nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accurate determination and correction of the lattice parameter of LaB6 (standard reference material 660) relative to that of Si (640b)
|
Chantler, C. T. |
|
2007 |
40 |
2 |
p. 232-240 |
artikel |
2 |
A new method for the reproducible generation of polymorphs: two forms of sulindac with very different solubilities
|
Llinàs, Antonio |
|
2007 |
40 |
2 |
p. 379-381 |
artikel |
3 |
Anisotropic microstrain broadening due to field-tensor distributions
|
Leineweber, Andreas |
|
2007 |
40 |
2 |
p. 362-370 |
artikel |
4 |
A parallel program using SHELXD for quick heavy-atom partial structural solution on high-performance computers
|
Fu, Zheng-Qing |
|
2007 |
40 |
2 |
p. 387-390 |
artikel |
5 |
A stochastic algorithm for reconstruction of grain maps of moderately deformed specimens based on X-ray diffraction
|
Rodek, L. |
|
2007 |
40 |
2 |
p. 313-321 |
artikel |
6 |
Crystallization shelf
|
Cabric, B. |
|
2007 |
40 |
2 |
p. 391 |
artikel |
7 |
Determination by high-resolution X-ray diffraction of shape, size and lateral separation of buried empty channels in silicon-on-nothing architectures
|
Servidori, Marco |
|
2007 |
40 |
2 |
p. 338-343 |
artikel |
8 |
Diffraction profiles of elastically bent single crystals with constant strain gradients
|
Yan, Hanfei |
|
2007 |
40 |
2 |
p. 322-331 |
artikel |
9 |
Direct methods and the solution of organic structures from powder data
|
Altomare, Angela |
|
2007 |
40 |
2 |
p. 344-348 |
artikel |
10 |
Enantiomorph identification of crystals belonging to the point groups 321 and 312 by convergent-beam electron diffraction
|
Inui, Haruyuki |
|
2007 |
40 |
2 |
p. 241-249 |
artikel |
11 |
From CIF to virtual morphology using the WinXMorph program
|
Kaminsky, Werner |
|
2007 |
40 |
2 |
p. 382-385 |
artikel |
12 |
High-temperature (1500 K) reciprocal space mapping on a laboratory X-ray diffractometer
|
Guinebretière, R. |
|
2007 |
40 |
2 |
p. 332-337 |
artikel |
13 |
Likelihood of crystallization: experimental and computational approaches
|
|
|
2007 |
40 |
2 |
p. 392-393 |
artikel |
14 |
Microstructural evolution of mullites produced from single-phase gels
|
Kojdecki, Marek Andrzej |
|
2007 |
40 |
2 |
p. 260-276 |
artikel |
15 |
Nondestructive quantitative synchrotron grazing incidence X-ray scattering analysis of cylindrical nanostructures in supported thin films
|
Yoon, Jinhwan |
|
2007 |
40 |
2 |
p. 305-312 |
artikel |
16 |
On the entropy to texture index relationship in quantitative texture analysis
|
Hielscher, R. |
|
2007 |
40 |
2 |
p. 371-375 |
artikel |
17 |
Phasing of resonant anomalous X-ray reflectivity spectra and direct Fourier synthesis of element-specific partial structures at buried interfaces
|
Park, Changyong |
|
2007 |
40 |
2 |
p. 290-301 |
artikel |
18 |
Small-angle energy-dispersive X-ray scattering using a laboratory-based diffractometer with a conventional source
|
Portale, Giuseppe |
|
2007 |
40 |
2 |
p. 218-231 |
artikel |
19 |
Small-angle neutron scattering resolution with refractive optics
|
Hammouda, Boualem |
|
2007 |
40 |
2 |
p. 250-259 |
artikel |
20 |
Small-angle scattering analysis of the spherical half-shell
|
Gille, Wilfried |
|
2007 |
40 |
2 |
p. 302-304 |
artikel |
21 |
Small-angle scattering from three-phase samples: application to coal undergoing an extraction process
|
Ciccariello, Salvino |
|
2007 |
40 |
2 |
p. 282-289 |
artikel |
22 |
Structure and microstructure evolution during martensitic transformation in wrought Fe–26Mn–0.14C austenitic steel: an effect of cooling rate
|
Sahu, P. |
|
2007 |
40 |
2 |
p. 354-361 |
artikel |
23 |
The Fortran90 source of the program PSILAM
|
Rossmanith, Elisabeth |
|
2007 |
40 |
2 |
p. 386 |
artikel |
24 |
The healing process for fractured tibia bones of sheep studied by neutron diffraction
|
Bacon, G. E. |
|
2007 |
40 |
2 |
p. 349-353 |
artikel |
25 |
The revenge of the Patterson methods. II. Substructure applications
|
Burla, Maria Cristina |
|
2007 |
40 |
2 |
p. 211-217 |
artikel |
26 |
Twin structure in the crystallite aggregation pattern
|
Zhao, Shanrong |
|
2007 |
40 |
2 |
p. 277-281 |
artikel |
27 |
X-ray bright-field imaging analyzes crystalline quality and defects of SiC wafers
|
Yi, J. M. |
|
2007 |
40 |
2 |
p. 376-378 |
artikel |