| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A combined ultrahigh vacuum scanning tunneling-scanning electron microscope system
|
Hodel, U.
|
|
1997
|
358 |
1-2 |
p. 77-79
|
artikel
|
| 2 |
Adsorption of triallylamine on Si(111) and its coadsorption with triethylgallium – A combined HREELS and XPS study
|
Freundt, D.
|
|
1997
|
358 |
1-2 |
p. 182-186
|
artikel
|
| 3 |
AES and LEED investigation of Al segregation and oxidation of the (100) face of Fe85Al15 single crystals
|
Eltester, B.
|
|
1997
|
358 |
1-2 |
p. 196-199
|
artikel
|
| 4 |
AES depth profiles of thin SiC-layers – simulation of ion beam induced mixing
|
Ecke, G.
|
|
1997
|
358 |
1-2 |
p. 355-357
|
artikel
|
| 5 |
AES Depth profiling of semiconducting multilayer structures using an ion beam bevelling technique
|
Procop, M.
|
|
1997
|
358 |
1-2 |
p. 358-360
|
artikel
|
| 6 |
AFM and STM investigations of hydrogenated amorphous silicon: topography and barrier heights
|
Herion, J.
|
|
1997
|
358 |
1-2 |
p. 338-340
|
artikel
|
| 7 |
A new high luminosity UHV orange type magnetic spectrometer used for depth selective Mössbauer spectroscopy
|
Stahl, B.
|
|
1997
|
358 |
1-2 |
p. 153-155
|
artikel
|
| 8 |
Application of RF GDMS for trace element analysis of nonconducting La0.65Sr0.3MnO3 ceramic layers
|
Jäger, R.
|
|
1997
|
358 |
1-2 |
p. 214-217
|
artikel
|
| 9 |
Atomic resolution of defects in graphite studied by STM
|
Atamny, F.
|
|
1997
|
358 |
1-2 |
p. 344-348
|
artikel
|
| 10 |
CEMS studies of thermally treated Fe/TiN coatings on Si(1,0,0)
|
Hanžel, Darko
|
|
1997
|
358 |
1-2 |
p. 296-299
|
artikel
|
| 11 |
Characterisation of adsorbed layers on sulphide minerals by photoelectron spectroscopy
|
Schaufuß, A.
|
|
1997
|
358 |
1-2 |
p. 262-265
|
artikel
|
| 12 |
Characterisation of intermediate layers in hot-dip zinc coated steels
|
Karduck, P.
|
|
1997
|
358 |
1-2 |
p. 135-140
|
artikel
|
| 13 |
Characterisation of pure or coated metal surfaces with streaming potential measurements
|
Bellmann, C.
|
|
1997
|
358 |
1-2 |
p. 255-258
|
artikel
|
| 14 |
Characterization of chemically modified silica by infrared and solid state nuclear magnetic resonance spectroscopy
|
Heger, K.
|
|
1997
|
358 |
1-2 |
p. 240-241
|
artikel
|
| 15 |
Characterization of crystal faces of polycrystalline HFCVD diamond films by STM/STS
|
Schirach, R.-J.
|
|
1997
|
358 |
1-2 |
p. 335-338
|
artikel
|
| 16 |
Characterization of interfaces of alumina – high alloyed steels by SST and AES depth profiling
|
van den Berg, A. H. J.
|
|
1997
|
358 |
1-2 |
p. 318-322
|
artikel
|
| 17 |
Characterization of Laser-Arc deposited multilayer systems by means of AES, Factor Analysis and XPS
|
John, A.
|
|
1997
|
358 |
1-2 |
p. 304-307
|
artikel
|
| 18 |
Characterization of rhenium-silicon thin films
|
Thomas, J.
|
|
1997
|
358 |
1-2 |
p. 325-328
|
artikel
|
| 19 |
Characterization of SiO2 protective coatings on polycarbonate
|
Jakobs, S.
|
|
1997
|
358 |
1-2 |
p. 242-244
|
artikel
|
| 20 |
Characterization of the interdiffusion in Au-Al layers by RBS
|
Markwitz, A.
