| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Computer Simulation of a Nanoscale Ballistic SOI MOSFET with a Sub-10-nm Si Layer
|
V. V. V'yurkov
|
|
2003
|
32 |
4 |
p. 224-232
9 p.
|
artikel
|
| 2 |
Computer Simulation of a Nanoscale Ballistic SOI MOSFET with a Sub-10-nm Si Layer
|
V'yurkov, V. V.
|
|
2003
|
32 |
4 |
p. 224-232
|
artikel
|
| 3 |
In Memoriam: Dr. Petr A. Arutyunov
|
|
|
2003
|
32 |
4 |
p. 189-189
1 p.
|
artikel
|
| 4 |
In Memoriam: Dr. Petr A. Arutyunov
|
|
|
2003
|
32 |
4 |
p. 189
|
artikel
|
| 5 |
Lead-Free Solders in IC Manufacture: A Review
|
V. V. Zenin
|
|
2003
|
32 |
4 |
p. 247-256
10 p.
|
artikel
|
| 6 |
Lead-Free Solders in IC Manufacture: A Review
|
Zenin, V. V.
|
|
2003
|
32 |
4 |
p. 247-256
|
artikel
|
| 7 |
Nonlinear Response of a Rectangular Membrane Sensing Element
|
V. A. Gridchin
|
|
2003
|
32 |
4 |
p. 233-242
10 p.
|
artikel
|
| 8 |
Nonlinear Response of a Rectangular Membrane Sensing Element
|
Gridchin, V. A.
|
|
2003
|
32 |
4 |
p. 233-242
|
artikel
|
| 9 |
Phase Detection Used in the Optical-Emission Monitoring of SiO2/Si Plasma Etching
|
K. V. Rudenko
|
|
2003
|
32 |
4 |
p. 214-218
5 p.
|
artikel
|
| 10 |
Phase Detection Used in the Optical-Emission Monitoring of SiO2/Si Plasma Etching
|
Rudenko, K. V.
|
|
2003
|
32 |
4 |
p. 214-218
|
artikel
|
| 11 |
Phenomenological Model of the Piezoresistive Effect in Polysilicon Films
|
V. A. Gridchin
|
|
2003
|
32 |
4 |
p. 205-213
9 p.
|
artikel
|
| 12 |
Phenomenological Model of the Piezoresistive Effect in Polysilicon Films
|
Gridchin, V. A.
|
|
2003
|
32 |
4 |
p. 205-213
|
artikel
|
| 13 |
Switch-Level Test-Vector Generation for CMOS Combinational Logic
|
A. E. Lyul'kin
|
|
2003
|
32 |
4 |
p. 243-246
4 p.
|
artikel
|
| 14 |
Switch-Level Test-Vector Generation for CMOS Combinational Logic
|
Lyul'kin, A. E.
|
|
2003
|
32 |
4 |
p. 243-246
|
artikel
|
| 15 |
Thermally Induced Viscous Flow of Borophosphosilicate-Glass Thin Films on Stepped Surfaces, Part 2: Generalized Parameters for ULSI Glass Flow Characterization
|
V. Y. Vasilev
|
|
2003
|
32 |
4 |
p. 190-199
10 p.
|
artikel
|
| 16 |
Thermally Induced Viscous Flow of Borophosphosilicate-Glass Thin Films on Stepped Surfaces, Part 2: Generalized Parameters for ULSI Glass Flow Characterization
|
Vasilev, V. Y.
|
|
2003
|
32 |
4 |
p. 190-199
|
artikel
|
| 17 |
Thermal Oxidation of GaAs and InP in the Presence of Al2(SO4)3
|
S. S. Lavrushina
|
|
2003
|
32 |
4 |
p. 200-204
5 p.
|
artikel
|
| 18 |
Thermal Oxidation of GaAs and InP in the Presence of Al2(SO4)3
|
Lavrushina, S. S.
|
|
2003
|
32 |
4 |
p. 200-204
|
artikel
|
| 19 |
XRD Study of Quantum-Well Heterostructures
|
A. M. Afanas'ev
|
|
2003
|
32 |
4 |
p. 219-223
5 p.
|
artikel
|
| 20 |
XRD Study of Quantum-Well Heterostructures
|
Afanas'ev, A. M.
|
|
2003
|
32 |
4 |
p. 219-223
|
artikel
|
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