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Nondestructive quantitative synchrotron grazing incidence X-ray scattering analysis of cylindrical nanostructures in supported thin films |
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Titel: |
Nondestructive quantitative synchrotron grazing incidence X-ray scattering analysis of cylindrical nanostructures in supported thin films |
Auteur: |
Yoon, Jinhwan Yang, Seung Yun Lee, Byeongdu Joo, Wonchul Heo, Kyuyoung Kim, Jin Kon Ree, Moonhor |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 40 (2007) nr. 2 pagina's 305-312 |
Jaar: |
2007-04-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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