| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An Efficient Accuracy Reconfigurable CLA Adder Designs Using Complementary Logic
|
Patel, Sujit Kumar
|
|
|
36 |
1 |
p. 135-142
|
artikel
|
| 2 |
An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits
|
Handique, Mousum
|
|
|
36 |
1 |
p. 105-122
|
artikel
|
| 3 |
Editorial
|
Agrawal, Vishwani D.
|
|
|
36 |
1 |
p. 1-2
|
artikel
|
| 4 |
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
|
Oyeniran, Adeboye Stephen
|
|
|
36 |
1 |
p. 87-103
|
artikel
|
| 5 |
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures
|
Roy, Soham
|
|
|
36 |
1 |
p. 123-133
|
artikel
|
| 6 |
Modeling Remapping Based Fault Tolerance Techniques for Chip Multiprocessor Cache with Design Space Exploration
|
Choudhury, Avishek
|
|
|
36 |
1 |
p. 59-73
|
artikel
|
| 7 |
Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems
|
Serrano-Cases, Alejandro
|
|
|
36 |
1 |
p. 47-57
|
artikel
|
| 8 |
New Editor – 2020
|
|
|
|
36 |
1 |
p. 3
|
artikel
|
| 9 |
On Using Approximate Computing to Build an Error Detection Scheme for Arithmetic Circuits
|
Deveautour, B.
|
|
|
36 |
1 |
p. 33-46
|
artikel
|
| 10 |
Optimal Selection of Tests for Fault Diagnosis in Multi-Path System with Time-delay
|
Yao, Zhexi
|
|
|
36 |
1 |
p. 75-86
|
artikel
|
| 11 |
Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components
|
Banitaba, Seyed Mostafa
|
|
|
36 |
1 |
p. 9-21
|
artikel
|
| 12 |
2019 Reviewers
|
|
|
|
36 |
1 |
p. 5-6
|
artikel
|
| 13 |
Test Technology Newsletter February 2020
|
|
|
|
36 |
1 |
p. 7-8
|
artikel
|
| 14 |
Trojan Detection Test for Clockless Circuits
|
Guazzelli, Ricardo Aquino
|
|
|
36 |
1 |
p. 23-31
|
artikel
|
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