| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
Analytical X-Ray Microscopy on Psaronius sp. – A Contribution to Permineralization Process Studies
|
Dietrich, Dagmar
|
|
2000
|
133 |
1-4 |
p. 279-283
|
article
|
| 2 |
Analytics of CVD Processes in the Deposition of SiC by Methyltrichlorosilane
|
Heinrich, Jens
|
|
2000
|
133 |
1-4 |
p. 209-214
|
article
|
| 3 |
Application of SIMS in Re-Technology Studies: Characterization of Trace-Element Distributions and Quantitative of Carbon-Determination
|
Musser, Sven
|
|
2000
|
133 |
1-4 |
p. 253-259
|
article
|
| 4 |
Artificial Neural Network and Fuzzy Clustering – New Tools for Evaluation of Depth Profile Data?
|
Bubert, Henning
|
|
2000
|
133 |
1-4 |
p. 95-103
|
article
|
| 5 |
Atomic Force Microscopy Studies of SnO2 Thin Film Microstruc tures Deposited by Atomic Layer Epitaxy
|
Utriainen, Mikko
|
|
2000
|
133 |
1-4 |
p. 119-123
|
article
|
| 6 |
Basics, Possibilities and Limitations of the Microscopic X-Ray Fluorescence Analysis
|
Haberkorn, Robert
|
|
2000
|
133 |
1-4 |
p. 51-58
|
article
|
| 7 |
Carbon Species and Precise Elemental Analysis of Precursors for Superconducting (Bi,Pb)2Sr2Ca2Cu3Ox Tapes
|
Gruner, Wolfgang
|
|
2000
|
133 |
1-4 |
p. 45-50
|
article
|
| 8 |
Characterization of Surface Modified Silica Nanoparticles by 29Si Solid State NMR Spectroscopy
|
Mijatovic, Jelena
|
|
2000
|
133 |
1-4 |
p. 175-181
|
article
|
| 9 |
Characterization of Two-Component Metal Coatings (Al/Sn) with SIMS
|
Rosner, Martin
|
|
2000
|
133 |
1-4 |
p. 267-271
|
article
|
| 10 |
Chemical Composition and Microstructure of Plasma-Nitrided Aluminium
|
Podlesak, Harry
|
|
2000
|
133 |
1-4 |
p. 285-288
|
article
|
| 11 |
Chromate-Free Zinc Conversion Coatings Characterised by Grazing Incidence X-Ray Diffractometry
|
Sahre, Mario
|
|
2000
|
133 |
1-4 |
p. 137-142
|
article
|
| 12 |
Data Preprocessing in Peak Shape Analysis of Auger Electron Spectra
|
Baunack, Stefan
|
|
2000
|
133 |
1-4 |
p. 307-312
|
article
|
| 13 |
Deposition and Characterization of Metastable Cu3N Layers for Applications in Optical Data Storage
|
Cremer, Rainer
|
|
2000
|
133 |
1-4 |
p. 299-302
|
article
|
| 14 |
Determination of the Molar Decadic Absorptivities of the Stretching Vibrations of the Hydride and Phenyl Groups on Aerosil® 300
|
Heger, Katrin
|
|
2000
|
133 |
1-4 |
p. 187-189
|
article
|
| 15 |
Determination of the Stoichiometric Composition of High-Temperature Superconductors by ICP-OES for Production Control
|
Geilenberg, Dirk
|
|
2000
|
133 |
1-4 |
p. 319-323
|
article
|
| 16 |
EFTEM and EELS Analysis of a Pt/NiO Interface
|
Grogger, Werner
|
|
2000
|
133 |
1-4 |
p. 125-129
|
article
|
| 17 |
Energy Dispersive X-Ray Fluorescence Analysis and X-Ray Microanalysis of Medieval Silver Coins
|
Linke, Robert
|
|
2000
|
133 |
1-4 |
p. 165-170
|
article
|
| 18 |
EPMA and GDOES in Functional-Gradient Hardmetal Systems
|
Garcia, Jose
|
|
2000
|
133 |
1-4 |
p. 223-231
|
article
|
| 19 |
Examination of the Excitation Performance of Different Capillary Optics
|
Haschke, Michael
|
|
2000
|
133 |
1-4 |
p. 59-63
|
article
|
| 20 |
Fabrication of Nanostructured Surfaces Using Self-Assembled Monolayers
|
Basnar, Bernhard
|
|
2000
|
133 |
1-4 |
p. 325-329
|
article
|
| 21 |
FT-Raman-Spectroscopic Study on the Luminescence of Synthetic and Mineral Apatites
|
Meuer, Petra
|
|
2000
|
133 |
1-4 |
p. 203-207
|
article
|
| 22 |
Fusion of 2-D SIMS Images Using the Wavelet Transform
|
Stubbings, Thomas C.