|
|
1997
|
358 |
1-2 |
p. 59-63
|
artikel
|
| 21 |
Characterization of the stoichiometry of coevaporated FeSix films by AES, EDX, RBS, and electron microscopy
|
Schöpke, A.
|
|
1997
|
358 |
1-2 |
p. 322-325
|
artikel
|
| 22 |
Characterization of thin-film surfaces by fractal geometry
|
Zahn, W.
|
|
1997
|
358 |
1-2 |
p. 119-121
|
artikel
|
| 23 |
Characterization of vapor phase deposited organic molecules on silicon surfaces
|
Dieckhoff, S.
|
|
1997
|
358 |
1-2 |
p. 258-262
|
artikel
|
| 24 |
Chemical analysis of the interface between Al thin films and polymer surfaces pretreated with KrF-excimer laser radiation
|
Wesner, D. A.
|
|
1997
|
358 |
1-2 |
p. 248-250
|
artikel
|
| 25 |
Chemical stability of (NH4)2S-passivated InP(001) surfaces – investigations by XPS and XPD
|
Peisert, H.
|
|
1997
|
358 |
1-2 |
p. 201-203
|
artikel
|
| 26 |
Clean and ordered surfaces of CeNi2Ge2 layers on W(110)
|
Schmied, B.
|
|
1997
|
358 |
1-2 |
p. 141-143
|
artikel
|
| 27 |
Combined use of lattice source interferences and divergent beam X-ray interferences to investigate the microstructure of ion-bombarded Cu-Sn-diffusion zones
|
Däbritz, S.
|
|
1997
|
358 |
1-2 |
p. 148-153
|
artikel
|
| 28 |
Comparative studies of SIMS and SNMS analyses during the build up of sputter equilibrium under oxygen and rare gas ion bombardment
|
Breuer, U.
|
|
1997
|
358 |
1-2 |
p. 47-50
|
artikel
|
| 29 |
Correction of STM tip convolution effects in particle size and distance determination of metal-C:H films
|
Schiffmann, K. I.
|
|
1997
|
358 |
1-2 |
p. 341-344
|
artikel
|
| 30 |
Corrosion behaviour of coated materials
|
Pajonk, G.
|
|
1997
|
358 |
1-2 |
p. 285-290
|
artikel
|
| 31 |
Cosegregation-induced formation of surface compounds on (110) and (111) oriented surfaces of bcc alloys with 3d and 4d metals
|
Viljoen, E. C.
|
|
1997
|
358 |
1-2 |
p. 193-195
|
artikel
|
| 32 |
C 1s and Au 4f7/2 referenced XPS binding energy data obtained with different aluminium oxides, -hydroxides and -fluorides
|
Böse, O.
|
|
1997
|
358 |
1-2 |
p. 175-179
|
artikel
|
| 33 |
3D analysis of solids using sputtered MCs+ ions
|
Gnaser, Hubert
|
|
1997
|
358 |
1-2 |
p. 171-175
|
artikel
|
| 34 |
3D-Atom-probe study of oxygen-adsorption on stepped platinum surfaces
|
Tieber, W.
|
|
1997
|
358 |
1-2 |
p. 116-118
|
artikel
|
| 35 |
Decomposition of methane on polycrystalline thick films of Ga2O3 investigated by thermal desorption spectroscopy with a mass spectrometer
|
Becker, F.
|
|
1997
|
358 |
1-2 |
p. 187-189
|
artikel
|
| 36 |
Density and Young’s modulus of thin TiO2 films
|
Anderson, O.
|
|
1997
|
358 |
1-2 |
p. 315-318
|
artikel
|
| 37 |
Density and Young’s modulus of thin TiO2 films
|
Anderson, O.
|
|
1997
|
358 |
1-2 |
p. 290-293
|
artikel
|
| 38 |
Depth profile analysis of thin film solar cells using SNMS and SIMS
|
Gastel, M.
|
|
1997
|
358 |
1-2 |
p. 207-210
|
artikel
|
| 39 |
Depth profiling analysis of thick Ni- and Co-doped oxide layers on Cr-based alloys of the interconnector of a solid oxide fuel cell using rf GDMS
|
Saprykin, A. I.
