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Journal description
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Details for article 47 of 53 found articles
| Title: |
Surface Chemistry of Planarized SiLK-Films Studied by XPS |
| Author: |
Heeg, Jan Schubert, Ulf Küchenmeister, Frank |
| Appeared in: |
Mikrochimica acta : micro and trace analysis |
| Paging: | Volume 133 (2000) nr. 1-4 pages 113-117 |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Springer-Verlag, Wien |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 47 of 53 found articles
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