| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Ab initio molecular packing analysis
|
Williams, D. E.
|
|
1996
|
52 |
2 |
p. 326-328
|
artikel
|
| 2 |
A Detailed Observation of the Nonprojectiveness of X-ray Moiré-Fringed Diffraction Images
|
Yoshimura, J.
|
|
1996
|
52 |
2 |
p. 312-325
|
artikel
|
| 3 |
Almost Free Rotation of NH3 Molecules in Crystals: Observation from a Maximum-Entropy Reconstruction of the Proton Density in [Co(NH3)6](PF6)2
|
Schiebel, P.
|
|
1996
|
52 |
2 |
p. 189-197
|
artikel
|
| 4 |
A Method of Electron Diffraction Intensity Correction in Combination with High-Resolution Electron Microscopy
|
Huang, D. X.
|
|
1996
|
52 |
2 |
p. 152-157
|
artikel
|
| 5 |
Approximants and Intermediate Stages during Transformation from a Quasicrystalline to a Crystalline Phase in an Al–Mn–Si Alloy
|
Hansen, V.
|
|
1996
|
52 |
2 |
p. 125-132
|
artikel
|
| 6 |
A Recursive Algorithm for the Generation of Symmetry-Adapted Functions: Principles and Applications to the Icosahedral Group
|
Prandl, W.
|
|
1996
|
52 |
2 |
p. 171-175
|
artikel
|
| 7 |
Bragg-Case X-ray Interference in Multilayered Structures. Comparison Between Kinematical Approximation and Dynamical Treatment
|
Parisini, A.
|
|
1996
|
52 |
2 |
p. 302-311
|
artikel
|
| 8 |
Detection of a Point Defect in a Silicon Single Crystal by a Subtraction Method using High-Resolution Transmission Electron Microscopy
|
Awaji, M.
|
|
1996
|
52 |
2 |
p. 158-170
|
artikel
|
| 9 |
Explicit Orthonormal Fixed Bases for Spaces of Functions that are Totally Symmetric Under the Rotational Symmetries of a Platonic Solid
|
Zheng, Y.
|
|
1996
|
52 |
2 |
p. 221-235
|
artikel
|
| 10 |
Five-Dimensional Symmetry Minimum Function and Maximum-Entropy Method for Ab Initio Solution of Decagonal Structures
|
Haibach, T.
|
|
1996
|
52 |
2 |
p. 277-286
|
artikel
|
| 11 |
Multiplicity of crystal planes belonging to the point group -4m2. Erratum
|
Suh, I.-H.
|
|
1996
|
52 |
2 |
p. 326
|
artikel
|
| 12 |
On Integrating Direct Methods and Isomorphous Replacement Techniques. I. A Distribution Function for Quartet Invariants
|
Giacovazzo, C.
|
|
1996
|
52 |
2 |
p. 133-142
|
artikel
|
| 13 |
On Integrating Direct Methods and Isomorphous Replacement Techniques. II. The Quartet Invariant Estimate
|
Giacovazzo, C.
|
|
1996
|
52 |
2 |
p. 143-151
|
artikel
|
| 14 |
On the Problem of the Description of the Ordered Structures in Binary Solid Solutions with a Hexagonal Crystal Lattice
|
Bugaev, V. N.
|
|
1996
|
52 |
2 |
p. 198-202
|
artikel
|
| 15 |
Orientationa Disorder, the Orientational Density Distribution and the Rotational Potential in C60
|
Schiebel, P.
|
|
1996
|
52 |
2 |
p. 176-188
|
artikel
|
| 16 |
Point Groups and Elastic Properties of Two-Dimensional Quasicrystals
|
Hu, C.
|
|
1996
|
52 |
2 |
p. 251-256
|
artikel
|
| 17 |
Resonant Exchange Scattering: Polarization Dependence and Correlation Function
|
Hill, J. P.
|
|
1996
|
52 |
2 |
p. 236-244
|
artikel
|
| 18 |
Robust Parameterization of Elastic and Absorptive Electron Atomic Scattering Factors
|
Peng, L.-M.
|
|
1996
|
52 |
2 |
p. 257-276
|
artikel
|
| 19 |
The Influence of the Completeness of the Data Set on the Charge Density Obtained with the Maximum-Entropy Method. A Re-examination of the Electron-Density Distribution in Si
|
Takata, M.
|
|
1996
|
52 |
2 |
p. 287-290
|
artikel
|
| 20 |
The Instrumental Broadening Function of the Bartels Five-Crystal X-ray Diffractometer
|
Healey, P. D.
|
|
1996
|
52 |
2 |
p. 245-250
|
artikel
|
| 21 |
The Phase Problem in the Analysis of X-ray Diffraction Data in Terms of Electron-Density Distributions
|
El Haouzi, A.
|
|
1996
|
52 |
2 |
p. 291-301
|
artikel
|
| 22 |
Time Relaxation of the Low-Temperature Modulated Structure of Thiourea
|
Aramburu, I.
|
|
1996
|
52 |
2 |
p. 203-211
|
artikel
|
| 23 |
Variable Coherence Microscopy: a Rich Source of Structural Information from Disordered Materials
|
Treacy, M. M. J.
|
|
1996
|
52 |
2 |
p. 212-220
|
artikel
|
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