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8 results found

no	title	author	magazine	year	volume	issue	page(s)	type
1	CMOS logic elements with increased failure resistance to single-event upsets	Ol’chev, S. I.		2011	40	3	p. 156-169	article
2	Electrothermal behavior of the elements of SOS CMOS chips	Gerasimchuk, O. A.		2011	40	3	p. 215-224	article
3	Evaluation of resistance of CMOS LSIC to the factor of absorbed dose under the pulsed radiation effect	Sogoyan, A. V.		2011	40	3	p. 185-193	article
4	Features of charge formation and relaxation in SOS structures under the effect of ionizing radiation	Sogoyan, A. V.		2011	40	3	p. 194-208	article
5	Influence of implantation of silicon and oxygen ions into a heteroepitaxial silicon layer on a sapphire substrate on the leakage currents of n-channel transistors of CMOS IC SOS technology	Chistilin, A. A.		2011	40	3	p. 209-214	article
6	Interrelation of equivalent values for linear energy transfer of heavy charged particles and the energy of focused laser radiation	Chumakov, A. I.		2011	40	3	p. 149-155	article
7	Memory-cell layout as a factor in the single-event-upset susceptibility of submicron dice CMOS SRAM	Stenin, V. Ya.		2011	40	3	p. 170-175	article
8	Modeling of recombination in SiO2 under the effect of ionizing radiation by the Monte Carlo method	Polunin, V. A.		2011	40	3	p. 176-184	article

8 results found

Koninklijke Bibliotheek - National Library of the Netherlands