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                             24 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Accurate determination of strain tensors from small shifts of reflections measured on a four-circle diffractometer Graafsma, H.
1992
25 3 p. 372-376
artikel
2 A high-speed data-collection system for large-unit-cell crystals using an imaging plate as a detector Sato, M.
1992
25 3 p. 348-357
artikel
3 A Laue diffractometer with δ geometry Lange, J.
1992
25 3 p. 440-443
artikel
4 Angular measurements with X-ray interferometry Windisch, D.
1992
25 3 p. 377-383
artikel
5 An X-ray spectrometer with an energy resolution of 54 meV Hofmann, W.
1992
25 3 p. 340-347
artikel
6 Bent-crystal monochromator for 150 keV synchrotron radiation Suortti, P.
1992
25 3 p. 432-438
artikel
7 Calculation of diffuse scattering from simulated disordered crystals: a comparison with optical transforms Butler, B. D.
1992
25 3 p. 391-399
artikel
8 Caractérisation de la texture de recristallisation primaire et de la spécialité des joints de grains de tôles de Fe-3%Si par diffraction des electrons rétrodiffusés Baudin, T.
1992
25 3 p. 400-408
artikel
9 Crystallographers 1992
25 3 p. 463
artikel
10 DIFRAC, single-crystal diffractometer output-conversion software Flack, H. D.
1992
25 3 p. 455-459
artikel
11 FOURDEM: a program written as an aid to teaching the elements of Fourier synthesis and other crystallographic concepts Welberry, T. R.
1992
25 3 p. 443-447
artikel
12 High-resolution transmission electron microscopy edited by P. Buseck, J. Cowley and L. Eyring Bourret, A.
1992
25 3 p. 463-464
artikel
13 Influence of first-order approximations in the incidence parameter on the simulation of symmetric and asymmetric X-ray rocking curves of heteroepitactic structures. Erratum Servidori, M.
1992
25 3 p. 439
artikel
14 Line shifts in crystal powder diffractometers Popovici, M.
1992
25 3 p. 331-335
artikel
15 LSI - a computer program for simultaneous refinement of material structure and microstructure Lutterotti, L.
1992
25 3 p. 459-462
artikel
16 MRIA - a program for a full profile analysis of powder multiphase neutron-diffraction time-of-flight (direct and Fourier) spectra Zlokazov, V. B.
1992
25 3 p. 447-451
artikel
17 On the apparent response of photographic emulsions according to least-squares determinations of the `blackness correction' from gas electron diffraction data Gundersen, S.
1992
25 3 p. 409-413
artikel
18 Precise X-ray relative measurement of lattice parameters of silicon wafers by multiple-crystal Bragg-case diffractometry. Computer simulation of the experiment Cembali, F.
1992
25 3 p. 424-431
artikel
19 Quantitive analysis of Laue diffraction patterns recorded with a 120 ps exposure from an X-ray undulator Szebenyi, D. M. E.
1992
25 3 p. 414-423
artikel
20 Simulation of Renninger scans for heteroepitaxic layers Salles da Costa, C. A. B.
1992
25 3 p. 366-371
artikel
21 Software and methods for precise X-ray analysis Chernyshev, V. V.
1992
25 3 p. 451-454
artikel
22 The application of cluster analysis in X-ray diffraction phase analysis Liao, B.
1992
25 3 p. 336-339
artikel
23 The control of geometrical sources of error in X-ray diffraction applied to stress analysis Convert, F.
1992
25 3 p. 384-390
artikel
24 The effect of absorption on the integrated reflectivity of defective single crystals Moran, P. D.
1992
25 3 p. 358-365
artikel
                             24 gevonden resultaten
 
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