nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Accurate determination of strain tensors from small shifts of reflections measured on a four-circle diffractometer
|
Graafsma, H. |
|
1992 |
25 |
3 |
p. 372-376 |
artikel |
2 |
A high-speed data-collection system for large-unit-cell crystals using an imaging plate as a detector
|
Sato, M. |
|
1992 |
25 |
3 |
p. 348-357 |
artikel |
3 |
A Laue diffractometer with δ geometry
|
Lange, J. |
|
1992 |
25 |
3 |
p. 440-443 |
artikel |
4 |
Angular measurements with X-ray interferometry
|
Windisch, D. |
|
1992 |
25 |
3 |
p. 377-383 |
artikel |
5 |
An X-ray spectrometer with an energy resolution of 54 meV
|
Hofmann, W. |
|
1992 |
25 |
3 |
p. 340-347 |
artikel |
6 |
Bent-crystal monochromator for 150 keV synchrotron radiation
|
Suortti, P. |
|
1992 |
25 |
3 |
p. 432-438 |
artikel |
7 |
Calculation of diffuse scattering from simulated disordered crystals: a comparison with optical transforms
|
Butler, B. D. |
|
1992 |
25 |
3 |
p. 391-399 |
artikel |
8 |
Caractérisation de la texture de recristallisation primaire et de la spécialité des joints de grains de tôles de Fe-3%Si par diffraction des electrons rétrodiffusés
|
Baudin, T. |
|
1992 |
25 |
3 |
p. 400-408 |
artikel |
9 |
Crystallographers
|
|
|
1992 |
25 |
3 |
p. 463 |
artikel |
10 |
DIFRAC, single-crystal diffractometer output-conversion software
|
Flack, H. D. |
|
1992 |
25 |
3 |
p. 455-459 |
artikel |
11 |
FOURDEM: a program written as an aid to teaching the elements of Fourier synthesis and other crystallographic concepts
|
Welberry, T. R. |
|
1992 |
25 |
3 |
p. 443-447 |
artikel |
12 |
High-resolution transmission electron microscopy edited by P. Buseck, J. Cowley and L. Eyring
|
Bourret, A. |
|
1992 |
25 |
3 |
p. 463-464 |
artikel |
13 |
Influence of first-order approximations in the incidence parameter on the simulation of symmetric and asymmetric X-ray rocking curves of heteroepitactic structures. Erratum
|
Servidori, M. |
|
1992 |
25 |
3 |
p. 439 |
artikel |
14 |
Line shifts in crystal powder diffractometers
|
Popovici, M. |
|
1992 |
25 |
3 |
p. 331-335 |
artikel |
15 |
LSI - a computer program for simultaneous refinement of material structure and microstructure
|
Lutterotti, L. |
|
1992 |
25 |
3 |
p. 459-462 |
artikel |
16 |
MRIA - a program for a full profile analysis of powder multiphase neutron-diffraction time-of-flight (direct and Fourier) spectra
|
Zlokazov, V. B. |
|
1992 |
25 |
3 |
p. 447-451 |
artikel |
17 |
On the apparent response of photographic emulsions according to least-squares determinations of the `blackness correction' from gas electron diffraction data
|
Gundersen, S. |
|
1992 |
25 |
3 |
p. 409-413 |
artikel |
18 |
Precise X-ray relative measurement of lattice parameters of silicon wafers by multiple-crystal Bragg-case diffractometry. Computer simulation of the experiment
|
Cembali, F. |
|
1992 |
25 |
3 |
p. 424-431 |
artikel |
19 |
Quantitive analysis of Laue diffraction patterns recorded with a 120 ps exposure from an X-ray undulator
|
Szebenyi, D. M. E. |
|
1992 |
25 |
3 |
p. 414-423 |
artikel |
20 |
Simulation of Renninger scans for heteroepitaxic layers
|
Salles da Costa, C. A. B. |
|
1992 |
25 |
3 |
p. 366-371 |
artikel |
21 |
Software and methods for precise X-ray analysis
|
Chernyshev, V. V. |
|
1992 |
25 |
3 |
p. 451-454 |
artikel |
22 |
The application of cluster analysis in X-ray diffraction phase analysis
|
Liao, B. |
|
1992 |
25 |
3 |
p. 336-339 |
artikel |
23 |
The control of geometrical sources of error in X-ray diffraction applied to stress analysis
|
Convert, F. |
|
1992 |
25 |
3 |
p. 384-390 |
artikel |
24 |
The effect of absorption on the integrated reflectivity of defective single crystals
|
Moran, P. D. |
|
1992 |
25 |
3 |
p. 358-365 |
artikel |