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Journal description
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Details for article 36 of 37 found articles
| Title: |
X-ray Multiple Diffraction Phenomenon in the Evaluation of Semiconductor Crystalline Perfection |
| Author: |
Morelhão, S. L. Cardoso, L. P. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 29 (1996) nr. 4 pages 446-456 |
| Year: |
1996-08-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 36 of 37 found articles
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