| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Channelling Enhanced Microanalysis on Niobium Atom Location in an Al-43%Ti-2%Nb Intermetallic Compound
|
SHINDO, Daisuke
|
|
1986
|
35 |
4 |
p. 409-414
|
artikel
|
| 2 |
Analytical Transmission Electron Microscopy of the Allende Meteorite
|
KITAMURA, Masao
|
|
1986
|
35 |
4 |
p. 384-394
|
artikel
|
| 3 |
An EELS Spectrometer with a Double Dispersion Lens for a Medium Voltage TEM
|
OIKAWA, Tetsuo
|
|
1986
|
35 |
4 |
p. 353-358
|
artikel
|
| 4 |
A New Condenser System for Convergent-beam Electron Diffraction
|
TOMITA, Takeshi
|
|
1986
|
35 |
4 |
p. 426-429
|
artikel
|
| 5 |
Conventional Transmission-Electron-Microscopy Techniques in Convergent-Beam Electron Diffraction
|
TANAKA, Michiyoshi
|
|
1986
|
35 |
4 |
p. 314-323
|
artikel
|
| 6 |
Determination of the Absorption-Free kANi Factors for Quantitative Microanalysis of Nickel Base Alloys
|
HORITA, Zenji
|
|
1986
|
35 |
4 |
p. 324-334
|
artikel
|
| 7 |
EELS in the Electron Microscope: A Review of Present Trends
|
COLLIEX, C.
|
|
1986
|
35 |
4 |
p. 307-313
|
artikel
|
| 8 |
Energy Dispersive X-Ray Spectroscopy in Medium Voltage Electron Microscope
|
SUZUKI, Seiichi
|
|
1986
|
35 |
4 |
p. 335-342
|
artikel
|
| 9 |
Grain Boundary Analysis of Silicon Nitrides by 400 kV Analytical Electron Microscopy
|
BANDO, Yoshio
|
|
1986
|
35 |
4 |
p. 371-377
|
artikel
|
| 10 |
High Resolution TEM Study on Electron Beam-Induced Damage in Sodium β′″-Alumina (Na2 4MgO 15Al2O3) and Isostructural Potassium β′″-Ferrite (K2O 4FeO 15Fe2O3
|
MATSUI, Yoshio
|
|
1986
|
35 |
4 |
p. 395-408
|
artikel
|
| 11 |
High Voltage Electron Energy Loss Spectroscopy Evaluated from Signal to Noise Ratio
|
HIBINO, Michio
|
|
1986
|
35 |
4 |
p. 422-425
|
artikel
|
| 12 |
Microstructural and Microchemical Characterization of Intergranular Phase in Yttria-Doped Hot-Pressed Silicon Nitride
|
KURODA, Kotaro
|
|
1986
|
35 |
4 |
p. 378-383
|
artikel
|
| 13 |
Quantitative Electron Energy Loss Spectroscopy Based on Microcomputer
|
ISHIZUKA, Kazuo
|
|
1986
|
35 |
4 |
p. 343-352
|
artikel
|
| 14 |
Silicon Nitride Grain-Boundary Alteration by Capsule-Free Hot Isostatic Pressing (HIP)
|
GOTO, Yasuhiro
|
|
1986
|
35 |
4 |
p. 365-370
|
artikel
|
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