oxide
|
Kuriyama, Atsushi |
|
2007 |
51 |
11-12 |
p. 1515-1522 8 p. |
article |
6 |
Bandgap engineering in Alq3- and NPB-based organic light-emitting diodes for efficient green, blue and white emission
|
Divayana, Y. |
|
2007 |
51 |
11-12 |
p. 1618-1623 6 p. |
article |
7 |
Carrier backscattering characteristics of strained silicon-on-insulator n-MOSFETs featuring silicon–carbon source/drain regions
|
Ang, Kah-Wee |
|
2007 |
51 |
11-12 |
p. 1444-1449 6 p. |
article |
8 |
CMOS compatible dual metal gate integration with successful V th adjustment on high-k HfTaON by high-temperature metal intermixing
|
Ren, C. |
|
2007 |
51 |
11-12 |
p. 1479-1484 6 p. |
article |
9 |
DRAM retention tail improvement by trap passivation
|
Weber, A. |
|
2007 |
51 |
11-12 |
p. 1534-1539 6 p. |
article |
10 |
Editorial Board
|
|
|
2007 |
51 |
11-12 |
p. IFC- 1 p. |
article |
11 |
Experimental evidence and extraction of the electron mass variation in [110] uniaxially strained MOSFETs
|
Rochette, F. |
|
2007 |
51 |
11-12 |
p. 1458-1465 8 p. |
article |
12 |
Experimental evidence of mobility enhancement in short-channel ultra-thin body double-gate MOSFETs by magnetoresistance technique
|
Chaisantikulwat, W. |
|
2007 |
51 |
11-12 |
p. 1494-1499 6 p. |
article |
13 |
Geometry optimization for carbon nanotube transistors
|
Pourfath, M. |
|
2007 |
51 |
11-12 |
p. 1565-1571 7 p. |
article |
14 |
Germanium FETs and capacitors with rare earth CeO2/HfO2 gates
|
Dimoulas, A. |
|
2007 |
51 |
11-12 |
p. 1508-1514 7 p. |
article |
15 |
High pass filter with above IC integrated SrTiO3 high K MIM capacitors
|
Defaÿ, Emmanuel |
|
2007 |
51 |
11-12 |
p. 1624-1628 5 p. |
article |
16 |
High threshold voltage matching performance on gate-all-around MOSFET
|
Cathignol, Augustin |
|
2007 |
51 |
11-12 |
p. 1450-1457 8 p. |
article |
17 |
Investigation of hafnium-aluminate alloys in view of integration as interpoly dielectrics of future Flash memories
|
Molas, Gabriel |
|
2007 |
51 |
11-12 |
p. 1540-1546 7 p. |
article |
18 |
Length scaling of the Double Gate Tunnel FET with a high-K gate dielectric
|
Boucart, Kathy |
|
2007 |
51 |
11-12 |
p. 1500-1507 8 p. |
article |
19 |
Modeling and system-level simulation of a CMOS convective accelerometer
|
Leman, O. |
|
2007 |
51 |
11-12 |
p. 1609-1617 9 p. |
article |
20 |
Modeling of MOSFET parasitic capacitances, and their impact on circuit performance
|
Mueller, Judith |
|
2007 |
51 |
11-12 |
p. 1485-1493 9 p. |
article |
21 |
Monte-Carlo simulation of decananometric nMOSFETs: Multi-subband vs. 3D-electron gas with quantum corrections
|
Riolino, I. |
|
2007 |
51 |
11-12 |
p. 1558-1564 7 p. |
article |
22 |
New TIT capacitor with ZrO2/Al2O3/ZrO2 dielectrics for 60nm and below DRAMs
|
Cho, Ho Jin |
|
2007 |
51 |
11-12 |
p. 1529-1533 5 p. |
article |
23 |
One and two port piezoelectric higher order contour-mode MEMS resonators for mechanical signal processing
|
Piazza, Gianluca |
|
2007 |
51 |
11-12 |
p. 1596-1608 13 p. |
article |
24 |
Power Trench MOSFETs with very low specific on-resistance for 25V applications
|
Goarin, Pierre |
|
2007 |
51 |
11-12 |
p. 1589-1595 7 p. |
article |
25 |
Quantifying self-heating effects with scaling in globally strained Si MOSFETs
|
Agaiby, Rimoon |
|
2007 |
51 |
11-12 |
p. 1473-1478 6 p. |
article |
26 |
Reduction of gate-to-channel tunneling current in FinFET structures
|
Rudenko, T. |
|
2007 |
51 |
11-12 |
p. 1466-1472 7 p. |
article |
27 |
Research directions in beyond CMOS computing
|
Bourianoff, George I. |
|
2007 |
51 |
11-12 |
p. 1426-1431 6 p. |
article |
28 |
Single-electron random-number generator (RNG) for highly secure ubiquitous computing applications
|
Uchida, Ken |
|
2007 |
51 |
11-12 |
p. 1552-1557 6 p. |
article |
29 |
Solid-state electronics special issue foreword
|
Ionescu, Adrian M. |
|
2007 |
51 |
11-12 |
p. 1425- 1 p. |
article |
30 |
Superior N- and P-MOSFET scalability using carbon co-implantation and spike annealing
|
Augendre, E. |
|
2007 |
51 |
11-12 |
p. 1432-1436 5 p. |
article |
31 |
VDNROM: A novel four-physical-bits/cell vertical channel dual-nitride-trapping-layers ROM for high density flash memory applications
|
Zhou, Falong |
|
2007 |
51 |
11-12 |
p. 1547-1551 5 p. |
article |