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                             29 results found
no title author magazine year volume issue page(s) type
1 Accuracy of molecular structures determined from high-resolution powder diffraction. The example of m-fluorobenzoic acid Pattison, Philip
2000
33 1 p. 82-86
article
2 Accurate structure-factor measurements using high-energy synchrotron radiation: a test on cuprite, Cu2O Lippmann, Thomas
2000
33 1 p. 156-167
article
3 A cryocooling technique for protein crystals grown by dialysis from volatile solvents Fernandez, Elias J.
2000
33 1 p. 168-171
article
4 A new format and overall appearance for Journal of Applied Crystallography Kostorz, G.
2000
33 1 p. 1
article
5 A tool for X-ray diffraction analysis of thin layers on substrates: substrate peak removal method Kamminga, J.-D.
2000
33 1 p. 108-111
article
6 Contribution to residual-stress evaluation in high-stress-gradient zones by X-ray diffraction Hennion, V.
2000
33 1 p. 26-34
article
7 Correction of specimen absorption in X-ray diffuse scattering experiments with area-detector systems Scheidegger, Stefan
2000
33 1 p. 35-48
article
8 CRUNCH: a phase refinement program for high-resolution macromolecular structures Langs, David A.
2000
33 1 p. 174-175
article
9 Crystallographic Instrumentation. By L. A. Aslanov, G. V. Fetisov and J. A. K. Howard. IUCr Monographs on Crystallography, 7. Oxford: Oxford University Press/International Union of Crystallography, 1998. Pp. xv + 309. Price £65.00. ISBN 0 19 855927 5. Pinkerton, Alan
2000
33 1 p. 190
article
10 Crystal structure refinement of α-Si3N4 using synchrotron radiation powder diffraction data: unbiased refinement strategy Toraya, H.
2000
33 1 p. 95-102
article
11 Diffraction-line shift caused by residual stress in polycrystal for all Laue groups in classical approximations Popa, N. C.
2000
33 1 p. 103-107
article
12 Double monochromator with three pairs of crystals for a SANS machine: Monte Carlo simulation studies Aswal, V. K.
2000
33 1 p. 118-125
article
13 Instrumental line shapes in neutron powder diffraction with focusing monochromators Stoica, A. D.
2000
33 1 p. 137-146
article
14 Integration procedure for the quantitative analysis of dispersive anomalous diffraction Bos, S.
2000
33 1 p. 52-63
article
15 MarqX: a new program for whole-powder-pattern fitting Dong, Y. H.
2000
33 1 p. 184-189
article
16 Nanopowder diffraction analysis beyond the Bragg law applied to palladium Kaszkur, Zbigniew
2000
33 1 p. 87-94
article
17 New Cryostream Cooler 2000
33 1 p. 190
article
18 New developments of computer-aided crystallographic analysis in transmission electron microscopy Zaefferer, Stefan
2000
33 1 p. 10-25
article
19 Notes for Authors 2000
33 1 p. 191-196
article
20 On the instrumental resolution in X-ray reflectivity experiments Sentenac, D.
2000
33 1 p. 130-136
article
21 Origin of the optical activity of silver thiogallate Etxebarria, J.
2000
33 1 p. 126-129
article
22 Position-sensitive analysis in curved-crystal three-axis neutron spectrometry (quasielastic scattering case) Stoica, A. D.
2000
33 1 p. 147-155
article
23 Preparation of silver behenate coatings to provide low- to mid-angle diffraction calibration Blanton, T. N.
2000
33 1 p. 172-173
article
24 Sample geometry effects on incoherent small-angle scattering of light water May, R. P.
2000
33 1 p. 112-117
article
25 Study of the influence of oxygen on structural perfection of silicon single crystals by high-resolution X-ray diffraction and infrared absorption measurements Lal, Krishan
2000
33 1 p. 2-9
article
26 Study of thermal behaviour of 30Li2O·70TeO2 glass by X-ray dynamic observation Taniguchi, Taketoshi
2000
33 1 p. 64-70
article
27 Three-beam interference measurements with a six-circle κ diffractometer Mo, F.
2000
33 1 p. 49-51
article
28 TOP: a new method for protein structure comparisons and similarity searches Lu, Guoguang
2000
33 1 p. 176-183
article
29 X-ray diffraction study of polycrystalline p-chloronitrobenzene Meriles, C. A.
2000
33 1 p. 71-81
article
                             29 results found
 
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