|
|
1997
|
358 |
1-2 |
p. 145-147
|
artikel
|
| 40 |
Development and applications of a new IR-radiation heating in thermal desorption mass spectrometry TDMS
|
Paulus, H.
|
|
1997
|
358 |
1-2 |
p. 51-53
|
artikel
|
| 41 |
Different techniques for determining the coating weight of phosphate layers on galvanized steel by means of FT-IR-spectrometry
|
Molt, K.
|
|
1997
|
358 |
1-2 |
p. 36-41
|
artikel
|
| 42 |
Electrical and optical properties of melting Au/Si eutectics on Si(111)
|
Brüggemann, M.
|
|
1997
|
358 |
1-2 |
p. 179-181
|
artikel
|
| 43 |
Electron energy loss spectroscopy and its application in material science
|
Rizzi, Angela
|
|
1997
|
358 |
1-2 |
p. 15-24
|
artikel
|
| 44 |
Electron microscopic characterization of SrTiO3 films obtained by anodic spark deposition
|
Schlottig, F.
|
|
1997
|
358 |
1-2 |
p. 105-107
|
artikel
|
| 45 |
ESCA-Analysis of tin compounds on the surface of hydroxyapatite
|
Schenk-Meuser, Karin
|
|
1997
|
358 |
1-2 |
p. 265-267
|
artikel
|
| 46 |
Examination of organosilicon impregnating mixtures by static SIMS and diffuse reflectance FT-IR
|
Bruchertseifer, C.
|
|
1997
|
358 |
1-2 |
p. 273-274
|
artikel
|
| 47 |
Examination of wear mechanisms of hard coatings
|
Niebuhr, T.
|
|
1997
|
358 |
1-2 |
p. 278-280
|
artikel
|
| 48 |
Experiments on the analysis of thick, non-conductive metallic oxide layers on sheet using HF-SNMS
|
Sommer, D.
|
|
1997
|
358 |
1-2 |
p. 236-239
|
artikel
|
| 49 |
Flow sorption calorimetry, a powerful tool to investigate the acid-base character of organic polymer surfaces
|
Schneider, S.
|
|
1997
|
358 |
1-2 |
p. 244-247
|
artikel
|
| 50 |
Glass fracture surfaces seen with an atomic force microscope
|
Wünsche, C.
|
|
1997
|
358 |
1-2 |
p. 349-351
|
artikel
|
| 51 |
Grazing incidence X-ray diffraction analysis of surface modified SiC layers
|
Neuhäuser, J.
|
|
1997
|
358 |
1-2 |
p. 333-334
|
artikel
|
| 52 |
Identification of ultra-thin layers by cross-sectional Raman spectroscopy
|
Werninghaus, T.
|
|
1997
|
358 |
1-2 |
p. 32-35
|
artikel
|
| 53 |
Influence of the topography of zinc coated sheet on the results of electron probe microanalysis
|
Busch, P.
|
|
1997
|
358 |
1-2 |
p. 155-159
|
artikel
|
| 54 |
In-situ investigations on the SILAR-growth of ZnS films as studied by tapping mode atomic force microscopy
|
Resch, R.
|
|
1997
|
358 |
1-2 |
p. 80-84
|
artikel
|
| 55 |
Interface analysis of noble dental casting alloys
|
Reusch, B.
|
|
1997
|
358 |
1-2 |
p. 64-66
|
artikel
|
| 56 |
Interface characterization of PICVD-coated polymer substrates
|
Rupertus, V.
|
|
1997
|
358 |
1-2 |
p. 85-88
|
artikel
|
| 57 |
Investigation of aerosol particles by atomic force microscopy
|
Köllensperger, G.
|
|
1997
|
358 |
1-2 |
p. 268-273
|
artikel
|
| 58 |
Investigation of argon ion bombarded RexSi1-x thin film composites by XPS, SEM and AES
|
Reiche, R.
