|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 18 of 31 found articles
| Title: |
Length scaling of the Double Gate Tunnel FET with a high-K gate dielectric |
| Author: |
Boucart, Kathy Ionescu, Adrian Mihai |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 51 (2007) nr. 11-12 pages 8 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 31 found articles
| << previous | next >> |