| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A general method to determine twinning elements
|
Zhang, Yudong
|
|
2010
|
43 |
6 |
p. 1426-1430
|
artikel
|
| 2 |
Algorithms for the calculation of X-ray diffraction patterns from finite element data
|
Wintersberger, E.
|
|
2010
|
43 |
6 |
p. 1287-1299
|
artikel
|
| 3 |
Analysis of the Beaucage model
|
Hammouda, Boualem
|
|
2010
|
43 |
6 |
p. 1474-1478
|
artikel
|
| 4 |
Asymptotic analysis of small-angle scattering intensities of plane columnar layers
|
Ciccariello, Salvino
|
|
2010
|
43 |
6 |
p. 1377-1384
|
artikel
|
| 5 |
AtomSim: web-deployed atomistic dynamics simulator
|
Keith, J. Brandon
|
|
2010
|
43 |
6 |
p. 1553-1559
|
artikel
|
| 6 |
Characterization of the parameters relating adjacent grains using transmission electron microscopy
|
Jeong, H. W.
|
|
2010
|
43 |
6 |
p. 1495-1501
|
artikel
|
| 7 |
Citations in supplementary material
|
Weiss, Manfred S.
|
|
2010
|
43 |
6 |
p. 1285-1286
|
artikel
|
| 8 |
Combined in situ small- and wide-angle X-ray scattering studies of TiO2 nanoparticle annealing to 1023 K
|
Kehres, Jan
|
|
2010
|
43 |
6 |
p. 1400-1408
|
artikel
|
| 9 |
DART: a robust algorithm for fast reconstruction of three-dimensional grain maps
|
Batenburg, K. J.
|
|
2010
|
43 |
6 |
p. 1464-1473
|
artikel
|
| 10 |
DEBUSSY: a Debye user system for nanocrystalline materials
|
Cervellino, Antonio
|
|
2010
|
43 |
6 |
p. 1543-1547
|
artikel
|
| 11 |
Determination of the β-quartz hexagonal cell parameters from a 00.1 neutron multiple diffraction Umweganregung pattern measured at 1003 K
|
de Campos, Luiz Carlos
|
|
2010
|
43 |
6 |
p. 1488-1494
|
artikel
|
| 12 |
Determination of twinning relationships between diopside dendrites
|
Zhao, Shan-Rong
|
|
2010
|
43 |
6 |
p. 1393-1399
|
artikel
|
| 13 |
Diffraction study of protein crystals grown in cryoloops and micromounts
|
Berger, Michael A.
|
|
2010
|
43 |
6 |
p. 1513-1518
|
artikel
|
| 14 |
DroplIT, an improved image analysis method for droplet identification in high-throughput crystallization trials
|
Vallotton, Pascal
|
|
2010
|
43 |
6 |
p. 1548-1552
|
artikel
|
| 15 |
Estimation of errors in diffraction data measured by CCD area detectors
|
Waterman, David
|
|
2010
|
43 |
6 |
p. 1356-1371
|
artikel
|
| 16 |
Evidence for a non-rhombohedral average structure in the lead-free piezoelectric material Na0.5Bi0.5TiO3
|
Gorfman, S.
|
|
2010
|
43 |
6 |
p. 1409-1414
|
artikel
|
| 17 |
Field-induced phase transition in Bi1/2Na1/2TiO3-based lead-free piezoelectric ceramics
|
Hinterstein, Manuel
|
|
2010
|
43 |
6 |
p. 1314-1321
|
artikel
|
| 18 |
Hawk: the image reconstruction package for coherent X-ray diffractive imaging
|
Maia, Filipe R. N. C.