|
|
1997
|
358 |
1-2 |
p. 329-332
|
artikel
|
| 59 |
Investigation of surface changes on mica induced by atomic force microscopy imaging under liquids
|
Resch, R.
|
|
1997
|
358 |
1-2 |
p. 352-355
|
artikel
|
| 60 |
Investigation of the synthesis and internal structure of protective oxide layers on high-purity chromium with SIMS scanning techniques
|
Brunner, C.
|
|
1997
|
358 |
1-2 |
p. 233-236
|
artikel
|
| 61 |
Investigation of water diffusion into quartz using ion beam analysis techniques
|
Dersch, O.
|
|
1997
|
358 |
1-2 |
p. 217-219
|
artikel
|
| 62 |
Low energy ion bombardment of Ti and TiNx films
|
Eggs, C.
|
|
1997
|
358 |
1-2 |
p. 275-277
|
artikel
|
| 63 |
Model electrodes with defined mesoscopic structure
|
Friedrich, K. A.
|
|
1997
|
358 |
1-2 |
p. 163-165
|
artikel
|
| 64 |
Molecular weight determination of bulk polymer surfaces by static secondary ion mass spectrometry
|
Reihs, K.
|
|
1997
|
358 |
1-2 |
p. 93-95
|
artikel
|
| 65 |
Nanoscale characterization of semiconductor surfaces by spatially resolved photocurrent measurements
|
Hiesgen, R.
|
|
1997
|
358 |
1-2 |
p. 54-58
|
artikel
|
| 66 |
New insights into the ZnO/a-SiC:H(B) interface using XPS analysis
|
Böhmer, E.
|
|
1997
|
358 |
1-2 |
p. 210-213
|
artikel
|
| 67 |
On the dynamic range in depth profiling with electron-gas SNMS
|
Bock, W.
|
|
1997
|
358 |
1-2 |
p. 300-303
|
artikel
|
| 68 |
On the quantification of SNMS analyses of silicate glasses and oxide coatings
|
Schmitz, R.
|
|
1997
|
358 |
1-2 |
p. 42-46
|
artikel
|
| 69 |
Optical spectroscopy for in situ characterisation of semiconductor interfaces and layers
|
Zahn, Dietrich R. T.
|
|
1997
|
358 |
1-2 |
p. 10-14
|
artikel
|
| 70 |
Optimization of III/V binary growth with RHEED in MOMBE
|
Ungermanns, C.
|
|
1997
|
358 |
1-2 |
p. 101-104
|
artikel
|
| 71 |
Oxidation behavior of mechanically alloyed chromium based alloys
|
v. d. Crone, U.
|
|
1997
|
358 |
1-2 |
p. 230-232
|
artikel
|
| 72 |
Plasma SNMS investigations on powder metallurgical Cr and Ti-48Al-2Cr after oxidation in air and 15N2/18O2 atmosphere
|
Jenett, H.
|
|
1997
|
358 |
1-2 |
p. 225-229
|
artikel
|
| 73 |
Practical experiences with electron gun charge-compensation during SIMS-analysis
|
Reger, N.
|
|
1997
|
358 |
1-2 |
p. 143-145
|
artikel
|
| 74 |
Preparation and characterization of thin TiO2-films on gold/mica
|
Grunwaldt, J.-D.
|
|
1997
|
358 |
1-2 |
p. 96-100
|
artikel
|
| 75 |
Preparation of cuprite (Cu2O), paramelaconite (Cu32+Cu21+O4) and tenorite (CuO) with magnetron sputtering ion plating: characterization by EPMA, XRD, HEED and SEM
|
v. Richthofen, A.
|
|
1997
|
358 |
1-2 |
p. 312-315
|
artikel
|
| 76 |
Preparation of polycrystalline Ti-Al-O films by magnetron sputtering ion plating: constitution, structure and morphology
|
v. Richthofen, A.
|
|
1997
|
358 |
1-2 |
p. 308-311
|
artikel
|
| 77 |
Progress in the accuracy enhancement for elemental analysis by quadrupole-based plasma-SNMS
|
Goschnick, J.
