| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A Hewlett-Packard ScanJet scanner with transparencies adaptor as X-ray fibre diffraction photograph densitometer
|
Iannelli, P.
|
|
1996
|
29 |
4 |
p. 491-492
|
artikel
|
| 2 |
A New Measurement of Crystal Shapes for Absorption Corrections
|
Izumi, T.
|
|
1996
|
29 |
4 |
p. 435-437
|
artikel
|
| 3 |
An Improved Regularization Technique for Analysis of Anomalous X-ray Scattering Data; Platinum Uridine Blue Sulfate as an Example
|
Serimaa, R.
|
|
1996
|
29 |
4 |
p. 390-402
|
artikel
|
| 4 |
Anisotropic Elasticity Corrections for Reflection Efficiency and X-ray Standing-Wave Patterns using Bent Crystals
|
Chukhovskii, F. N.
|
|
1996
|
29 |
4 |
p. 438-445
|
artikel
|
| 5 |
An Optimization Regularization Method for Determination of Partial Structure Factors from Small-Angle Scattering Experiments
|
Kline, S. R.
|
|
1996
|
29 |
4 |
p. 427-434
|
artikel
|
| 6 |
A simple technique for preparing low-melting-point samples for neutron powder diffraction
|
Ibberson, R. M.
|
|
1996
|
29 |
4 |
p. 498-500
|
artikel
|
| 7 |
Atomic thermal parameters of TiN by powder elastic neutron diffraction
|
Bashir, J.
|
|
1996
|
29 |
4 |
p. 471-473
|
artikel
|
| 8 |
Bertram Eugene Warren, 1902–1991
|
Muldawer, L.
|
|
1996
|
29 |
4 |
p. 309-310
|
artikel
|
| 9 |
BUNYIP: in search of errant symmetry
|
Hester, J. R.
|
|
1996
|
29 |
4 |
p. 474-478
|
artikel
|
| 10 |
Collecting and Processing Neutron Fibre Diffraction Data from a Single-Crystal Diffractometer
|
Langan, P.
|
|
1996
|
29 |
4 |
p. 383-389
|
artikel
|
| 11 |
Construction of a double-radius Guinier diffractometer using Mo Kα1 radiation and a one- or two-dimensional detection system
|
Otto, H. H.
|
|
1996
|
29 |
4 |
p. 495-497
|
artikel
|
| 12 |
Contrast of Ferroelastic and Ferroelectric Domains in White-Beam X-ray Topographs
|
Huang, X. R.
|
|
1996
|
29 |
4 |
p. 371-377
|
artikel
|
| 13 |
Crystallographers
|
|
|
1996
|
29 |
4 |
p. 509-510
|
artikel
|
| 14 |
Derivation of conventional crystallographic descriptions of new phases from results of ab initio inorganic structure modelling
|
Le Page, Y.
|
|
1996
|
29 |
4 |
p. 503-508
|
artikel
|
| 15 |
Development of a High-Flux- and High-Temperature-Set-Up Bonse–Hart Ultra-Small-Angle X-ray Scattering (USAXS) Diffractometer
|
Koga, T.
|
|
1996
|
29 |
4 |
p. 318-324
|
artikel
|
| 16 |
Diffuse X-ray Scattering and Monte-Carlo Study of Guest–Host Interactions in Urea Inclusion Compounds
|
Welberry, T. R.
|
|
1996
|
29 |
4 |
p. 353-364
|
artikel
|
| 17 |
Early Finding of Preferred Orientation: Applications to Direct Methods
|
Altomare, A.
|
|
1996
|
29 |
4 |
p. 341-345
|
artikel
|
| 18 |
Electron Diffraction Patterns of Fibrous and Lamellar Textured Polycrystalline Thin Films. II. Applications
|
Tang, L.
|
|
1996
|
29 |
4 |
p. 419-426
|
artikel
|
| 19 |
Electron Diffraction Patterns of Fibrous and Lamellar Textured Polycrystalline Thin Films. I. Theory
|
Tang, L.
|
|
1996
|
29 |
4 |
p. 411-418
|
artikel
|
| 20 |
FAST: a compact general crystallographic fast Fourier transform (FFT)
|
Langs, D. A.
|
|
1996
|
29 |
4 |
p. 481-483
|
artikel
|
| 21 |
High-Temperature Furnace for an Imaging-Plate Data-Acquisition System
|
Schreuer, J.
|
|
1996
|
29 |
4 |
p. 365-370
|
artikel
|
| 22 |
Ice-free cryo-cooling of protein crystals
|
Carr, P. D.
|
|
1996
|
29 |
4 |
p. 469-470
|
artikel
|
| 23 |
Interpreting oscillatory Bragg peak positions
|
Dragoi, D.
|
|
1996
|
29 |
4 |
p. 493-494
|
artikel
|
| 24 |
LAUEX: a user-friendly program for the simulation and indexation of Laue diagrams on UNIX systems
|
Soyer, A.
|
|
1996
|
29 |
4 |
p. 509
|
artikel
|
| 25 |
Low-cost conversion of a coaxial nozzle arrangement into a stationary low-temperature attachment
|
Kottke, T.
|
|
1996
|
29 |
4 |
p. 465-468
|
artikel
|
| 26 |
New Commercial Products
|
|
|
1996
|
29 |
4 |
p. 510
|
artikel
|
| 27 |
PDBtool: An interactive browser and geometry checker for protein structures
|
Biggs, J.
|
|
1996
|
29 |
4 |
p. 484-490
|
artikel
|
| 28 |
Protein-Crystal Density by Volume Measurement and Amino-Acid Analysis
|
Kiefersauer, R.
|
|
1996
|
29 |
4 |
p. 311-317
|
artikel
|
| 29 |
Quantitative Phase Analysis by X-ray Diffraction of Multiphased Binary Alloy Coatings: Application to Brass Coating
|
Bolle, B.
|
|
1996
|
29 |
4 |
p. 457-464
|
artikel
|
| 30 |
Simulation of Synchrotron White-Beam Topographs. An Algorithm for Parallel Processing: Application to the Study of Piezoelectric Devices
|
Epelboin, Y.
|
|
1996
|
29 |
4 |
p. 331-340
|
artikel
|
| 31 |
Surfaces of Cd(S, Se) Nanoparticles by Small-Angle X-ray Scattering
|
Ramos, A.
|
|
1996
|
29 |
4 |
p. 346-352
|
artikel
|
| 32 |
The Effects of Noise on the Missing-Data-Residue Technique
|
Doherty, G. K.
|
|
1996
|
29 |
4 |
p. 403-410
|
artikel
|
| 33 |
The new loading device for texture measurement on the neutron diffractometer TEX-2
|
Brokmeier, H.-G.
|
|
1996
|
29 |
4 |
p. 501-502
|
artikel
|
| 34 |
VALENCE: a program for calculating bond valences
|
Brown, I. D.
|
|
1996
|
29 |
4 |
p. 479-480
|
artikel
|
| 35 |
X-ray Multiple Diffraction in Renninger Scanning Mode: Simulation of Data Recorded using Synchrotron Radiation
|
Sasaki, J. M.
|
|
1996
|
29 |
4 |
p. 325-330
|
artikel
|
| 36 |
X-ray Multiple Diffraction Phenomenon in the Evaluation of Semiconductor Crystalline Perfection
|
Morelhão, S. L.
|
|
1996
|
29 |
4 |
p. 446-456
|
artikel
|
| 37 |
X-ray Polytype Examination of SiC Bulk Crystals in Back-Reflection Geometry
|
Dressler, L.
|
|
1996
|
29 |
4 |
p. 378-382
|
artikel
|
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