|
|
2000
|
133 |
1-4 |
p. 273-278
|
article
|
| 23 |
Identification and Classification of Iridescent Glass Artifacts with XRF and SEM/EDX
|
Jembrih, Dubravka
|
|
2000
|
133 |
1-4 |
p. 151-157
|
article
|
| 24 |
INA-X: An Advanced Instrument for Electron-Gas SNMS
|
Oechsner, Hans
|
|
2000
|
133 |
1-4 |
p. 69-73
|
article
|
| 25 |
In-Depth Analysis of the Early Stage Corrosion of Technical Glass Fibers
|
Frischat, Günther H.
|
|
2000
|
133 |
1-4 |
p. 23-27
|
article
|
| 26 |
Influence of Pickling High Alloyed CrNi-Steels and Nickel Base Alloys with Citric Acid on the Composition of their Tarnish Oxides
|
Pajonk, Gunther
|
|
2000
|
133 |
1-4 |
p. 289-293
|
article
|
| 27 |
Infrared Spectroscopic Analysis of Plasma-Treated Si(100)-Surfaces
|
Reiche, Manfred
|
|
2000
|
133 |
1-4 |
p. 35-43
|
article
|
| 28 |
Investigation of Chemically Treated Basalt and Glass Fibres
|
Friedrich, Marion
|
|
2000
|
133 |
1-4 |
p. 171-174
|
article
|
| 29 |
Investigation of Co/Cu/NiFe-Multilayers by X-Ray Reflectometry and Diffraction
|
Hecker, Michael
|
|
2000
|
133 |
1-4 |
p. 239-241
|
article
|
| 30 |
Investigations of the Growth of Self-Assembled Octadecylsiloxane Monolayers with Atomic Force Microscopy
|
Leitner, Thomas
|
|
2000
|
133 |
1-4 |
p. 331-336
|
article
|
| 31 |
Investigations on the Thermal Cycling Stability of SiFeCr Coated NbtZr
|
Gritsch, Martin
|
|
2000
|
133 |
1-4 |
p. 89-93
|
article
|
| 32 |
Localised Electrochemical Desorption of Gold Alkanethiolate Monolayers by Means of Scanning Electrochemical Microscopy (SECM)
|
Wilhelm, Thomas
|
|
2000
|
133 |
1-4 |
p. 1-9
|
article
|
| 33 |
Multianalytical Study of Patina Formed on Archaeological Metal Objects from Bliesbruck-Reinheim
|
Wadsak, Michael
|
|
2000
|
133 |
1-4 |
p. 159-164
|
article
|
| 34 |
Nanoscale Co/Cu Multilayers Investigated by Analytical TEM and AES
|
Thomas, Jürgen
|
|
2000
|
133 |
1-4 |
p. 131-135
|
article
|
| 35 |
Oxidation Behaviour of PACVD-(Ti,Al)N Wear Resistance Layers
|
Menzel, Siegfried
|
|
2000
|
133 |
1-4 |
p. 215-221
|
article
|
| 36 |
Oxidation, Diffusion and Segregation in CuNi(Mn) Films Studied by AES
|
Baunack, Stefan
|
|
2000
|
133 |
1-4 |
p. 17-22
|
article
|
| 37 |
Phase Equilibria in the Ternary System Fe-Gd-Mo at 600 °C
|
Zinkevitch, Matvei
|
|
2000
|
133 |
1-4 |
p. 243-251
|
article
|