|
|
1997
|
358 |
1-2 |
p. 159-162
|
artikel
|
| 78 |
Quantitative depth profiling of thin layers
|
Wetzig, K.
|
|
1997
|
358 |
1-2 |
p. 25-31
|
artikel
|
| 79 |
Scanning Reactance Microscopy on organic materials
|
Müller, F.
|
|
1997
|
358 |
1-2 |
p. 73-76
|
artikel
|
| 80 |
Scratch test measurement of tribological hard coatings in practice
|
Berg, G.
|
|
1997
|
358 |
1-2 |
p. 281-285
|
artikel
|
| 81 |
Self assembled molecular monolayers on oxidized inhomogeneous aluminum surfaces
|
Bram, C.
|
|
1997
|
358 |
1-2 |
p. 108-111
|
artikel
|
| 82 |
SIMS-analysis on B, N, and C containing layers
|
Griesser, M.
|
|
1997
|
358 |
1-2 |
p. 293-296
|
artikel
|
| 83 |
SIMS depth profiling of vertical p-channel Si-MOS transistor structures
|
Zastrow, U.
|
|
1997
|
358 |
1-2 |
p. 203-207
|
artikel
|
| 84 |
SNMS depth profiling in oxide scales on Fe-20Cr-5Al alloys
|
Göbel, M.
|
|
1997
|
358 |
1-2 |
p. 131-134
|
artikel
|
| 85 |
Stresses in alumina scales on high-temperature alloys measured by X-ray and optical methods
|
Vosberg, V. R.
|
|
1997
|
358 |
1-2 |
p. 127-130
|
artikel
|
| 86 |
Surface analysis by nondestructive testing techniques
|
Kröning, M.
|
|
1997
|
358 |
1-2 |
p. 3-9
|
artikel
|
| 87 |
Surface analysis of polyethyleneterephthalate by ESCA and TOF-SIMS
|
Lang, F.-R.
|
|
1997
|
358 |
1-2 |
p. 251-254
|
artikel
|
| 88 |
Surface composition of PtCo alloysResults of improved thermodynamic calculations incorporating data from a bulk critical state
|
Hofer, W.
|
|
1997
|
358 |
1-2 |
p. 169-170
|
artikel
|
| 89 |
Surface structural and chemical characterization of Pt/Ru composite electrodes: a combined study by XPS, STM and IR spectroscopy
|
Cramm, S.
|
|
1997
|
358 |
1-2 |
p. 189-192
|
artikel
|
| 90 |
TEM and SNMS studies on the oxidation behaviour of NiCrAlY-based coatings
|
Clemens, D.
|
|
1997
|
358 |
1-2 |
p. 122-126
|
artikel
|
| 91 |
9th Applied Surface Analysis Workshop (AOFA 9)Aachen, 24–27 June, 1996
|
Lüth, H.
|
|
1997
|
358 |
1-2 |
p. 1-2
|
artikel
|
| 92 |
Topographical and microanalytical investigation of corrosion processes on the solid material in the system metal-metalloid glassy alloy (Fe,Cr)80(P,C,Si)20, aqueous FeCl3 solution, and air in the region of the “amorphous solid/liquid/air” phase interface
|
Forkel, K.
|
|
1997
|
358 |
1-2 |
p. 219-224
|
artikel
|
| 93 |
Wavelet filtering for analytical data
|
Wolkenstein, M.
|
|
1997
|
358 |
1-2 |
p. 165-169
|
artikel
|
| 94 |
XPS-investigations on laser-modified Si3N4 ceramics
|
Oswald, S.
|
|
1997
|
358 |
1-2 |
p. 112-115
|
artikel
|
| 95 |
XPS, SIMS and SNMS applied to a combined analysis of aerosol particles from a region of considerable air pollution in the upper Rhine valley
|
Faude, F.
|
|
1997
|
358 |
1-2 |
p. 67-72
|
artikel
|
| 96 |
X-ray absorption spectroscopy (NEXAFS) of polymer surfaces
|
Unger, W. E. S.
|
|
1997
|
358 |
1-2 |
p. 89-92
|
artikel
|
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