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                             17 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Absolute lattice parameter measurement P. F. Fewster
 1999
 10 3 p. 175-183
9 p.
 artikel
2 Absolute lattice parameter measurement Fewster, P. F.
 1999
 10 3 p. 175-183
 artikel
3 Characterization of strain relaxation of (0 0 1) oriented SrTiO3 thin films grown on LaAIO3 (1 1 0) by means of reciprocal space mapping using x-ray diffraction C. N. L. Edvardsson
 1999
 10 3 p. 203-208
6 p.
 artikel
4 Characterization of strain relaxation of (0 0 1) oriented SrTiO3 thin films grown on LaAIO3 (1 1 0) by means of reciprocal space mapping using x-ray diffraction Edvardsson, C. N. L.
 1999
 10 3 p. 203-208
 artikel
5 Diffuse x-ray reflection from multilayers with rough interfaces V. Holy´
 1999
 10 3 p. 223-226
4 p.
 artikel
6 Diffuse x-ray reflection from multilayers with rough interfaces Holy´, V.
 1999
 10 3 p. 223-226
 artikel
7 Grazing incidence reciprocal space mapping of partially relaxed SiGe films Mooney, P. M.
 1999
 10 3 p. 209-213
 artikel
8 Plane-wave x-ray topography and its application to semiconductor problems R. Ko¨hler
 1999
 10 3 p. 167-174
8 p.
 artikel
9 Plane-wave x-ray topography and its application to semiconductor problems Ko¨hler, R.
 1999
 10 3 p. 167-174
 artikel
10 Reciprocal-space analysis of compositional modulation in short-period superlattices using position-sensitive x-ray detection S. R. Lee
 1999
 10 3 p. 191-197
7 p.
 artikel
11 Reciprocal-space analysis of compositional modulation in short-period superlattices using position-sensitive x-ray detection Lee, S. R.
 1999
 10 3 p. 191-197
 artikel
12 Study of the lattice strain relaxation in the Ga1-XAlXSb/GaSb system by x-ray topography and high resolution diffraction Bocchi, C.
 1999
 10 3 p. 185-190
 artikel
13 Study of the lattice strain relaxation in the \hbox{Ga}_{1-X}\hbox{Al}_{X}\hbox{Sb/GaSb} system by x-ray topography and high resolution diffraction C. Bocchi
 1999
 10 3 p. 185-190
6 p.
 artikel
14 X-ray diffraction from quantum wires and quantum dots Y. Zhuang
 1999
 10 3 p. 215-221
7 p.
 artikel
15 X-ray diffraction from quantum wires and quantum dots Zhuang, Y.
 1999
 10 3 p. 215-221
 artikel
16 X-ray diffraction reciprocal space and pole figure characterization of cubic GaN epitaxial layers grown on (0 0 1) GaAs by molecular beam epitaxy Zhixin Qin
 1999
 10 3 p. 199-202
4 p.
 artikel
17 X-ray diffraction reciprocal space and pole figure characterization of cubic GaN epitaxial layers grown on (0 0 1) GaAs by molecular beam epitaxy Qin, Zhixin
 1999
 10 3 p. 199-202
 artikel
                             17 gevonden resultaten
 
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