| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Accurate determination of strain tensors from small shifts of reflections measured on a four-circle diffractometer
|
Graafsma, H.
|
|
1992
|
25 |
3 |
p. 372-376
|
article
|
| 2 |
A high-speed data-collection system for large-unit-cell crystals using an imaging plate as a detector
|
Sato, M.
|
|
1992
|
25 |
3 |
p. 348-357
|
article
|
| 3 |
A Laue diffractometer with δ geometry
|
Lange, J.
|
|
1992
|
25 |
3 |
p. 440-443
|
article
|
| 4 |
Angular measurements with X-ray interferometry
|
Windisch, D.
|
|
1992
|
25 |
3 |
p. 377-383
|
article
|
| 5 |
An X-ray spectrometer with an energy resolution of 54 meV
|
Hofmann, W.
|
|
1992
|
25 |
3 |
p. 340-347
|
article
|
| 6 |
Bent-crystal monochromator for 150 keV synchrotron radiation
|
Suortti, P.
|
|
1992
|
25 |
3 |
p. 432-438
|
article
|
| 7 |
Calculation of diffuse scattering from simulated disordered crystals: a comparison with optical transforms
|
Butler, B. D.
|
|
1992
|
25 |
3 |
p. 391-399
|
article
|
| 8 |
Caractérisation de la texture de recristallisation primaire et de la spécialité des joints de grains de tôles de Fe-3%Si par diffraction des electrons rétrodiffusés
|
Baudin, T.
|
|
1992
|
25 |
3 |
p. 400-408
|
article
|
| 9 |
Crystallographers
|
|
|
1992
|
25 |
3 |
p. 463
|
article
|
| 10 |
DIFRAC, single-crystal diffractometer output-conversion software
|
Flack, H. D.
|
|
1992
|
25 |
3 |
p. 455-459
|
article
|
| 11 |
FOURDEM: a program written as an aid to teaching the elements of Fourier synthesis and other crystallographic concepts
|
Welberry, T. R.
|
|
1992
|
25 |
3 |
p. 443-447
|
article
|
| 12 |
High-resolution transmission electron microscopy edited by P. Buseck, J. Cowley and L. Eyring
|
Bourret, A.
|
|
1992
|
25 |
3 |
p. 463-464
|
article
|
| 13 |
Influence of first-order approximations in the incidence parameter on the simulation of symmetric and asymmetric X-ray rocking curves of heteroepitactic structures. Erratum
|
Servidori, M.
|
|
1992
|
25 |
3 |
p. 439
|
article
|
| 14 |
Line shifts in crystal powder diffractometers
|
Popovici, M.
|
|
1992
|
25 |
3 |
p. 331-335
|
article
|
| 15 |
LSI - a computer program for simultaneous refinement of material structure and microstructure
|
Lutterotti, L.
|
|
1992
|
25 |
3 |
p. 459-462
|
article
|
| 16 |
MRIA - a program for a full profile analysis of powder multiphase neutron-diffraction time-of-flight (direct and Fourier) spectra
|
Zlokazov, V. B.
|
|
1992
|
25 |
3 |
p. 447-451
|
article
|
| 17 |
On the apparent response of photographic emulsions according to least-squares determinations of the `blackness correction' from gas electron diffraction data
|
Gundersen, S.
|
|
1992
|
25 |
3 |
p. 409-413
|
article
|
| 18 |
Precise X-ray relative measurement of lattice parameters of silicon wafers by multiple-crystal Bragg-case diffractometry. Computer simulation of the experiment
|
Cembali, F.
|
|
1992
|
25 |
3 |
p. 424-431
|
article
|
| 19 |
Quantitive analysis of Laue diffraction patterns recorded with a 120 ps exposure from an X-ray undulator
|
Szebenyi, D. M. E.
|
|
1992
|
25 |
3 |
p. 414-423
|
article
|
| 20 |
Simulation of Renninger scans for heteroepitaxic layers
|
Salles da Costa, C. A. B.
|
|
1992
|
25 |
3 |
p. 366-371
|
article
|
| 21 |
Software and methods for precise X-ray analysis
|
Chernyshev, V. V.
|
|
1992
|
25 |
3 |
p. 451-454
|
article
|
| 22 |
The application of cluster analysis in X-ray diffraction phase analysis
|
Liao, B.
|
|
1992
|
25 |
3 |
p. 336-339
|
article
|
| 23 |
The control of geometrical sources of error in X-ray diffraction applied to stress analysis
|
Convert, F.
|
|
1992
|
25 |
3 |
p. 384-390
|
article
|
| 24 |
The effect of absorption on the integrated reflectivity of defective single crystals
|
Moran, P. D.
|
|
1992
|
25 |
3 |
p. 358-365
|
article
|
Journal description