|
|
2010
|
43 |
6 |
p. 1535-1539
|
artikel
|
| 19 |
High diffraction efficiency at hard X-ray energy in a silicon crystal bent by indentation
|
Barrière, Nicolas
|
|
2010
|
43 |
6 |
p. 1519-1521
|
artikel
|
| 20 |
In-crystal chemical ligation for lead compound generation
|
Yamane, Junji
|
|
2010
|
43 |
6 |
p. 1329-1337
|
artikel
|
| 21 |
Inferential statistics of electron backscatter diffraction data from within individual crystalline grains
|
Bachmann, Florian
|
|
2010
|
43 |
6 |
p. 1338-1355
|
artikel
|
| 22 |
Instrumental developments for anomalous small-angle X-ray scattering from soft matter systems
|
Sztucki, Michael
|
|
2010
|
43 |
6 |
p. 1479-1487
|
artikel
|
| 23 |
Interesting growth features in potassium dihydrogen phosphate: unravelling the origin and dynamics of point defects in single crystals
|
Bhagavannarayana, G.
|
|
2010
|
43 |
6 |
p. 1372-1376
|
artikel
|
| 24 |
Interface study of a high-performance W/B4C X-ray mirror
|
Siffalovic, Peter
|
|
2010
|
43 |
6 |
p. 1431-1439
|
artikel
|
| 25 |
Jpowder: a Java-based program for the display and examination of powder diffraction data
|
Markvardsen, Anders J.
|
|
2010
|
43 |
6 |
p. 1532-1534
|
artikel
|
| 26 |
Nanostructural analysis of GaN tripods and hexapods grown on c-plane sapphire
|
Lee, Sanghwa
|
|
2010
|
43 |
6 |
p. 1300-1304
|
artikel
|
| 27 |
New approaches to scaling data measured on a CCD diffractometer
|
Dudka, Alexander
|
|
2010
|
43 |
6 |
p. 1440-1451
|
artikel
|
| 28 |
Observation of unusual temperature-dependent stripes in LiTaO3 and LiTaxNb1−xO3 crystals with near-zero birefringence
|
Glazer, A. M.
|
|
2010
|
43 |
6 |
p. 1305-1313
|
artikel
|
| 29 |
On uncertainty estimates of crystallographic quantities including cell-parameter uncertainties
|
Schwarzenbach, Dieter
|
|
2010
|
43 |
6 |
p. 1452-1455
|
artikel
|
| 30 |
Potential use of ultrasound to promote protein crystallization
|
Crespo, Rosa
|
|
2010
|
43 |
6 |
p. 1419-1425
|
artikel
|
| 31 |
ResDe: a new tool for visual definition of distance restraints for crystallographic refinement
|
Hintze, Bradley J.
|
|
2010
|
43 |
6 |
p. 1540-1542
|
artikel
|
| 32 |
Scanning small-angle X-ray scattering analysis of the size and organization of the mineral nanoparticles in fluorotic bone using a stack of cards model
|
Gourrier, Aurélien
|
|
2010
|
43 |
6 |
p. 1385-1392
|
artikel
|
| 33 |
Substrate-controlled allotropic phases and growth orientation of TiO2 epitaxial thin films
|
Silva, V. F.
|
|
2010
|
43 |
6 |
p. 1502-1512
|
artikel
|
| 34 |
The XIPHOS diffraction facility for extreme sample conditions
|
Probert, Michael R.
|
|
2010
|
43 |
6 |
p. 1415-1418
|
artikel
|
| 35 |
Through-thickness texture profiling by energy dispersive synchrotron diffraction
|
Coelho, R. S.
|
|
2010
|
43 |
6 |
p. 1322-1328
|
artikel
|
| 36 |
Versatile in situ powder X-ray diffraction cells for solid–gas investigations
|
Jensen, Torben R.
|
|
2010
|
43 |
6 |
p. 1456-1463
|
artikel
|
| 37 |
X+: a comprehensive computationally accelerated structure analysis tool for solution X-ray scattering from supramolecular self-assemblies
|
Ben-Nun, Tal
|
|
2010
|
43 |
6 |
p. 1522-1531
|
artikel
|
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