| 38 |
Potential of Total Reflection and Grazing Incidence XRF for Contamination and Process Control in Semiconductor Fabrication
|
Weiss, Cornelia
|
|
2000
|
133 |
1-4 |
p. 65-68
|
article
|
| 39 |
Preparation, Characterization and Crystal Structure of [Be(NCSe)2(HCON(CH3)2)2]
|
Hanay, Werner
|
|
2000
|
133 |
1-4 |
p. 197-201
|
article
|
| 40 |
Preparation of Cr2O3-Al2O3 Solid Solutions by Reactive Magnetron Sputtering
|
Witthaut, Mirjam
|
|
2000
|
133 |
1-4 |
p. 191-196
|
article
|
| 41 |
Quantitative Acoustic Microscopy for Determination of Properties of Hard Coatings
|
Matthaei-Schulz, Ellen
|
|
2000
|
133 |
1-4 |
p. 11-15
|
article
|
| 42 |
Quantitative Sputter Depth Profiling of Silicon- and Aluminium Oxynitride Films
|
Dreer, Sabine
|
|
2000
|
133 |
1-4 |
p. 75-87
|
article
|
| 43 |
Separation and Analysis of Theran Volcanic Glass by INAA, XRF and EPMA
|
Schmid, Petra
|
|
2000
|
133 |
1-4 |
p. 143-149
|
article
|
| 44 |
SIMS Characterisation of Aluminum-Alloyed Hot Isostatic Pressed Steel
|
Pollak, Christoph
|
|
2000
|
133 |
1-4 |
p. 261-266
|
article
|
| 45 |
SIMS Profiling and TEM of CVD Films on Multi-Filament Samples
|
Dietrich, Dagmar
|
|
2000
|
133 |
1-4 |
p. 183-186
|
article
|
| 46 |
Solid State Analysis with the New Leipzig High-Energy Ion Nanoprobe
|
Vogt, Jürgen
|
|
2000
|
133 |
1-4 |
p. 105-111
|
article
|
| 47 |
Surface Chemistry of Planarized SiLK-Films Studied by XPS
|
Heeg, Jan
|
|
2000
|
133 |
1-4 |
p. 113-117
|
article
|
| 48 |
Surface Enhanced Raman Spectroscopy on Carbon Filaments
|
Meyer, Norbert
|
|
2000
|
133 |
1-4 |
p. 337-339
|
article
|
| 49 |
Synthesis and Microstructure of Anodic Spark Deposited SrZrO3
|
Schreckenbach, Joachim P.
|
|
2000
|
133 |
1-4 |
p. 295-298
|
article
|
| 50 |
Trace Analysis by Heavy Ion Induced X-Ray Emission
|
Ecker, Klaus H.
|
|
2000
|
133 |
1-4 |
p. 313-317
|
article
|
| 51 |
WDX Analysis of Rapidly Quenched Nd-Fe-B Alloys with Ti + C Additives
|
Bächer, Ingrid
|
|
2000
|
133 |
1-4 |
p. 233-237
|
article
|
| 52 |
XPS and SIMS Examination of Alumina Fibres Affected with Mg and MgLi Melt
|
Kúdela, Stanislav
|
|
2000
|
133 |
1-4 |
p. 29-34
|
article
|
| 53 |
XPS Depth Profile Analysis of a Thin Non-Conducting Titanate Superlattice
|
Oswald, Steffen
|
|
2000
|
133 |
1-4 |
p. 303-306
|
article
|
Journal description