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A Method of Electron Diffraction Intensity Correction in Combination with High-Resolution Electron Microscopy |
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Titel: |
A Method of Electron Diffraction Intensity Correction in Combination with High-Resolution Electron Microscopy |
Auteur: |
Huang, D. X. Liu, W. Gu, Y. X. Xiong, J. W. Fan, H. F. Li, F. H. |
Verschenen in: |
Acta crystallographica. Section A, Foundations of crystallography |
Paginering: |
Jaargang 52 (1996) nr. 2 pagina's 152-157 |
Jaar: |
1996-03-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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