nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A non-GCA model for ground-plane MOSFETs
|
Su, Meihua |
|
|
209 |
C |
p. |
artikel |
2 |
A tunable and versatile 28 nm FD-SOI crossbar output circuit for low power analog SNN inference with eNVM synapses
|
Palhares, Joao Henrique Quintino |
|
|
209 |
C |
p. |
artikel |
3 |
C-V measurement and modeling of double-BOX Trap-Rich SOI substrate
|
Huang, Yang |
|
|
209 |
C |
p. |
artikel |
4 |
Deep learning-based I-V Global Parameter Extraction for BSIM-CMG
|
Chavez, Fredo |
|
|
209 |
C |
p. |
artikel |
5 |
Design and verification of a hybrid electrostatic discharge model for Gate-Controlled silicon controlled rectifier
|
Zhang, Ke |
|
|
209 |
C |
p. |
artikel |
6 |
Detailed comparison of threshold voltage extraction methods in FD-SOI MOSFETs
|
Pananakakis, Georges |
|
|
209 |
C |
p. |
artikel |
7 |
Editorial Board
|
|
|
|
209 |
C |
p. |
artikel |
8 |
Efficient circuit simulation of a memristive crossbar array with synaptic weight variability
|
Dersch, Nadine |
|
|
209 |
C |
p. |
artikel |
9 |
Evidence of Transport Degradation in 22 nm FD-SOI Charge Trapping Transistors for Neural Network Applications
|
Al Mamun, Fahad |
|
|
209 |
C |
p. |
artikel |
10 |
Extracting edge conduction around threshold in mesa-isolated SOI MOSFETs
|
Boutayeb, A. |
|
|
209 |
C |
p. |
artikel |
11 |
Impact of CVD chemistry on band alignment at the MoS2/SiO2 interface
|
Tummala, P.P. |
|
|
209 |
C |
p. |
artikel |
12 |
Is there a limit when the access resistance impact on the extraction of key GAA NS FETs devices parameters can (not) be avoided?
|
Tahiat, A. |
|
|
209 |
C |
p. |
artikel |
13 |
Modulation of ballistic injection velocity in phosphorene nanodevices by bias and confinement effects
|
Matić, Mislav |
|
|
209 |
C |
p. |
artikel |
14 |
Novel Y-function based strategy for parameter extraction in S/D asymmetric architecture devices and low frequency noise characterization in GAA Si VNW pMOSFETs
|
Tahiat, A. |
|
|
209 |
C |
p. |
artikel |
15 |
Optimization of HIL-HTL-free naphthalimide: Isoquinoline TEOLEDs with BZO top electrode
|
Fiat Varol, Songül |
|
|
209 |
C |
p. |
artikel |
16 |
Performance and reliability of state-of-the-art commercial UVC light emitting diodes
|
Loveless, James |
|
|
209 |
C |
p. |
artikel |
17 |
Post-deposition annealing challenges for ALD Al0.5Si0.5Ox/n-GaN MOS devices
|
Fernandes Paes Pinto Rocha, P. |
|
|
209 |
C |
p. |
artikel |
18 |
Random Telegraph Noise and Bias Temperature Instabilities statistical characterization of Ω-gate FDSOI devices at low voltages
|
Pedreira, G. |
|
|
209 |
C |
p. |
artikel |
19 |
Resistive switching like-behavior in FD-SOI Ω-gate transistors
|
Valdivieso, C. |
|
|
209 |
C |
p. |
artikel |
20 |
Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS 2 monolayers on sapphire substrates
|
Rybalchenko, Y. |
|
|
209 |
C |
p. |
artikel |
21 |
Simulation process flow for the implementation of industry-standard FD-SOI quantum dot devices
|
Kriekouki, Ioanna |
|
|
209 |
C |
p. |
artikel |
22 |
Small-signal behavioral-level modeling of InP HBT based on SO-BP neural network
|
Dong, Jianping |
|
|
209 |
C |
p. |
artikel |
23 |
Ultrafast self-powered phototransistor based on Te-WSe2 van der Waals heterojunction
|
Wen, Yuanbo |
|
|
209 |
C |
p. |
artikel |
24 |
Ultrathin four-quadrant silicon photodiodes for beam position and monitor applications: Characterization and radiation effects
|
Rafí, J.M. |
|
|
209 |
C |
p. |
artikel |